{"id":"https://openalex.org/W3000905185","doi":"https://doi.org/10.1080/00207543.2020.1711984","title":"A sampling-based approach for managing lot release in time constraint tunnels in semiconductor manufacturing","display_name":"A sampling-based approach for managing lot release in time constraint tunnels in semiconductor manufacturing","publication_year":2020,"publication_date":"2020-01-19","ids":{"openalex":"https://openalex.org/W3000905185","doi":"https://doi.org/10.1080/00207543.2020.1711984","mag":"3000905185"},"language":"en","primary_location":{"id":"doi:10.1080/00207543.2020.1711984","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00207543.2020.1711984","pdf_url":null,"source":{"id":"https://openalex.org/S65690446","display_name":"International Journal of Production Research","issn_l":"0020-7543","issn":["0020-7543","1366-588X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Production Research","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/11250/2637317","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059893465","display_name":"Alexandre Lima","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I3019848993","display_name":"Mines Saint-\u00c9tienne","ror":"https://ror.org/05a1dws80","country_code":"FR","type":"education","lineage":["https://openalex.org/I203339264","https://openalex.org/I205703379","https://openalex.org/I3019848993"]},{"id":"https://openalex.org/I4210099416","display_name":"Laboratoire d'Informatique, de Mod\u00e9lisation et d'Optimisation des Syst\u00e8mes","ror":"https://ror.org/00t3fpp34","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I198244214","https://openalex.org/I198244214","https://openalex.org/I203339264","https://openalex.org/I205703379","https://openalex.org/I3019848993","https://openalex.org/I4210099416","https://openalex.org/I4210123221","https://openalex.org/I4210159245","https://openalex.org/I4387154249"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Alexandre Lima","raw_affiliation_strings":["Advanced Engineering Methods Department, ST Microelectronics, Crolles, France","Department of Manufacturing Sciences and Logistics, Mines Saint-Etienne, Univ Clermont Auvergne, CNRS, UMR 6158 LIMOS, CMP, Gardanne, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Engineering Methods Department, ST Microelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"Department of Manufacturing Sciences and Logistics, Mines Saint-Etienne, Univ Clermont Auvergne, CNRS, UMR 6158 LIMOS, CMP, Gardanne, France","institution_ids":["https://openalex.org/I3019848993","https://openalex.org/I4210099416","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072627802","display_name":"Valeria Borodin","orcid":"https://orcid.org/0000-0001-9285-0587"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I3019848993","display_name":"Mines Saint-\u00c9tienne","ror":"https://ror.org/05a1dws80","country_code":"FR","type":"education","lineage":["https://openalex.org/I203339264","https://openalex.org/I205703379","https://openalex.org/I3019848993"]},{"id":"https://openalex.org/I4210099416","display_name":"Laboratoire d'Informatique, de Mod\u00e9lisation et d'Optimisation des Syst\u00e8mes","ror":"https://ror.org/00t3fpp34","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I198244214","https://openalex.org/I198244214","https://openalex.org/I203339264","https://openalex.org/I205703379","https://openalex.org/I3019848993","https://openalex.org/I4210099416","https://openalex.org/I4210123221","https://openalex.org/I4210159245","https://openalex.org/I4387154249"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Valeria Borodin","raw_affiliation_strings":["Department of Manufacturing Sciences and Logistics, Mines Saint-Etienne, Univ Clermont Auvergne, CNRS, UMR 6158 LIMOS, CMP, Gardanne, France"],"raw_orcid":"https://orcid.org/0000-0001-9285-0587","affiliations":[{"raw_affiliation_string":"Department of Manufacturing Sciences and Logistics, Mines Saint-Etienne, Univ Clermont Auvergne, CNRS, UMR 6158 LIMOS, CMP, Gardanne, France","institution_ids":["https://openalex.org/I3019848993","https://openalex.org/I4210099416","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028102263","display_name":"St\u00e9phane Dauz\u00e8re\u2010P\u00e9r\u00e8s","orcid":"https://orcid.org/0000-0002-3566-3248"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I181046868","display_name":"BI Norwegian Business School","ror":"https://ror.org/03ez40v33","country_code":"NO","type":"education","lineage":["https://openalex.org/I181046868"]},{"id":"https://openalex.org/I3019848993","display_name":"Mines Saint-\u00c9tienne","ror":"https://ror.org/05a1dws80","country_code":"FR","type":"education","lineage":["https://openalex.org/I203339264","https://openalex.org/I205703379","https://openalex.org/I3019848993"]},{"id":"https://openalex.org/I4210099416","display_name":"Laboratoire d'Informatique, de Mod\u00e9lisation et d'Optimisation des Syst\u00e8mes","ror":"https://ror.org/00t3fpp34","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I198244214","https://openalex.org/I198244214","https://openalex.org/I203339264","https://openalex.org/I205703379","https://openalex.org/I3019848993","https://openalex.org/I4210099416","https://openalex.org/I4210123221","https://openalex.org/I4210159245","https://openalex.org/I4387154249"]}],"countries":["FR","NO"],"is_corresponding":false,"raw_author_name":"St\u00e9phane Dauz\u00e8re-P\u00e9r\u00e8s","raw_affiliation_strings":["Department of Accounting, Auditing and Business Analytics, BI Norwegian Business School, Oslo, Norway","Department of Manufacturing Sciences and