{"id":"https://openalex.org/W2080000601","doi":"https://doi.org/10.1049/iet-cds:20070185","title":"Parameter reduction for variability analysis by slice inverse regression method","display_name":"Parameter reduction for variability analysis by slice inverse regression method","publication_year":2008,"publication_date":"2008-02-14","ids":{"openalex":"https://openalex.org/W2080000601","doi":"https://doi.org/10.1049/iet-cds:20070185","mag":"2080000601"},"language":"en","primary_location":{"id":"doi:10.1049/iet-cds:20070185","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cds:20070185","pdf_url":null,"source":{"id":"https://openalex.org/S4210208150","display_name":"IET Circuits Devices & Systems","issn_l":"1751-858X","issn":["1751-858X","1751-8598"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Circuits, Devices & Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111833542","display_name":"Alexander Mitev","orcid":null},"institutions":[{"id":"https://openalex.org/I138006243","display_name":"University of Arizona","ror":"https://ror.org/03m2x1q45","country_code":"US","type":"education","lineage":["https://openalex.org/I138006243"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"A. Mitev","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Arizona at Tucson, 1230 E. Speedway Blvd, Tucson, AZ 85721, USA","University of Arizona"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Arizona at Tucson, 1230 E. Speedway Blvd, Tucson, AZ 85721, USA","institution_ids":["https://openalex.org/I138006243"]},{"raw_affiliation_string":"University of Arizona","institution_ids":["https://openalex.org/I138006243"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112569842","display_name":"M. Marefat","orcid":null},"institutions":[{"id":"https://openalex.org/I138006243","display_name":"University of Arizona","ror":"https://ror.org/03m2x1q45","country_code":"US","type":"education","lineage":["https://openalex.org/I138006243"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Marefat","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Arizona at Tucson, 1230 E. Speedway Blvd, Tucson, AZ 85721, USA","Dept. of Electr. & Comput. Eng., Univ. of Arizona at Tucson, Tucson, AZ"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Arizona at Tucson, 1230 E. Speedway Blvd, Tucson, AZ 85721, USA","institution_ids":["https://openalex.org/I138006243"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Univ. of Arizona at Tucson, Tucson, AZ","institution_ids":["https://openalex.org/I138006243"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073836103","display_name":"Dongsheng Ma","orcid":"https://orcid.org/0009-0002-3918-9632"},"institutions":[{"id":"https://openalex.org/I138006243","display_name":"University of Arizona","ror":"https://ror.org/03m2x1q45","country_code":"US","type":"education","lineage":["https://openalex.org/I138006243"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. Ma","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Arizona at Tucson, 1230 E. Speedway Blvd, Tucson, AZ 85721, USA","University of Arizona"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Arizona at Tucson, 1230 E. Speedway Blvd, Tucson, AZ 85721, USA","institution_ids":["https://openalex.org/I138006243"]},{"raw_affiliation_string":"University of Arizona","institution_ids":["https://openalex.org/I138006243"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071181702","display_name":"J.M. Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I138006243","display_name":"University of Arizona","ror":"https://ror.org/03m2x1q45","country_code":"US","type":"education","lineage":["https://openalex.org/I138006243"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.M. Wang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Arizona at Tucson, 1230 E. Speedway Blvd, Tucson, AZ 85721, USA","Dept. of Electr. & Comput. Eng., Univ. of Arizona at Tucson, Tucson, AZ"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Arizona at Tucson, 1230 E. Speedway Blvd, Tucson, AZ 85721, USA","institution_ids":["https://openalex.org/I138006243"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Univ. of Arizona at Tucson, Tucson, AZ","institution_ids":["https://openalex.org/I138006243"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5111833542"],"corresponding_institution_ids":["https://openalex.org/I138006243"],"apc_list":{"value":2000,"currency":"EUR","value_usd":2200},"apc_paid":null,"fwci":0.8482,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.7855912,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"2","issue":"1","first_page":"16","last_page":"22"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11798","display_name":"Optimal Experimental Design Methods","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11798","display_name":"Optimal Experimental Design Methods","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11236","display_name":"Control Systems and Identification","score":0.9818000197410583,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.975600004196167,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6589710712432861},{"id":"https://openalex.org/keywords/transformation","display_name":"Transformation (genetics)","score":0.5932795405387878},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5651438236236572},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5450085401535034},{"id":"https://openalex.org/keywords/design-of-experiments","display_name":"Design of experiments","score":0.5156468152999878},{"id":"https://openalex.org/keywords/inverse","display_name":"Inverse","score":0.495140939950943},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4907897412776947},{"id":"https://openalex.org/keywords/semiconductor-device-fabrication","display_name":"Semiconductor device fabrication","score":0.4843696057796478},{"id":"https://openalex.org/keywords/subspace-topology","display_name":"Subspace topology","score":0.47984811663627625},{"id":"https://openalex.org/keywords/matrix","display_name":"Matrix (chemical analysis)","score":0.47277048230171204},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4709133803844452},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4650370478630066},{"id":"https://openalex.org/keywords/dimensionality-reduction","display_name":"Dimensionality