{"id":"https://openalex.org/W4308522738","doi":"https://doi.org/10.1080/00207543.2022.2140364","title":"Distribution-free multivariate time-series monitoring with analytically determined control limits","display_name":"Distribution-free multivariate time-series monitoring with analytically determined control limits","publication_year":2022,"publication_date":"2022-11-08","ids":{"openalex":"https://openalex.org/W4308522738","doi":"https://doi.org/10.1080/00207543.2022.2140364"},"language":"en","primary_location":{"id":"doi:10.1080/00207543.2022.2140364","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00207543.2022.2140364","pdf_url":null,"source":{"id":"https://openalex.org/S65690446","display_name":"International Journal of Production Research","issn_l":"0020-7543","issn":["0020-7543","1366-588X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Production Research","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100324213","display_name":"Di Liu","orcid":"https://orcid.org/0000-0002-0051-9609"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Di Liu","raw_affiliation_strings":["Georgia Institute of Technology","H. Milton School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, Georgia, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"H. Milton School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, Georgia, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031403589","display_name":"Heeseon Kim","orcid":"https://orcid.org/0000-0003-3113-0740"},"institutions":[{"id":"https://openalex.org/I2818286","display_name":"LG (United States)","ror":"https://ror.org/02b948n83","country_code":"US","type":"company","lineage":["https://openalex.org/I2818286","https://openalex.org/I4210131320"]},{"id":"https://openalex.org/I4210131320","display_name":"LG (South Korea)","ror":"https://ror.org/03ddh2c27","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210131320"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Heeseon Kim","raw_affiliation_strings":["LG Electronics","LG Electronics, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LG Electronics","institution_ids":["https://openalex.org/I2818286"]},{"raw_affiliation_string":"LG Electronics, Seoul, South Korea","institution_ids":["https://openalex.org/I4210131320"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063960763","display_name":"Seong\u2010Hee Kim","orcid":"https://orcid.org/0000-0001-9536-5755"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Seong-Hee Kim","raw_affiliation_strings":["Georgia Institute of Technology","H. Milton School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, Georgia, USA"],"raw_orcid":"https://orcid.org/0000-0001-9536-5755","affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"H. Milton School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, Georgia, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063488508","display_name":"Taeheung Kim","orcid":"https://orcid.org/0000-0003-1444-1459"},"institutions":[{"id":"https://openalex.org/I2818286","display_name":"LG (United States)","ror":"https://ror.org/02b948n83","country_code":"US","type":"company","lineage":["https://openalex.org/I2818286","https://openalex.org/I4210131320"]},{"id":"https://openalex.org/I4210131320","display_name":"LG (South Korea)","ror":"https://ror.org/03ddh2c27","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210131320"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Taeheung Kim","raw_affiliation_strings":["LG Electronics","LG Electronics, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LG Electronics","institution_ids":["https://openalex.org/I2818286"]},{"raw_affiliation_string":"LG Electronics, Seoul, South Korea","institution_ids":["https://openalex.org/I4210131320"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074471138","display_name":"Dong Ki Lee","orcid":"https://orcid.org/0000-0002-0048-9112"},"institutions":[{"id":"https://openalex.org/I2818286","display_name":"LG (United States)","ror":"https://ror.org/02b948n83","country_code":"US","type":"company","lineage":["https://openalex.org/I2818286","https://openalex.org/I4210131320"]},{"id":"https://openalex.org/I4210131320","display_name":"LG (South Korea)","ror":"https://ror.org/03ddh2c27","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210131320"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Dongki Lee","raw_affiliation_strings":["LG Electronics","LG Electronics, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LG Electronics","institution_ids":["https://openalex.org/I2818286"]},{"raw_affiliation_string":"LG Electronics, Seoul, South Korea","institution_ids":["https://openalex.org/I4210131320"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047736740","display_name":"Yao Xie","orcid":"https://orcid.org/0000-0001-6777-2951"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yao Xie","raw_affiliation_strings":["Georgia Institute of Technology","H. Milton School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, Georgia, USA"],"raw_orcid":"https://orcid.org/0000-0001-6777-2951","affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"H. Milton School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, Georgia, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5063960763"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":1.1173,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.81192168,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"61","issue":"20","first_page":"6960","last_page":"6977"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9853000044822693,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cusum","display_name":"CUSUM","score":0.9160315990447998},{"id":"https://openalex.org/keywords/univariate","display_name":"Univariate","score":0.6307226419448853},{"id":"https://openalex.org/keywords/control-limits","display_name":"Control limits","score":0.5833514928817749},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.5676571726799011},{"id":"https://openalex.org/keywords/brownian-motion","display_name":"Brownian motion","score":0.5307115316390991},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.5291272401809692},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.5070438385009766},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.39511460065841675},{"id":"https://openalex.org/keywords/multivariate-statistics","display_name":"Multivariate statistics","score":0.36197707056999207},{"id":"https://openalex.org/keywords/applied-mathematics","display_name":"Applied