Logistics, Mines Saint-Etienne, Univ Clermont Auvergne, CNRS, UMR 6158 LIMOS, CMP, Gardanne, France"],"raw_orcid":"https://orcid.org/0000-0002-3566-3248","affiliations":[{"raw_affiliation_string":"Department of Accounting, Auditing and Business Analytics, BI Norwegian Business School, Oslo, Norway","institution_ids":["https://openalex.org/I181046868"]},{"raw_affiliation_string":"Department of Manufacturing Sciences and Logistics, Mines Saint-Etienne, Univ Clermont Auvergne, CNRS, UMR 6158 LIMOS, CMP, Gardanne, France","institution_ids":["https://openalex.org/I3019848993","https://openalex.org/I4210099416","https://openalex.org/I1294671590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073387018","display_name":"Philippe Vialletelle","orcid":"https://orcid.org/0000-0002-5782-169X"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Philippe Vialletelle","raw_affiliation_strings":["Advanced Engineering Methods Department, ST Microelectronics, Crolles, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Engineering Methods Department, ST Microelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5059893465"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I3019848993","https://openalex.org/I4210099416","https://openalex.org/I4210104693"],"apc_list":null,"apc_paid":null,"fwci":3.0725,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.92028481,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"59","issue":"3","first_page":"860","last_page":"884"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11814","display_name":"Advanced Manufacturing and Logistics Optimization","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12782","display_name":"Assembly Line Balancing Optimization","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.703868567943573},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.6992712616920471},{"id":"https://openalex.org/keywords/soundness","display_name":"Soundness","score":0.6820823550224304},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.6588426828384399},{"id":"https://openalex.org/keywords/wafer-fabrication","display_name":"Wafer fabrication","score":0.6047534346580505},{"id":"https://openalex.org/keywords/time-constraint","display_name":"Time constraint","score":0.549579918384552},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.49829912185668945},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.4899212718009949},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4877646565437317},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.48755449056625366},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47724151611328125},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.47532227635383606},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.46155309677124023},{"id":"https://openalex.org/keywords/resource","display_name":"Resource (disambiguation)","score":0.45344334840774536},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.43896955251693726},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3774920403957367},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.3585284948348999},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1817164123058319},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.13737055659294128}],"concepts":[{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.703868567943573},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.6992712616920471},{"id":"https://openalex.org/C39920170","wikidata":"https://www.wikidata.org/wiki/Q693083","display_name":"Soundness","level":2,"score":0.6820823550224304},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.6588426828384399},{"id":"https://openalex.org/C35750839","wikidata":"https://www.wikidata.org/wiki/Q7959421","display_name":"Wafer fabrication","level":3,"score":0.6047534346580505},{"id":"https://openalex.org/C2775907273","wikidata":"https://www.wikidata.org/wiki/Q7805281","display_name":"Time constraint","level":2,"score":0.549579918384552},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.49829912185668945},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.4899212718009949},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4877646565437317},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.48755449056625366},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47724151611328125},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.47532227635383606},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.46155309677124023},{"id":"https://openalex.org/C206345919","wikidata":"https://www.wikidata.org/wiki/Q20380951","display_name":"Resource (disambiguation)","level":2,"score":0.45344334840774536},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.43896955251693726},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3774920403957367},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.3585284948348999},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1817164123058319},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.13737055659294128},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1080/00207543.2020.1711984","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00207543.2020.1711984","pdf_url":null,"source":{"id":"https://openalex.org/S65690446","display_name":"International Journal of Production Research","issn_l":"0020-7543","issn":["0020-7543","1366-588X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Production Research","raw_type":"journal-article"},{"id":"pmh:oai:HAL:emse-02445244v1","is_oa":false,"landing_page_url":"https://hal-emse.ccsd.cnrs.fr/emse-02445244","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"International