{"id":"https://openalex.org/W2061294081","doi":"https://doi.org/10.1049/iet-cdt:20080020","title":"Droop sensitivity of stuck-at fault tests","display_name":"Droop sensitivity of stuck-at fault tests","publication_year":2009,"publication_date":"2009-03-02","ids":{"openalex":"https://openalex.org/W2061294081","doi":"https://doi.org/10.1049/iet-cdt:20080020","mag":"2061294081"},"language":"en","primary_location":{"id":"doi:10.1049/iet-cdt:20080020","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cdt:20080020","pdf_url":null,"source":{"id":"https://openalex.org/S28293273","display_name":"IET Computers & Digital Techniques","issn_l":"1751-8601","issn":["1751-8601","1751-861X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Computers & Digital Techniques","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064391008","display_name":"Debasis Mitra","orcid":"https://orcid.org/0000-0002-4351-1252"},"institutions":[{"id":"https://openalex.org/I115715567","display_name":"Birla Institute of Technology, Mesra","ror":"https://ror.org/028vtqb15","country_code":"IN","type":"education","lineage":["https://openalex.org/I115715567"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"D. Mitra","raw_affiliation_strings":["Department of Computer Science and Engineering, Birla Institute of Technology, Kolkata Extension Centre, Mesra, India","Department of Computer Science and Engineering, Birla Institute of Technology, Mesra, Kolkata Extension Centre, India E-mail: debasis.mitra@gmail.com"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Birla Institute of Technology, Kolkata Extension Centre, Mesra, India","institution_ids":["https://openalex.org/I115715567"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, Birla Institute of Technology, Mesra, Kolkata Extension Centre, India E-mail: debasis.mitra@gmail.com","institution_ids":["https://openalex.org/I115715567"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021904459","display_name":"Susmita Sur\u2010Kolay","orcid":"https://orcid.org/0000-0002-2052-3779"},"institutions":[{"id":"https://openalex.org/I6498739","display_name":"Indian Statistical Institute","ror":"https://ror.org/00q2w1j53","country_code":"IN","type":"education","lineage":["https://openalex.org/I6498739"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"S. Sur-Kolay","raw_affiliation_strings":["Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India","Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India E-mail: debasis.mitra@gmail.com"],"affiliations":[{"raw_affiliation_string":"Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India","institution_ids":["https://openalex.org/I6498739"]},{"raw_affiliation_string":"Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India E-mail: debasis.mitra@gmail.com","institution_ids":["https://openalex.org/I6498739"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052870102","display_name":"Bhaswar B. Bhattacharya","orcid":"https://orcid.org/0000-0002-2528-843X"},"institutions":[{"id":"https://openalex.org/I6498739","display_name":"Indian Statistical Institute","ror":"https://ror.org/00q2w1j53","country_code":"IN","type":"education","lineage":["https://openalex.org/I6498739"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"B.B. Bhattacharya","raw_affiliation_strings":["Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India","Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India E-mail: debasis.mitra@gmail.com"],"affiliations":[{"raw_affiliation_string":"Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India","institution_ids":["https://openalex.org/I6498739"]},{"raw_affiliation_string":"Advanced Computing and Microelectronics Unit, Indian Statistical Institute, Kolkata, India E-mail: debasis.mitra@gmail.com","institution_ids":["https://openalex.org/I6498739"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5064391008"],"corresponding_institution_ids":["https://openalex.org/I115715567"],"apc_list":{"value":2000,"currency":"EUR","value_usd":2200},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09916132,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"3","issue":"2","first_page":"175","last_page":"183"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.9866753816604614},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5935301184654236},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5595622062683105},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5017521381378174},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4834243059158325},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4775317907333374},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.4672546088695526},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.437645822763443},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4225907325744629},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.41602861881256104},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3020871877670288},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.221140056848526},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1847732663154602},{"id":"https://openalex.org/keywords/voltage-regulator","display_name":"Voltage regulator","score":0.0854206383228302}],"concepts":[{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.9866753816604614},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5935301184654236},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5595622062683105},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5017521381378174},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4834243059158325},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4775317907333374},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.4672546088695526},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.437645822763443},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4225907325744629},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.41602861881256104},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3020871877670288},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.221140056848526},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1847732663154602},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.0854206383228302},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/iet-cdt:20080020","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cdt:20080020","pdf_url":null,"source":{"id":"https://openalex.org/S28293273","display_name":"IET Computers & Digital Techniques","issn_l":"1751-8601","issn":["1751-8601","1751-861X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Computers & Digital Techniques","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5600000023841858}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1496730449","https://openalex.org/W1543643719","https://openalex.org/W1595368737","https://openalex.org/W2079150276","https://openalex.org/W2102355929","https://openalex.org/W2106303764","https://openalex.org/W2109791184","https://openalex.org/W2109799272","https://openalex.org/W2110102663","https://openalex.org/W2139234345","https://openalex.org/W2140496098","https://openalex.org/W2149998114","https://openalex.org/W2152321821","https://openalex.org/W2156892082","https://openalex.org/W2587271961","https://openalex.org/W4236133696","https://openalex.org/W6629844068","https://openalex.org/W6632380943"],"related_works":["https://openalex.org/W2523432015","https://openalex.org/W2153130273","https://openalex.org/W2765340260","https://openalex.org/W2143080380","https://openalex.org/W2076823813","https://openalex.org/W1589163333","https://openalex.org/W3008686614","https://openalex.org/W4283727597","https://openalex.org/W2060924671","https://openalex.org/W3180072344"],"abstract_inverted_index":{"In":[0],"nanometer-scale":[1],"integrated":[2],"circuits,":[3,89],"simultaneous":[4],"switching":[5],"at":[6],"gates":[7],"in":[8,34,120,131],"physical":[9],"proximity":[10],"may":[11,38,51],"induce":[12],"power":[13],"supply":[14],"droop,":[15],"and":[16,100],"thereby":[17],"invoke":[18],"timing":[19],"faults,":[20],"termed":[21],"as":[22],"droop":[23,40,65,78,91],"faults.":[24],"During":[25],"at-speed":[26],"testing":[27,56,81],"of":[28,48,64,71,77,82,93,103],"such":[29],"chips,":[30],"two":[31],"test":[32,36,44,49,72,96,121],"vectors":[33,50,73],"a":[35,94,101],"sequence":[37,70,97],"excite":[39],"and,":[41],"thus,":[42],"cause":[43],"invalidation.":[45],"Fast":[46],"application":[47],"be":[52],"needed":[53],"for":[54,58],"high-speed":[55],"or":[57],"built-in":[59],"self-test":[60],"systems.":[61],"The":[62,75],"occurrence":[63],"strongly":[66],"depends":[67],"on":[68,79,113],"the":[69,90,118],"applied.":[74],"effect":[76,108],"fast":[80],"stuck-at":[83],"faults":[84],"is":[85,98,109,127,135],"investigated.":[86],"For":[87],"combinational":[88],"sensitivity":[92],"given":[95],"studied":[99],"method":[102],"re-ordering":[104,126],"to":[105,123],"reduce":[106],"this":[107],"proposed.":[110],"Experimental":[111],"results":[112],"benchmark":[114],"circuits":[115,134],"show":[116],"that":[117],"increase":[119],"length":[122],"achieve":[124],"droop-insensitive":[125],"low.":[128],"Droop":[129],"excitability":[130],"full-scan":[132],"sequential":[133],"also":[136],"studied.":[137]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}