{"id":"https://openalex.org/W2161432877","doi":"https://doi.org/10.1049/ip-sen:19982439","title":"Reliability-oriented software engineering: design, testing and evaluation techniques","display_name":"Reliability-oriented software engineering: design, testing and evaluation techniques","publication_year":1998,"publication_date":"1998-01-01","ids":{"openalex":"https://openalex.org/W2161432877","doi":"https://doi.org/10.1049/ip-sen:19982439","mag":"2161432877"},"language":"en","primary_location":{"id":"doi:10.1049/ip-sen:19982439","is_oa":false,"landing_page_url":"https://doi.org/10.1049/ip-sen:19982439","pdf_url":null,"source":{"id":"https://openalex.org/S4210197075","display_name":"IEE Proceedings - Software","issn_l":"1462-5970","issn":["1462-5970","1463-9831"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEE Proceedings - Software","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069596903","display_name":"Michael R. Lyu","orcid":"https://orcid.org/0000-0002-3666-5798"},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"HK","type":"education","lineage":["https://openalex.org/I177725633"]}],"countries":["HK"],"is_corresponding":true,"raw_author_name":"M.R. Lyu","raw_affiliation_strings":["Computer Science and Engineering Department, The Chinese University of Hong Kong, Shatin, Hong Kong"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Science and Engineering Department, The Chinese University of Hong Kong, Shatin, Hong Kong","institution_ids":["https://openalex.org/I177725633"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5069596903"],"corresponding_institution_ids":["https://openalex.org/I177725633"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.31691176,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"145","issue":"6","first_page":"191","last_page":"191"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9613999724388123,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.935699999332428,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.7995670437812805},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7932441234588623},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.63629150390625},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5396791100502014},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.5270688533782959},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.5266185402870178},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5236544609069824},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.4910121262073517},{"id":"https://openalex.org/keywords/verification-and-validation","display_name":"Verification and validation","score":0.4410494267940521},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4232240617275238},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.34154048562049866},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.27231264114379883},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2490309476852417},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.05919751524925232}],"concepts":[{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.7995670437812805},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7932441234588623},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.63629150390625},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5396791100502014},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.5270688533782959},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.5266185402870178},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5236544609069824},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.4910121262073517},{"id":"https://openalex.org/C48002344","wikidata":"https://www.wikidata.org/wiki/Q2919644","display_name":"Verification and validation","level":2,"score":0.4410494267940521},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4232240617275238},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.34154048562049866},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.27231264114379883},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2490309476852417},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.05919751524925232},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/ip-sen:19982439","is_oa":false,"landing_page_url":"https://doi.org/10.1049/ip-sen:19982439","pdf_url":null,"source":{"id":"https://openalex.org/S4210197075","display_name":"IEE Proceedings - Software","issn_l":"1462-5970","issn":["1462-5970","1463-9831"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEE Proceedings - Software","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1754864101","https://openalex.org/W1856203234","https://openalex.org/W1999667809","https://openalex.org/W2008515962","https://openalex.org/W2018400555","https://openalex.org/W2128260238","https://openalex.org/W2129376593","https://openalex.org/W2146658954","https://openalex.org/W2963531446","https://openalex.org/W4232802853","https://openalex.org/W4246380555","https://openalex.org/W4255673994","https://openalex.org/W4285719527","https://openalex.org/W6681044807","https://openalex.org/W6682632765","https://openalex.org/W6686747482"],"related_works":["https://openalex.org/W234065253","https://openalex.org/W4238386252","https://openalex.org/W1571231229","https://openalex.org/W2023346118","https://openalex.org/W2389770817","https://openalex.org/W2354586700","https://openalex.org/W2140677443","https://openalex.org/W1494025131","https://openalex.org/W2798306226","https://openalex.org/W2209071826"],"abstract_inverted_index":{"Software":[0],"reliability":[1,16,20,39,58,69,85,121],"engineering":[2,86],"involves":[3],"techniques":[4,25,44,63,133],"for":[5,19,38,57,87,125],"the":[6,28,32,52,68,71,79],"design,":[7,88],"testing":[8,89,109],"and":[9,47,66,90,102,119,137],"evaluation":[10,91],"of":[11,34,70,96,116],"software":[12,35,49,84,105,108,117,126],"systems,":[13,106],"focusing":[14],"on":[15],"attributes.":[17],"Design":[18],"is":[21,40,54,59],"achieved":[22,41,60],"by":[23,42,61],"fault-tolerance":[24],"that":[26,45,64],"keep":[27],"system":[29,53,72],"working":[30],"in":[31,83],"presence":[33],"faults.":[36],"Testing":[37],"fault-removal":[43],"detect":[46],"correct":[48],"faults":[50],"before":[51],"deployed.":[55],"Evaluation":[56],"fault-prediction":[62],"model":[65],"measure":[67],"during":[73],"its":[74],"operation.":[75],"This":[76],"paper":[77],"presents":[78],"best":[80],"current":[81],"practices":[82],"purposes.":[92],"There":[93],"are":[94,100,111,123,134,141],"descriptions":[95],"how":[97,107,120],"fault-tolerant":[98],"components":[99],"designed":[101],"applied":[103],"to":[104,113],"schemes":[110],"performed":[112],"show":[114],"improvement":[115],"reliability,":[118],"quantities":[122],"obtained":[124],"systems.":[127],"The":[128],"tools":[129],"associated":[130],"with":[131],"these":[132],"also":[135],"examined,":[136],"some":[138],"application":[139],"results":[140],"described.":[142]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}