{"id":"https://openalex.org/W2093604576","doi":"https://doi.org/10.1049/iet-cdt:20050133","title":"Low overhead DFT using CDFG by modifying controller","display_name":"Low overhead DFT using CDFG by modifying controller","publication_year":2007,"publication_date":"2007-07-02","ids":{"openalex":"https://openalex.org/W2093604576","doi":"https://doi.org/10.1049/iet-cdt:20050133","mag":"2093604576"},"language":"en","primary_location":{"id":"doi:10.1049/iet-cdt:20050133","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cdt:20050133","pdf_url":null,"source":{"id":"https://openalex.org/S28293273","display_name":"IET Computers & Digital Techniques","issn_l":"1751-8601","issn":["1751-8601","1751-861X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Computers &amp; Digital Techniques","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://infoscience.epfl.ch/record/138614","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000075032","display_name":"Mohammad Hosseinabady","orcid":"https://orcid.org/0000-0003-3989-4999"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"M. Hosseinabady","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Tehran, Tehran, 14399, Iran","University of Tehran, Tehran,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Tehran, Tehran, 14399, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"University of Tehran, Tehran,","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032350195","display_name":"Pejman Lotfi-Kamran","orcid":"https://orcid.org/0000-0003-3293-8274"},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"P. Lotfi-Kamran","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Tehran, Tehran, 14399, Iran","University of Tehran, Tehran,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Tehran, Tehran, 14399, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"University of Tehran, Tehran,","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001979328","display_name":"Fabrizio Lombardi","orcid":"https://orcid.org/0000-0003-3152-3245"},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. Lombardi","raw_affiliation_strings":["ECE Department, Northeastern University, Boston, MA 02115, USA","Northeastern University, Boston, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, Northeastern University, Boston, MA 02115, USA","institution_ids":["https://openalex.org/I12912129"]},{"raw_affiliation_string":"Northeastern University, Boston, United States","institution_ids":["https://openalex.org/I12912129"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111436337","display_name":"Z. Navabi","orcid":null},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Z. Navabi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Tehran, Tehran, 14399, Iran","University of Tehran, Tehran, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Tehran, Tehran, 14399, Iran","institution_ids":["https://openalex.org/I23946033"]},{"raw_affiliation_string":"University of Tehran, Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2210,"currency":"USD","value_usd":2210},"apc_paid":null,"fwci":0.5027,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.77335033,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"1","issue":"4","first_page":"322","last_page":"333"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/controllability","display_name":"Controllability","score":0.7235165238380432},{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.6798011660575867},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6127347350120544},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5720329880714417},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.53721684217453},{"id":"https://openalex.org/keywords/register-transfer-level","display_name":"Register-transfer level","score":0.4847511947154999},{"id":"https://openalex.org/keywords/controller","display_name":"Controller (irrigation)","score":0.47836536169052124},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.4630020260810852},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.44555002450942993},{"id":"https://openalex.org/keywords/high-level-synthesis","display_name":"High-level synthesis","score":0.44528478384017944},{"id":"https://openalex.org/keywords/data-flow-diagram","display_name":"Data flow diagram","score":0.4157828092575073},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4030587375164032},{"id":"https://openalex.org/keywords/logic-synthesis","display_name":"Logic synthesis","score":0.3678673207759857},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.35178500413894653},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.32981932163238525},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2682338356971741},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20613622665405273},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.16748645901679993},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.15854281187057495},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12478899955749512}],"concepts":[{"id":"https://openalex.org/C48209547","wikidata":"https://www.wikidata.org/wiki/Q1331104","display_name":"Controllability","level":2,"score":0.7235165238380432},{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.6798011660575867},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6127347350120544},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5720329880714417},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.53721684217453},{"id":"https://openalex.org/C34854456","wikidata":"https://www.wikidata.org/wiki/Q1484552","display_name":"Register-transfer