{"id":"https://openalex.org/W2079503924","doi":"https://doi.org/10.1080/00207720802630685","title":"Automated visual inspection system for wood defect classification using computational intelligence techniques","display_name":"Automated visual inspection system for wood defect classification using computational intelligence techniques","publication_year":2009,"publication_date":"2009-02-01","ids":{"openalex":"https://openalex.org/W2079503924","doi":"https://doi.org/10.1080/00207720802630685","mag":"2079503924"},"language":"en","primary_location":{"id":"doi:10.1080/00207720802630685","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00207720802630685","pdf_url":null,"source":{"id":"https://openalex.org/S129640837","display_name":"International Journal of Systems Science","issn_l":"0020-7721","issn":["0020-7721","1464-5319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Systems Science","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053436240","display_name":"Gonzalo A. Ruz","orcid":"https://orcid.org/0000-0001-7740-9865"},"institutions":[{"id":"https://openalex.org/I79510175","display_name":"Cardiff University","ror":"https://ror.org/03kk7td41","country_code":"GB","type":"education","lineage":["https://openalex.org/I79510175"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Gonzalo A. Ruz","raw_affiliation_strings":["Manufacturing Engineering Centre, Cardiff University, Cardiff, UK","Manufacturing Engineering Centre , Cardiff University , Cardiff, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Manufacturing Engineering Centre, Cardiff University, Cardiff, UK","institution_ids":["https://openalex.org/I79510175"]},{"raw_affiliation_string":"Manufacturing Engineering Centre , Cardiff University , Cardiff, UK","institution_ids":["https://openalex.org/I79510175"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010931397","display_name":"P. A. Est\u00e9vez","orcid":"https://orcid.org/0000-0001-9164-4722"},"institutions":[{"id":"https://openalex.org/I69737025","display_name":"University of Chile","ror":"https://ror.org/047gc3g35","country_code":"CL","type":"education","lineage":["https://openalex.org/I69737025"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Pablo A. Est\u00e9vez","raw_affiliation_strings":["Department of Electrical Engineering, Universidad de Chile, Casilla 412-3, Santiago, Chile","Department of Electrical Engineering Universidad de Chile Santiago Chile"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Universidad de Chile, Casilla 412-3, Santiago, Chile","institution_ids":["https://openalex.org/I69737025"]},{"raw_affiliation_string":"Department of Electrical Engineering Universidad de Chile Santiago Chile","institution_ids":["https://openalex.org/I69737025"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003989626","display_name":"Pablo Ram\u00edrez","orcid":"https://orcid.org/0000-0003-0593-7161"},"institutions":[{"id":"https://openalex.org/I69737025","display_name":"University of Chile","ror":"https://ror.org/047gc3g35","country_code":"CL","type":"education","lineage":["https://openalex.org/I69737025"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Pablo A. Ram\u00edrez","raw_affiliation_strings":["Department of Electrical Engineering, Universidad de Chile, Casilla 412-3, Santiago, Chile","Department of Electrical Engineering Universidad de Chile Santiago Chile"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Universidad de Chile, Casilla 412-3, Santiago, Chile","institution_ids":["https://openalex.org/I69737025"]},{"raw_affiliation_string":"Department of Electrical Engineering Universidad de Chile Santiago Chile","institution_ids":["https://openalex.org/I69737025"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5053436240"],"corresponding_institution_ids":["https://openalex.org/I79510175"],"apc_list":null,"apc_paid":null,"fwci":6.7826,"has_fulltext":false,"cited_by_count":65,"citation_normalized_percentile":{"value":0.96223298,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"40","issue":"2","first_page":"163","last_page":"172"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9829000234603882,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7765828967094421},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6285995841026306},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.6020403504371643},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.5942882299423218},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5804303288459778},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5042945146560669},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.49718597531318665},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4943094253540039},{"id":"https://openalex.org/keywords/contextual-image-classification","display_name":"Contextual image classification","score":0.47039756178855896},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4518657326698303},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.4492345452308655},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4426414370536804},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.4402255415916443},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3696810007095337},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.35547226667404175},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.2954423129558563}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7765828967094421},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6285995841026306},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.6020403504371643},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.5942882299423218},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5804303288459778},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5042945146560669},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.49718597531318665},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4943094253540039},{"id":"https://openalex.org/C75294576","wikidata":"https://www.wikidata.org/wiki/Q5165192","display_name":"Contextual