{"id":"https://openalex.org/W2013566079","doi":"https://doi.org/10.1049/iet-cdt:20060111","title":"Built-in time measurement circuits \u2013 a comparative design study","display_name":"Built-in time measurement circuits \u2013 a comparative design study","publication_year":2007,"publication_date":"2007-03-05","ids":{"openalex":"https://openalex.org/W2013566079","doi":"https://doi.org/10.1049/iet-cdt:20060111","mag":"2013566079"},"language":"en","primary_location":{"id":"doi:10.1049/iet-cdt:20060111","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cdt:20060111","pdf_url":null,"source":{"id":"https://openalex.org/S28293273","display_name":"IET Computers & Digital Techniques","issn_l":"1751-8601","issn":["1751-8601","1751-861X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Computers & Digital Techniques","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028402173","display_name":"M. Amir Abas","orcid":null},"institutions":[{"id":"https://openalex.org/I84884186","display_name":"Newcastle University","ror":"https://ror.org/01kj2bm70","country_code":"GB","type":"education","lineage":["https://openalex.org/I84884186"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"M.A. Abas","raw_affiliation_strings":["School of Electrical, Electronic and Computer Eng., University of Newcastle upon Tyne, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical, Electronic and Computer Eng., University of Newcastle upon Tyne, UK","institution_ids":["https://openalex.org/I84884186"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108352360","display_name":"G. Russell","orcid":null},"institutions":[{"id":"https://openalex.org/I84884186","display_name":"Newcastle University","ror":"https://ror.org/01kj2bm70","country_code":"GB","type":"education","lineage":["https://openalex.org/I84884186"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"G. Russell","raw_affiliation_strings":["School of Electrical, Electronic and Computer Eng., University of Newcastle upon Tyne, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical, Electronic and Computer Eng., University of Newcastle upon Tyne, UK","institution_ids":["https://openalex.org/I84884186"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109215825","display_name":"D.J. Kinniment","orcid":null},"institutions":[{"id":"https://openalex.org/I84884186","display_name":"Newcastle University","ror":"https://ror.org/01kj2bm70","country_code":"GB","type":"education","lineage":["https://openalex.org/I84884186"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"D.J. Kinniment","raw_affiliation_strings":["School of Electrical, Electronic and Computer Eng., University of Newcastle upon Tyne, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical, Electronic and Computer Eng., University of Newcastle upon Tyne, UK","institution_ids":["https://openalex.org/I84884186"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I84884186"],"apc_list":{"value":2200,"currency":"USD","value_usd":2200},"apc_paid":null,"fwci":2.0149,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.8821011,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"1","issue":"2","first_page":"87","last_page":"97"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.595756471157074},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.581110417842865},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5403452515602112},{"id":"https://openalex.org/keywords/utc-offset","display_name":"UTC offset","score":0.5075405836105347},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.4919247627258301},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32469820976257324},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32200029492378235},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21865129470825195}],"concepts":[{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.595756471157074},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.581110417842865},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5403452515602112},{"id":"https://openalex.org/C185588997","wikidata":"https://www.wikidata.org/wiki/Q187110","display_name":"UTC offset","level":3,"score":0.5075405836105347},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.4919247627258301},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32469820976257324},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32200029492378235},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21865129470825195},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/iet-cdt:20060111","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cdt:20060111","pdf_url":null,"source":{"id":"https://openalex.org/S28293273","display_name":"IET Computers & Digital Techniques","issn_l":"1751-8601","issn":["1751-8601","1751-861X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Computers & Digital Techniques","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5600000023841858}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2002519749","https://openalex.org/W2026037646","https://openalex.org/W2128282260","https://openalex.org/W2298485616","https://openalex.org/W2487142227"],"related_works":["https://openalex.org/W2770593030","https://openalex.org/W4281727072","https://openalex.org/W2560201613","https://openalex.org/W3154990682","https://openalex.org/W2171975302","https://openalex.org/W2022352247","https://openalex.org/W1532073221","https://openalex.org/W2377538627","https://openalex.org/W4241196849","https://openalex.org/W2471318020"],"abstract_inverted_index":{"An":[0],"increasingly":[1],"important":[2],"issue":[3,71],"in":[4,81,178,184],"the":[5,18,23,47,50,58,77,82,86,91,159,165,169,185],"implementation":[6],"of":[7,26,49,60,72,100,136,144,158,168],"high-performance":[8],"circuits":[9,171],"using":[10],"either":[11],"System-on-Chip":[12],"or":[13,28],"System-in-Package":[14],"technology":[15],"is":[16,88,96,164],"ensuring":[17],"correct":[19],"timing":[20,146],"performance":[21],"at":[22],"input/output":[24],"interfaces":[25,31],"cores":[27],"chips.":[29],"These":[30],"are":[32,129],"not":[33],"accessible":[34,46],"to":[35,52,84,149],"conventional":[36],"Automatic":[37],"Test":[38],"Equipment":[39],"(ATE).":[40],"However,":[41],"had":[42],"these":[43],"nodes":[44],"been":[45,176,191],"limitations":[48],"ATE":[51,83],"make":[53],"accurate":[54],"measurements":[55,87],"would":[56],"necessitate":[57],"use":[59],"tight":[61],"guard":[62],"bands":[63],"adversely":[64],"impacting":[65],"upon":[66],"yield.":[67],"To":[68],"address":[69],"this":[70,173],"internal":[73],"time":[74,102,181],"parameter":[75],"measurement,":[76],"circuitry":[78],"normally":[79],"resident":[80],"perform":[85],"incorporated":[89,177],"into":[90],"design":[92,137],"itself.":[93],"This":[94],"paper":[95],"a":[97,134,179],"case":[98],"study":[99],"three":[101,170],"measurement":[103,182],"techniques":[104,128],"potentially":[105],"suitable":[106],"for":[107,133],"circuit":[108],"integration,":[109],"namely,":[110],"Time":[111,117,121],"Difference":[112],"Measurement":[113,118,124],"(TDM),":[114],"Successive":[115],"Approximation":[116],"(SATM)":[119],"and":[120,131,152,188],"Delay":[122],"Interpolation":[123],"(TDIM)":[125],"methods.":[126],"The":[127,156],"analysed":[130],"compared":[132],"number":[135],"parameters":[138],"such":[139],"as":[140],"area":[141],"overhead,":[142],"ease":[143],"calibration,":[145],"resolution,":[147],"robustness":[148],"processing,":[150],"temperature":[151],"supply":[153],"voltage":[154],"variations.":[155],"results":[157],"analysis":[160],"indicate":[161],"that":[162],"TDIM":[163],"most":[166],"efficient":[167],"analysed;":[172],"method":[174],"has":[175,189],"high-resolution":[180],"system":[183],"sub-picosecond":[186],"range":[187],"subsequently":[190],"fabricated":[192],"by":[193],"Sun":[194],"Microsystems.":[195]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":3}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}