Journal of Production Research, 2020, pp.1-25. &#x27E8;10.1080/00207543.2020.1711984&#x27E9;","raw_type":"Journal articles"},{"id":"pmh:oai:RePEc:taf:tprsxx:v:59:y:2021:i:3:p:860-884","is_oa":false,"landing_page_url":"http://hdl.handle.net/10.1080/00207543.2020.1711984","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"},{"id":"pmh:oai:biopen.bi.no:11250/2637317","is_oa":true,"landing_page_url":"http://hdl.handle.net/11250/2637317","pdf_url":null,"source":{"id":"https://openalex.org/S4306401716","display_name":"Duo Research Archive (University of Oslo)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184942183","host_organization_name":"University of Oslo","host_organization_lineage":["https://openalex.org/I184942183"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"25","raw_type":"info:eu-repo/semantics/other"}],"best_oa_location":{"id":"pmh:oai:biopen.bi.no:11250/2637317","is_oa":true,"landing_page_url":"http://hdl.handle.net/11250/2637317","pdf_url":null,"source":{"id":"https://openalex.org/S4306401716","display_name":"Duo Research Archive (University of Oslo)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184942183","host_organization_name":"University of Oslo","host_organization_lineage":["https://openalex.org/I184942183"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"25","raw_type":"info:eu-repo/semantics/other"},"sustainable_development_goals":[{"score":0.6000000238418579,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321663","display_name":"Association Nationale de la Recherche et de la Technologie","ror":"https://ror.org/00ht2ab73"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W159012016","https://openalex.org/W1507539267","https://openalex.org/W1546051781","https://openalex.org/W1968771985","https://openalex.org/W1969920159","https://openalex.org/W1974592643","https://openalex.org/W2024710255","https://openalex.org/W2030174405","https://openalex.org/W2056651702","https://openalex.org/W2077328348","https://openalex.org/W2085159440","https://openalex.org/W2087121390","https://openalex.org/W2088304441","https://openalex.org/W2117270233","https://openalex.org/W2134460509","https://openalex.org/W2142728935","https://openalex.org/W2169092059","https://openalex.org/W2199171941","https://openalex.org/W2243769293","https://openalex.org/W2324063696","https://openalex.org/W2341190110","https://openalex.org/W2609642187","https://openalex.org/W2729558485","https://openalex.org/W2744200468","https://openalex.org/W2747781185","https://openalex.org/W2766347330","https://openalex.org/W2783900258","https://openalex.org/W2798036437","https://openalex.org/W2798951743","https://openalex.org/W2799894749","https://openalex.org/W2945905516","https://openalex.org/W3146122527","https://openalex.org/W4236008107","https://openalex.org/W4236300353","https://openalex.org/W4237444794","https://openalex.org/W4253516445","https://openalex.org/W6679859608"],"related_works":["https://openalex.org/W2146435486","https://openalex.org/W2170726572","https://openalex.org/W2006086900","https://openalex.org/W1483119123","https://openalex.org/W2377558694","https://openalex.org/W2992897358","https://openalex.org/W2394172622","https://openalex.org/W1546051781","https://openalex.org/W2033828815","https://openalex.org/W2794006557"],"abstract_inverted_index":{"For":[0],"the":[1,102,148,159,163,167,173],"sake":[2],"of":[3,26,49,65,166],"product":[4],"yield":[5],"and":[6,38,70,90,141,145,162],"quality":[7],"considerations,":[8],"time":[9,28,42,54,114],"constraints":[10,29],"(TCs)":[11],"are":[12,79],"imposed":[13],"between":[14],"process":[15],"operations":[16],"in":[17,35,52,60,81,126],"various":[18,127],"multi-product":[19],"manufacturing":[20,62,150],"systems.":[21],"Often":[22],"spanning":[23],"a":[24,96,109,112],"number":[25],"operations,":[27],"tend":[30],"to":[31,100,106,123,147],"follow":[32],"each":[33],"other":[34],"close":[36],"succession":[37],"overlap,":[39],"forming":[40],"thus":[41],"constraint":[43,55,115],"tunnels":[44,56],"(TCTs).":[45],"The":[46,119],"regulation":[47],"problem":[48,169],"releasing":[50],"lots":[51],"these":[53],"is":[57],"particularly":[58],"challenging":[59],"semiconductor":[61],"systems,":[63],"because":[64],"re-entrant":[66],"flows,":[67],"machine":[68],"heterogeneity":[69],"high":[71],"mix":[72],"low":[73],"volume":[74],"(HM-LV)":[75],"production":[76],"configurations,":[77],"which":[78],"typical":[80],"many":[82],"wafer":[83],"fabrication":[84],"facilities.":[85],"In":[86],"such":[87],"an":[88],"evolving":[89],"time-varying":[91],"context,":[92],"this":[93],"paper":[94],"proposes":[95],"sequential":[97],"sampling-based":[98],"approach":[99,121],"estimate":[101],"probability":[103],"that,":[104],"prior":[105],"its":[107],"release,":[108],"lot":[110],"leaves":[111],"given":[113],"tunnel":[116],"on":[117,153],"time.":[118],"proposed":[120,168],"proves":[122],"be":[124],"competitive":[125],"respects":[128],"by":[129],"(i)":[130],"taking":[131],"into":[132],"account":[133],"industry":[134],"specific":[135],"features,":[136],"(ii)":[137],"being":[138,143],"industrially":[139],"tractable,":[140],"(iii)":[142],"sensitive":[144],"responsive":[146],"current":[149],"system.":[151],"Based":[152],"real-life":[154],"instances,":[155],"numerical":[156],"experiments":[157],"highlight":[158],"computational":[160],"effectiveness":[161],"industrial":[164],"soundness":[165],"modelling":[170],"together":[171],"with":[172],"solution":[174],"approach.":[175]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":4}],"updated_date":"2026-05-30T09:04:40.226872","created_date":"2025-10-10T00:00:00"}