image classification","level":3,"score":0.47039756178855896},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4518657326698303},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.4492345452308655},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4426414370536804},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.4402255415916443},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3696810007095337},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.35547226667404175},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.2954423129558563},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1080/00207720802630685","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00207720802630685","pdf_url":null,"source":{"id":"https://openalex.org/S129640837","display_name":"International Journal of Systems Science","issn_l":"0020-7721","issn":["0020-7721","1464-5319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Systems Science","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320334812","display_name":"Comisi\u00f3n Nacional de Investigaci\u00f3n Cient\u00edfica y Tecnol\u00f3gica","ror":"https://ror.org/02ap3w078"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W147723833","https://openalex.org/W1491007681","https://openalex.org/W1542945334","https://openalex.org/W1557955428","https://openalex.org/W1604938182","https://openalex.org/W1617866811","https://openalex.org/W1972472467","https://openalex.org/W1988646500","https://openalex.org/W2009794121","https://openalex.org/W2019176006","https://openalex.org/W2025003456","https://openalex.org/W2040155661","https://openalex.org/W2062370009","https://openalex.org/W2064369665","https://openalex.org/W2084853200","https://openalex.org/W2091250708","https://openalex.org/W2106582716","https://openalex.org/W2124351082","https://openalex.org/W2129021863","https://openalex.org/W2136704614","https://openalex.org/W2148603752","https://openalex.org/W2150616977","https://openalex.org/W2157239837","https://openalex.org/W2168603260","https://openalex.org/W2283386713","https://openalex.org/W2417378685","https://openalex.org/W2492794003","https://openalex.org/W3023411394","https://openalex.org/W3163638146","https://openalex.org/W4246139003","https://openalex.org/W4255158506"],"related_works":["https://openalex.org/W2493185854","https://openalex.org/W2090582288","https://openalex.org/W2151450253","https://openalex.org/W617381866","https://openalex.org/W2339456629","https://openalex.org/W1986703546","https://openalex.org/W3150775531","https://openalex.org/W849857824","https://openalex.org/W1965696824","https://openalex.org/W1487436318"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"improvements":[3],"in":[4,32,51,91,120],"the":[5,12,29,33,38,52,61,83,92,104,121,126,158,162,174,178],"segmentation":[6,40,68],"module,":[7,10,107],"feature":[8,105],"extraction":[9,106],"and":[11,108,130],"classification":[13,53,122,133],"module":[14],"of":[15,28,41,78,150,161,168,177],"a":[16,76,131,138],"low-cost":[17,34,163],"automated":[18,180],"visual":[19,181],"inspection":[20,182],"(AVI)":[21],"system":[22,36,183],"for":[23,66,87,103,184],"wood":[24,43,93,141,185],"defect":[25,89,146],"classification.":[26],"One":[27],"major":[30],"drawbacks":[31],"AVI":[35,164],"was":[37],"erroneous":[39],"clear":[42],"regions":[44],"as":[45],"defects,":[46],"which":[47,153],"then":[48],"introduces":[49],"confusion":[50],"module.":[54,123],"To":[55],"reduce":[56],"this":[57],"problem,":[58],"we":[59],"use":[60,167],"fuzzy":[62],"min\u2013max":[63],"neural":[64,118],"network":[65],"image":[67,142],"(FMMIS).":[69],"The":[70,166],"FMMIS":[71],"method":[72],"grows":[73],"boxes":[74],"from":[75],"set":[77,143],"seed":[79],"pixels,":[80],"yielding":[81],"ideally":[82],"minimum":[84],"bounded":[85],"rectangle":[86],"each":[88],"present":[90],"board":[94],"image.":[95],"Additional":[96],"features":[97],"with":[98,115],"texture":[99],"information":[100],"are":[101,113],"considered":[102],"multi-class":[109],"support":[110,134],"vector":[111,135],"machines":[112],"compared":[114],"multilayer":[116],"perceptron":[117],"networks":[119],"Results":[124],"using":[125],"FMMIS,":[127],"additional":[128],"features,":[129],"pairwise":[132],"machine":[136],"on":[137],"550":[139],"test":[140],"containing":[144],"11":[145],"categories":[147],"show":[148],"91%":[149],"correct":[151],"classification,":[152],"is":[154],"significantly":[155,173],"better":[156],"than":[157],"original":[159],"75%":[160],"system.":[165],"computational":[169],"intelligence":[170],"techniques":[171],"improved":[172],"overall":[175],"performance":[176],"proposed":[179],"boards.":[186]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":13},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":5}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}