level","level":4,"score":0.4847511947154999},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.47836536169052124},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.4630020260810852},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.44555002450942993},{"id":"https://openalex.org/C58013763","wikidata":"https://www.wikidata.org/wiki/Q5754574","display_name":"High-level synthesis","level":3,"score":0.44528478384017944},{"id":"https://openalex.org/C489000","wikidata":"https://www.wikidata.org/wiki/Q747385","display_name":"Data flow diagram","level":2,"score":0.4157828092575073},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4030587375164032},{"id":"https://openalex.org/C157922185","wikidata":"https://www.wikidata.org/wiki/Q173198","display_name":"Logic synthesis","level":3,"score":0.3678673207759857},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.35178500413894653},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.32981932163238525},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2682338356971741},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20613622665405273},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.16748645901679993},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.15854281187057495},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12478899955749512},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C6557445","wikidata":"https://www.wikidata.org/wiki/Q173113","display_name":"Agronomy","level":1,"score":0.0},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1049/iet-cdt:20050133","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cdt:20050133","pdf_url":null,"source":{"id":"https://openalex.org/S28293273","display_name":"IET Computers & Digital Techniques","issn_l":"1751-8601","issn":["1751-8601","1751-861X"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Computers &amp; Digital Techniques","raw_type":"journal-article"},{"id":"pmh:oai:infoscience.epfl.ch:138614","is_oa":true,"landing_page_url":"http://infoscience.epfl.ch/record/138614","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I5124864","host_organization_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","host_organization_lineage":["https://openalex.org/I5124864"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:infoscience.epfl.ch:138614","is_oa":true,"landing_page_url":"http://infoscience.epfl.ch/record/138614","pdf_url":null,"source":{"id":"https://openalex.org/S4306400487","display_name":"Infoscience (Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I5124864","host_organization_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","host_organization_lineage":["https://openalex.org/I5124864"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Text"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1534609007","https://openalex.org/W1574480256","https://openalex.org/W1837475237","https://openalex.org/W1899662483","https://openalex.org/W1997565760","https://openalex.org/W2100139728","https://openalex.org/W2105036235","https://openalex.org/W2112283885","https://openalex.org/W2116254096","https://openalex.org/W2122185103","https://openalex.org/W2129183345","https://openalex.org/W2130024882","https://openalex.org/W2130838564","https://openalex.org/W2132703166","https://openalex.org/W2133745968","https://openalex.org/W2135624719","https://openalex.org/W2135931142","https://openalex.org/W2147910207","https://openalex.org/W2149145027","https://openalex.org/W2160906748","https://openalex.org/W2166252816","https://openalex.org/W2587271961","https://openalex.org/W4230587734"],"related_works":["https://openalex.org/W2157191248","https://openalex.org/W2107525390","https://openalex.org/W2150046587","https://openalex.org/W2164493372","https://openalex.org/W2153086993","https://openalex.org/W2114980936","https://openalex.org/W2102550588","https://openalex.org/W4233770127","https://openalex.org/W2126762048","https://openalex.org/W1909440778"],"abstract_inverted_index":{"A":[0],"novel":[1],"design-for-test":[2],"(DFT)":[3],"method":[4,79,97,112],"that":[5],"requires":[6],"minor":[7],"modifications":[8],"to":[9,55,60,100],"the":[10,13,36,43,71,82,92,108],"controller":[11,72],"in":[12,91],"register-transfer":[14],"level":[15],"(RTL)":[16],"description":[17],"of":[18,28,38,110],"a":[19,47],"circuit":[20,31],"is":[21,32,98],"presented.":[22],"The":[23,95,105],"control/data":[24],"flow":[25],"graph":[26],"representation":[27],"an":[29],"RTL":[30,40,44,61,103],"used":[33],"for":[34],"analysing":[35],"testability":[37],"individual":[39],"operations":[41],"within":[42],"circuit.":[45],"Using":[46],"non-scan":[48],"arrangement,":[49],"existing":[50],"data":[51,65],"paths":[52,66],"are":[53,67],"utilised":[54],"provide":[56],"controllability":[57],"and":[58,102],"observability":[59],"operations.":[62],"Furthermore,":[63],"additional":[64],"introduced":[68],"by":[69,86],"altering":[70],"states":[73,90],"or":[74],"adding":[75],"new":[76],"transitions.":[77],"This":[78],"considerably":[80],"reduces":[81],"test":[83,93],"application":[84],"time":[85],"ignoring":[87],"unnecessary":[88],"control":[89],"process.":[94],"proposed":[96],"applied":[99],"behavioural":[101],"benchmarks.":[104],"results":[106],"show":[107],"effectiveness":[109],"this":[111],"when":[113],"compared":[114],"with":[115],"some":[116],"other":[117],"DFT":[118],"insertion":[119],"methods.":[120]},"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}