mathematics","score":0.3515651822090149},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3391232490539551},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3303515911102295},{"id":"https://openalex.org/keywords/control-chart","display_name":"Control chart","score":0.21034938097000122}],"concepts":[{"id":"https://openalex.org/C178518018","wikidata":"https://www.wikidata.org/wiki/Q1024555","display_name":"CUSUM","level":2,"score":0.9160315990447998},{"id":"https://openalex.org/C199163554","wikidata":"https://www.wikidata.org/wiki/Q1681619","display_name":"Univariate","level":3,"score":0.6307226419448853},{"id":"https://openalex.org/C166623804","wikidata":"https://www.wikidata.org/wiki/Q5165860","display_name":"Control limits","level":4,"score":0.5833514928817749},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.5676571726799011},{"id":"https://openalex.org/C112401455","wikidata":"https://www.wikidata.org/wiki/Q178036","display_name":"Brownian motion","level":2,"score":0.5307115316390991},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.5291272401809692},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.5070438385009766},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.39511460065841675},{"id":"https://openalex.org/C161584116","wikidata":"https://www.wikidata.org/wiki/Q1952580","display_name":"Multivariate statistics","level":2,"score":0.36197707056999207},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.3515651822090149},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3391232490539551},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3303515911102295},{"id":"https://openalex.org/C196985124","wikidata":"https://www.wikidata.org/wiki/Q1369242","display_name":"Control chart","level":3,"score":0.21034938097000122},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1080/00207543.2022.2140364","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00207543.2022.2140364","pdf_url":null,"source":{"id":"https://openalex.org/S65690446","display_name":"International Journal of Production Research","issn_l":"0020-7543","issn":["0020-7543","1366-588X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Production Research","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:taf:tprsxx:v:61:y:2023:i:20:p:6960-6977","is_oa":false,"landing_page_url":"http://hdl.handle.net/10.1080/00207543.2022.2140364","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.5600000023841858}],"awards":[{"id":"https://openalex.org/G8162364469","display_name":null,"funder_award_id":"GR00002652","funder_id":"https://openalex.org/F4320329803","funder_display_name":"LG Electronics"}],"funders":[{"id":"https://openalex.org/F4320329803","display_name":"LG Electronics","ror":"https://ror.org/03ddh2c27"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W148596283","https://openalex.org/W1566057743","https://openalex.org/W1590072560","https://openalex.org/W1975946839","https://openalex.org/W1976669489","https://openalex.org/W1976761149","https://openalex.org/W1988725147","https://openalex.org/W1990115979","https://openalex.org/W1993614146","https://openalex.org/W2004698554","https://openalex.org/W2006339403","https://openalex.org/W2023401937","https://openalex.org/W2028497664","https://openalex.org/W2031953346","https://openalex.org/W2066731174","https://openalex.org/W2074013991","https://openalex.org/W2083330102","https://openalex.org/W2099499799","https://openalex.org/W2106767915","https://openalex.org/W2124741337","https://openalex.org/W2133704983","https://openalex.org/W2162389474","https://openalex.org/W2341935953","https://openalex.org/W2404533848","https://openalex.org/W2551631167","https://openalex.org/W2769301926","https://openalex.org/W2972940274","https://openalex.org/W3048162920","https://openalex.org/W3124377368","https://openalex.org/W3189332852","https://openalex.org/W4229977739","https://openalex.org/W4244024201","https://openalex.org/W4252717536"],"related_works":["https://openalex.org/W1828158523","https://openalex.org/W2049578243","https://openalex.org/W2000145235","https://openalex.org/W2122079181","https://openalex.org/W1985848810","https://openalex.org/W2889939530","https://openalex.org/W3121881699","https://openalex.org/W2748838164","https://openalex.org/W2066015000","https://openalex.org/W2912721996"],"abstract_inverted_index":{"We":[0,26,154],"consider":[1],"the":[2,9,46,99,107,110,114,127,131,139,143,156,192,207],"problem":[3],"of":[4,11,56,130,142,158],"detecting":[5,201],"a":[6,12,28,53,72,89,119,148,177,202],"shift":[7,203],"in":[8,200,204],"mean":[10,205],"multivariate":[13],"time-series":[14],"process":[15,116],"with":[16,161,168],"general":[17,21],"marginal":[18],"distributions":[19],"and":[20,23,93,171,173,194],"cross-":[22,170],"auto-correlation":[24,172],"structures.":[25],"propose":[27],"distribution-free":[29],"monitoring":[30],"procedure":[31,47,133,160,183],"that":[32,79,109],"does":[33],"not":[34],"need":[35],"model":[36],"fitting":[37],"or":[38,197],"trial-and-error":[39],"calibration":[40],"for":[41],"control":[42,128],"limits,":[43],"which":[44],"makes":[45],"convenient":[48],"to":[49,59,66,147,191],"be":[50,60],"implemented":[51],"when":[52],"facility":[54],"consists":[55],"many":[57],"processes":[58],"monitored.":[61],"The":[62,82,181],"main":[63],"idea":[64],"is":[65],"convert":[67],"each":[68],"observation":[69],"vector":[70],"into":[71],"one-dimensional":[73],"$":[74,76,83,85,100,102],"T^2":[75,84,101],"T2":[77,86,103],"quantity":[78],"captures":[80],"cross-correlation.":[81],"quantities":[87],"form":[88],"univariate":[90],"auto-correlated":[91,115],"process,":[92],"CUSUM":[94,111,132],"statistics":[95,112],"are":[96,134],"constructed":[97],"on":[98,113,165],"quantities.":[104],"Then":[105],"using":[106],"fact":[108],"behave":[117],"as":[118],"reflected":[120],"Brownian":[121,144],"motion":[122,145],"asymptotically":[123],"under":[124],"some":[125],"conditions,":[126],"limits":[129],"analytically":[135],"determined":[136],"by":[137],"setting":[138],"first-passage":[140],"time":[141],"equal":[146],"target":[149,193],"in-control":[150,186],"average":[151,187],"run":[152,188],"length.":[153],"compare":[155],"performance":[157,199],"our":[159],"three":[162],"competing":[163],"procedures":[164],"simulated":[166],"data":[167,175],"various":[169],"real":[174],"from":[176],"wafer":[178],"etching":[179],"process.":[180],"proposed":[182],"delivers":[184],"actual":[185],"lengths":[189],"close":[190],"shows":[195],"comparable":[196],"better":[198],"than":[206],"competitors.":[208]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}