{"id":"https://openalex.org/W2068649099","doi":"https://doi.org/10.1049/iet-cdt:20070003","title":"Efficient test compression technique based on block merging","display_name":"Efficient test compression technique based on block merging","publication_year":2008,"publication_date":"2008-08-26","ids":{"openalex":"https://openalex.org/W2068649099","doi":"https://doi.org/10.1049/iet-cdt:20070003","mag":"2068649099"},"language":"en","primary_location":{"id":"doi:10.1049/iet-cdt:20070003","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cdt:20070003","pdf_url":null,"source":{"id":"https://openalex.org/S28293273","display_name":"IET Computers & Digital Techniques","issn_l":"1751-8601","issn":["1751-8601","1751-861X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Computers & Digital Techniques","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086020181","display_name":"Aiman H. El\u2010Maleh","orcid":"https://orcid.org/0000-0002-3247-0598"},"institutions":[{"id":"https://openalex.org/I134085113","display_name":"King Fahd University of Petroleum and Minerals","ror":"https://ror.org/03yez3163","country_code":"SA","type":"education","lineage":["https://openalex.org/I134085113"]}],"countries":["SA"],"is_corresponding":true,"raw_author_name":"A.H. El-Maleh","raw_affiliation_strings":["Department of Computer Engineering, King Fahd University of Petroleum and Minerals, PO Box 1063, Dhahran, 31261, Saudi Arabia"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, King Fahd University of Petroleum and Minerals, PO Box 1063, Dhahran, 31261, Saudi Arabia","institution_ids":["https://openalex.org/I134085113"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5086020181"],"corresponding_institution_ids":["https://openalex.org/I134085113"],"apc_list":{"value":2000,"currency":"EUR","value_usd":2200},"apc_paid":null,"fwci":5.8556,"has_fulltext":false,"cited_by_count":50,"citation_normalized_percentile":{"value":0.96376976,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"2","issue":"5","first_page":"327","last_page":"335"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9884999990463257,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7121790051460266},{"id":"https://openalex.org/keywords/data-compression","display_name":"Data compression","score":0.6163949966430664},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.6011655926704407},{"id":"https://openalex.org/keywords/compression","display_name":"Compression (physics)","score":0.5738658905029297},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.5570018291473389},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.5500041246414185},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.527216911315918},{"id":"https://openalex.org/keywords/compression-ratio","display_name":"Compression ratio","score":0.4816776216030121},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.4457733929157257},{"id":"https://openalex.org/keywords/coding","display_name":"Coding (social sciences)","score":0.4429141581058502},{"id":"https://openalex.org/keywords/data-compression-ratio","display_name":"Data compression ratio","score":0.43919479846954346},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3808709681034088},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3559629023075104},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3322291672229767},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3275149464607239},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.31221210956573486},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.27327030897140503},{"id":"https://openalex.org/keywords/image-compression","display_name":"Image compression","score":0.23620983958244324},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13428348302841187},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12117695808410645},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09956207871437073}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7121790051460266},{"id":"https://openalex.org/C78548338","wikidata":"https://www.wikidata.org/wiki/Q2493","display_name":"Data compression","level":2,"score":0.6163949966430664},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.6011655926704407},{"id":"https://openalex.org/C180016635","wikidata":"https://www.wikidata.org/wiki/Q2712821","display_name":"Compression (physics)","level":2,"score":0.5738658905029297},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.5570018291473389},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.5500041246414185},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.527216911315918},{"id":"https://openalex.org/C25797200","wikidata":"https://www.wikidata.org/wiki/Q828137","display_name":"Compression ratio","level":3,"score":0.4816776216030121},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.4457733929157257},{"id":"https://openalex.org/C179518139","wikidata":"https://www.wikidata.org/wiki/Q5140297","display_name":"Coding (social sciences)","level":2,"score":0.4429141581058502},{"id":"https://openalex.org/C94835093","wikidata":"https://www.wikidata.org/wiki/Q3113333","display_name":"Data