{"id":"https://openalex.org/W4212788264","doi":"https://doi.org/10.1080/00207543.2022.2036852","title":"Optimum lot inspection based on lognormal reliability tests","display_name":"Optimum lot inspection based on lognormal reliability tests","publication_year":2022,"publication_date":"2022-02-18","ids":{"openalex":"https://openalex.org/W4212788264","doi":"https://doi.org/10.1080/00207543.2022.2036852"},"language":"en","primary_location":{"id":"doi:10.1080/00207543.2022.2036852","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00207543.2022.2036852","pdf_url":null,"source":{"id":"https://openalex.org/S65690446","display_name":"International Journal of Production Research","issn_l":"0020-7543","issn":["0020-7543","1366-588X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Production Research","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045225985","display_name":"Arturo J. Fern\u00e1ndez","orcid":"https://orcid.org/0000-0003-2646-0905"},"institutions":[{"id":"https://openalex.org/I158438070","display_name":"Universidad de La Laguna","ror":"https://ror.org/01r9z8p25","country_code":"ES","type":"education","lineage":["https://openalex.org/I158438070"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Arturo J. Fern\u00e1ndez","raw_affiliation_strings":["Departamento de Matem\u00e1ticas, Estad\u00edstica e Investigaci\u00f3n Operativa, Universidad de La Laguna, La Laguna, Spain"],"raw_orcid":"https://orcid.org/0000-0003-2646-0905","affiliations":[{"raw_affiliation_string":"Departamento de Matem\u00e1ticas, Estad\u00edstica e Investigaci\u00f3n Operativa, Universidad de La Laguna, La Laguna, Spain","institution_ids":["https://openalex.org/I158438070"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5045225985"],"corresponding_institution_ids":["https://openalex.org/I158438070"],"apc_list":null,"apc_paid":null,"fwci":2.3931,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.89480037,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"61","issue":"5","first_page":"1424","last_page":"1435"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11798","display_name":"Optimal Experimental Design Methods","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-plan","display_name":"Test plan","score":0.7274621725082397},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6807789206504822},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6778785586357117},{"id":"https://openalex.org/keywords/log-normal-distribution","display_name":"Log-normal distribution","score":0.6052819490432739},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.44206956028938293},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.42281949520111084},{"id":"https://openalex.org/keywords/sample-size-determination","display_name":"Sample size determination","score":0.4149608910083771},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3512028455734253},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.298831582069397},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2573254108428955}],"concepts":[{"id":"https://openalex.org/C12148698","wikidata":"https://www.wikidata.org/wiki/Q364651","display_name":"Test plan","level":3,"score":0.7274621725082397},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6807789206504822},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6778785586357117},{"id":"https://openalex.org/C151620405","wikidata":"https://www.wikidata.org/wiki/Q826116","display_name":"Log-normal distribution","level":2,"score":0.6052819490432739},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.44206956028938293},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.42281949520111084},{"id":"https://openalex.org/C129848803","wikidata":"https://www.wikidata.org/wiki/Q2564360","display_name":"Sample size determination","level":2,"score":0.4149608910083771},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3512028455734253},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.298831582069397},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2573254108428955},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1080/00207543.2022.2036852","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00207543.2022.2036852","pdf_url":null,"source":{"id":"https://openalex.org/S65690446","display_name":"International Journal of Production Research","issn_l":"0020-7543","issn":["0020-7543","1366-588X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Production