reduction","score":0.4401858150959015},{"id":"https://openalex.org/keywords/design-matrix","display_name":"Design matrix","score":0.43845105171203613},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.43055182695388794},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.42605525255203247},{"id":"https://openalex.org/keywords/regression-analysis","display_name":"Regression analysis","score":0.3634703457355499},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3257094621658325},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.29536309838294983},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.28555792570114136},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21540731191635132},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.1495336890220642},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.14789927005767822},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.11164501309394836}],"concepts":[{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6589710712432861},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.5932795405387878},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5651438236236572},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5450085401535034},{"id":"https://openalex.org/C34559072","wikidata":"https://www.wikidata.org/wiki/Q2334061","display_name":"Design of experiments","level":2,"score":0.5156468152999878},{"id":"https://openalex.org/C207467116","wikidata":"https://www.wikidata.org/wiki/Q4385666","display_name":"Inverse","level":2,"score":0.495140939950943},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4907897412776947},{"id":"https://openalex.org/C66018809","wikidata":"https://www.wikidata.org/wiki/Q1570432","display_name":"Semiconductor device fabrication","level":3,"score":0.4843696057796478},{"id":"https://openalex.org/C32834561","wikidata":"https://www.wikidata.org/wiki/Q660730","display_name":"Subspace topology","level":2,"score":0.47984811663627625},{"id":"https://openalex.org/C106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","level":2,"score":0.47277048230171204},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4709133803844452},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4650370478630066},{"id":"https://openalex.org/C70518039","wikidata":"https://www.wikidata.org/wiki/Q16000077","display_name":"Dimensionality reduction","level":2,"score":0.4401858150959015},{"id":"https://openalex.org/C203233044","wikidata":"https://www.wikidata.org/wiki/Q5264358","display_name":"Design matrix","level":3,"score":0.43845105171203613},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.43055182695388794},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.42605525255203247},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.3634703457355499},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3257094621658325},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.29536309838294983},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.28555792570114136},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21540731191635132},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.1495336890220642},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.14789927005767822},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.11164501309394836},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/iet-cds:20070185","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cds:20070185","pdf_url":null,"source":{"id":"https://openalex.org/S4210208150","display_name":"IET Circuits Devices & Systems","issn_l":"1751-858X","issn":["1751-858X","1751-8598"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Circuits, Devices & Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2024307779","https://openalex.org/W2068752849","https://openalex.org/W2091794125","https://openalex.org/W2091886411","https://openalex.org/W2163490846"],"related_works":["https://openalex.org/W3176621072","https://openalex.org/W2995475466","https://openalex.org/W2356785732","https://openalex.org/W1984922722","https://openalex.org/W2918335920","https://openalex.org/W2050900474","https://openalex.org/W1978270849","https://openalex.org/W4240922321","https://openalex.org/W3146866674","https://openalex.org/W2065212864"],"abstract_inverted_index":{"With":[0,117],"semiconductor":[1],"fabrication":[2],"technologies":[3],"that":[4,158],"have":[5],"scaled":[6],"below":[7],"100":[8],"nm,":[9],"the":[10,28,37,41,72,88,109,114,118,122,126,143,148,161],"design\u2013manufacturing":[11],"interface":[12],"becomes":[13],"more":[14,16],"and":[15,52,55,64,80,102,111],"complicated.":[17],"The":[18,94],"resultant":[19],"process":[20,78],"variability":[21,138],"causes":[22],"a":[23,57,104,131],"number":[24,43,149],"of":[25,36,44,70,113,134,147,150],"issues":[26],"in":[27,60],"new":[29,68,95,162],"generation":[30],"integrated":[31],"circuit":[32,90],"(IC)":[33],"design.":[34],"One":[35],"biggest":[38],"challenges":[39],"is":[40,92,140,152],"enormous":[42],"process-variation-related":[45],"parameters.":[46],"These":[47],"parameters":[48,79],"represent":[49],"numerous":[50],"local":[51],"global":[53],"variations":[54,74,129,151],"pose":[56],"heavy":[58],"burden":[59],"today's":[61],"chip":[62],"verification":[63],"design":[65,81],"processes.":[66],"A":[67],"way":[69],"reducing":[71],"statistical":[73,128],"(which":[75],"include":[76],"both":[77],"variables)":[82],"according":[83],"to":[84,130],"their":[85],"impacts":[86],"on":[87,171],"overall":[89],"performance":[91],"proposed.":[93],"approach":[96],"creates":[97],"an":[98],"effective":[99],"reduction":[100,166],"subspace":[101],"provides":[103],"transformation":[105,120],"matrix":[106],"by":[107,159],"using":[108,160],"mean":[110],"variance":[112],"response":[115],"surface.":[116],"generated":[119],"matrix,":[121],"proposed":[123],"method":[124],"maps":[125],"original":[127],"smaller":[132],"set":[133],"variables":[135],"with":[136,167],"which":[137],"analysis":[139],"processed.":[141],"Thus,":[142],"computational":[144],"cost":[145],"because":[146],"greatly":[153],"reduced.":[154],"Experimental":[155],"results":[156],"show":[157],"method,":[163],"20%\u201350%":[164],"parameter":[165],"only":[168],"<5%":[169],"error":[170],"average":[172],"can":[173],"be":[174],"achieved.":[175]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}