compression ratio","level":5,"score":0.43919479846954346},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3808709681034088},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3559629023075104},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3322291672229767},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3275149464607239},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.31221210956573486},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.27327030897140503},{"id":"https://openalex.org/C13481523","wikidata":"https://www.wikidata.org/wiki/Q412438","display_name":"Image compression","level":4,"score":0.23620983958244324},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13428348302841187},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12117695808410645},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09956207871437073},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C511840579","wikidata":"https://www.wikidata.org/wiki/Q12757","display_name":"Internal combustion engine","level":2,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1049/iet-cdt:20070003","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cdt:20070003","pdf_url":null,"source":{"id":"https://openalex.org/S28293273","display_name":"IET Computers & Digital Techniques","issn_l":"1751-8601","issn":["1751-8601","1751-861X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Computers & Digital Techniques","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.114.9082","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.114.9082","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.ccse.kfupm.edu.sa/~aimane/pub/iet_block_merging_submitted2.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322323","display_name":"King Fahd University of Petroleum and Minerals","ror":"https://ror.org/03yez3163"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1517139843","https://openalex.org/W1585172397","https://openalex.org/W1627397376","https://openalex.org/W1734265887","https://openalex.org/W2005424274","https://openalex.org/W2021917057","https://openalex.org/W2038886877","https://openalex.org/W2040150722","https://openalex.org/W2077562862","https://openalex.org/W2101900253","https://openalex.org/W2104343580","https://openalex.org/W2104884563","https://openalex.org/W2104920289","https://openalex.org/W2105028194","https://openalex.org/W2108481929","https://openalex.org/W2122955150","https://openalex.org/W2123172689","https://openalex.org/W2123683226","https://openalex.org/W2123690544","https://openalex.org/W2128426877","https://openalex.org/W2129286312","https://openalex.org/W2131803874","https://openalex.org/W2132731265","https://openalex.org/W2133595845","https://openalex.org/W2135627440","https://openalex.org/W2140939511","https://openalex.org/W2143404021","https://openalex.org/W2146594632","https://openalex.org/W2146638092","https://openalex.org/W2147093802","https://openalex.org/W2148218783","https://openalex.org/W2149792223","https://openalex.org/W2157198810","https://openalex.org/W2159343583","https://openalex.org/W2159871346","https://openalex.org/W2169451209","https://openalex.org/W2171269203","https://openalex.org/W2542602675"],"related_works":["https://openalex.org/W2587261312","https://openalex.org/W2059809701","https://openalex.org/W1999000076","https://openalex.org/W2042812046","https://openalex.org/W2104943416","https://openalex.org/W2542602675","https://openalex.org/W2368734150","https://openalex.org/W2136849332","https://openalex.org/W2127525889","https://openalex.org/W2083131631"],"abstract_inverted_index":{"Test":[0,79],"data":[1,10,21,41,80],"compression":[2,22,125],"is":[3,47,82],"an":[4],"effective":[5],"methodology":[6],"for":[7],"reducing":[8],"test":[9,20,40],"volume":[11],"and":[12,54],"testing":[13],"time.":[14],"The":[15,28,100],"author":[16],"presents":[17],"a":[18,87],"new":[19],"technique":[23,29,120],"based":[24],"on":[25,31,84,111],"block":[26,53,69,94],"merging.":[27],"capitalises":[30],"the":[32,39,51,55,67,92,95,104,115,118],"fact":[33],"that":[34,90],"many":[35],"consecutive":[36],"blocks":[37,58],"of":[38,57,64,98,106,117],"can":[42,70],"be":[43,71],"merged":[44,52,68,93],"together.":[45],"Compression":[46],"achieved":[48],"by":[49,73],"storing":[50],"number":[56,97],"merged.":[59],"It":[60],"also":[61],"takes":[62],"advantage":[63,105],"cases":[65],"where":[66],"filled":[72],"all":[74,77],"0s":[75],"or":[76],"1s.":[78],"decompression":[81,101],"performed":[83],"chip":[85],"using":[86],"simple":[88],"circuitry":[89,102],"repeats":[91],"required":[96],"times.":[99],"has":[103],"being":[107],"test-data-independent.":[108],"Experimental":[109],"results":[110],"benchmark":[112],"circuits":[113],"demonstrate":[114],"effectiveness":[116],"proposed":[119],"compared":[121],"with":[122],"other":[123],"coding-based":[124],"techniques.":[126]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":4},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":9}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}