Research","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:taf:tprsxx:v:61:y:2023:i:5:p:1424-1435","is_oa":false,"landing_page_url":"http://hdl.handle.net/10.1080/00207543.2022.2036852","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.4699999988079071}],"awards":[{"id":"https://openalex.org/G6400069920","display_name":null,"funder_award_id":"PID2019-110442GB-I00","funder_id":"https://openalex.org/F4320322930","funder_display_name":"Ministerio de Ciencia e Innovaci\u00f3n"}],"funders":[{"id":"https://openalex.org/F4320322930","display_name":"Ministerio de Ciencia e Innovaci\u00f3n","ror":"https://ror.org/034900433"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":63,"referenced_works":["https://openalex.org/W290564649","https://openalex.org/W1646965249","https://openalex.org/W1965449643","https://openalex.org/W1968003617","https://openalex.org/W1970553472","https://openalex.org/W1971805336","https://openalex.org/W1975904493","https://openalex.org/W1983093865","https://openalex.org/W2008077877","https://openalex.org/W2010992209","https://openalex.org/W2013442496","https://openalex.org/W2014088850","https://openalex.org/W2043430453","https://openalex.org/W2054244490","https://openalex.org/W2061207866","https://openalex.org/W2071057856","https://openalex.org/W2076812642","https://openalex.org/W2077167589","https://openalex.org/W2086074691","https://openalex.org/W2087926533","https://openalex.org/W2108111180","https://openalex.org/W2115379799","https://openalex.org/W2127657102","https://openalex.org/W2129761538","https://openalex.org/W2133048896","https://openalex.org/W2143998509","https://openalex.org/W2151038992","https://openalex.org/W2154723041","https://openalex.org/W2185986134","https://openalex.org/W2264709743","https://openalex.org/W2327898341","https://openalex.org/W2329712949","https://openalex.org/W2460328902","https://openalex.org/W2486038092","https://openalex.org/W2490820997","https://openalex.org/W2532343583","https://openalex.org/W2538706963","https://openalex.org/W2542760697","https://openalex.org/W2549666874","https://openalex.org/W2737327405","https://openalex.org/W2767284538","https://openalex.org/W2791028677","https://openalex.org/W2802198869","https://openalex.org/W2808303475","https://openalex.org/W2896790411","https://openalex.org/W2914224644","https://openalex.org/W2921148549","https://openalex.org/W2945857183","https://openalex.org/W2947891245","https://openalex.org/W2970673009","https://openalex.org/W3000412064","https://openalex.org/W3003649781","https://openalex.org/W3011948285","https://openalex.org/W3012063345","https://openalex.org/W3023781016","https://openalex.org/W3025970346","https://openalex.org/W3026794419","https://openalex.org/W3034033430","https://openalex.org/W3048916111","https://openalex.org/W3153838202","https://openalex.org/W3208154130","https://openalex.org/W4235065119","https://openalex.org/W4302067386"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Improved":[0],"lognormal":[1,32],"reliability":[2,28,94,122],"test":[3,29,87,91,124],"plans":[4],"are":[5,60,68],"proposed":[6],"for":[7,92,142],"lot":[8],"sentencing.":[9],"A":[10,110],"mixed":[11],"integer":[12],"nonlinear":[13],"programming":[14],"problem":[15],"is":[16,76,116,129],"stated":[17],"and":[18,51,65,86,107,112,139],"solved":[19],"in":[20,70],"order":[21],"to":[22,57,100,118,131],"find":[23],"the":[24,27,38,48,52,73,82,97,102,120,132],"duration":[25],"of":[26,44,55,81,104,134],"based":[30],"on":[31],"failure":[33],"count":[34],"data":[35],"that":[36],"minimises":[37],"inspection":[39],"effort.":[40],"The":[41,63,89,126],"maximum":[42],"number":[43,54],"failures":[45],"tolerated":[46],"by":[47],"decision":[49],"maker":[50],"necessary":[53],"devices":[56],"be":[58],"tested":[59],"also":[61],"determined.":[62],"producer":[64],"consumer":[66],"risks":[67],"limited":[69],"advanced,":[71],"whereas":[72],"cost":[74],"function":[75],"essentially":[77],"a":[78],"linear":[79],"combination":[80],"required":[83],"sample":[84],"size":[85],"time.":[88],"minimum-cost":[90],"device":[93],"demonstration":[95,123],"provides":[96],"best":[98],"criterion":[99],"decide":[101],"acceptability":[103],"manufacturing":[105],"processes":[106],"submitted":[108],"lots.":[109],"quick":[111],"effective":[113],"iterative":[114],"algorithm":[115],"suggested":[117],"obtain":[119],"optimal":[121],"plan.":[125],"developed":[127],"methodology":[128],"applied":[130],"production":[133],"microelectronic":[135],"chips,":[136],"semiconductor":[137],"lasers":[138],"ball":[140],"bearings":[141],"illustrative":[143],"purposes.":[144]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":5}],"updated_date":"2026-08-15T07:11:24.734988","created_date":"2025-10-10T00:00:00"}