{"id":"https://openalex.org/W1993866038","doi":"https://doi.org/10.1049/iet-cds:20070119","title":"Aliasing-free compaction revisited","display_name":"Aliasing-free compaction revisited","publication_year":2008,"publication_date":"2008-02-14","ids":{"openalex":"https://openalex.org/W1993866038","doi":"https://doi.org/10.1049/iet-cds:20070119","mag":"1993866038"},"language":"en","primary_location":{"id":"doi:10.1049/iet-cds:20070119","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cds:20070119","pdf_url":null,"source":{"id":"https://openalex.org/S4210208150","display_name":"IET Circuits Devices & Systems","issn_l":"1751-858X","issn":["1751-858X","1751-8598"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Circuits, Devices & Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076333457","display_name":"Sunil R. Das","orcid":"https://orcid.org/0000-0002-7988-1298"},"institutions":[{"id":"https://openalex.org/I153718931","display_name":"University of Ottawa","ror":"https://ror.org/03c4mmv16","country_code":"CA","type":"education","lineage":["https://openalex.org/I153718931"]},{"id":"https://openalex.org/I9374425","display_name":"Ottawa University","ror":"https://ror.org/04jscf286","country_code":"US","type":"education","lineage":["https://openalex.org/I9374425"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"S.R. Das","raw_affiliation_strings":["School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, Ontario K1N 6N5, Canada","Sch. of Inf. Technol. & Eng., Ottawa Univ., Ottawa, ON"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, Ontario K1N 6N5, Canada","institution_ids":["https://openalex.org/I153718931"]},{"raw_affiliation_string":"Sch. of Inf. Technol. & Eng., Ottawa Univ., Ottawa, ON","institution_ids":["https://openalex.org/I9374425"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108595207","display_name":"Altaf Hossain","orcid":null},"institutions":[{"id":"https://openalex.org/I153718931","display_name":"University of Ottawa","ror":"https://ror.org/03c4mmv16","country_code":"CA","type":"education","lineage":["https://openalex.org/I153718931"]},{"id":"https://openalex.org/I9374425","display_name":"Ottawa University","ror":"https://ror.org/04jscf286","country_code":"US","type":"education","lineage":["https://openalex.org/I9374425"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"A. Hossain","raw_affiliation_strings":["School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, Ontario K1N 6N5, Canada","Sch. of Inf. Technol. & Eng., Ottawa Univ., Ottawa, ON"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, Ontario K1N 6N5, Canada","institution_ids":["https://openalex.org/I153718931"]},{"raw_affiliation_string":"Sch. of Inf. Technol. & Eng., Ottawa Univ., Ottawa, ON","institution_ids":["https://openalex.org/I9374425"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109483458","display_name":"Satyendra N. Biswas","orcid":null},"institutions":[{"id":"https://openalex.org/I39815113","display_name":"Georgia Southern University","ror":"https://ror.org/04agmb972","country_code":"US","type":"education","lineage":["https://openalex.org/I39815113"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Biswas","raw_affiliation_strings":["Department of Electrical Engineering Technology, Georgia Southern University, Statesboro, GA 30460, USA","Georgia Southern University, Statesboro, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering Technology, Georgia Southern University, Statesboro, GA 30460, USA","institution_ids":["https://openalex.org/I39815113"]},{"raw_affiliation_string":"Georgia Southern University, Statesboro, United States","institution_ids":["https://openalex.org/I39815113"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023904661","display_name":"Emil M. Petriu","orcid":"https://orcid.org/0000-0002-0274-1035"},"institutions":[{"id":"https://openalex.org/I153718931","display_name":"University of Ottawa","ror":"https://ror.org/03c4mmv16","country_code":"CA","type":"education","lineage":["https://openalex.org/I153718931"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"E.M. Petriu","raw_affiliation_strings":["School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, Ontario K1N 6N5, Canada","University of Ottawa, Ottawa, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Technology and Engineering, Faculty of Engineering, University of Ottawa, Ottawa, Ontario K1N 6N5, Canada","institution_ids":["https://openalex.org/I153718931"]},{"raw_affiliation_string":"University of Ottawa, Ottawa, Canada","institution_ids":["https://openalex.org/I153718931"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2000,"currency":"EUR","value_usd":2200},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05545063,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2","issue":"1","first_page":"166","last_page":"178"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/aliasing","display_name":"Aliasing","score":0.6458042860031128},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5983981490135193},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4977891445159912},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.46643638610839844},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.45750004053115845},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.43435025215148926},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.37612733244895935},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.34036678075790405},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.12288948893547058},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11252176761627197}],"concepts":[{"id":"https://openalex.org/C4069607","wikidata":"https://www.wikidata.org/wiki/Q868732","display_name":"Aliasing","level":3,"score":0.6458042860031128},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5983981490135193},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4977891445159912},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.46643638610839844},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.45750004053115845},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.43435025215148926},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.37612733244895935},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.34036678075790405},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.12288948893547058},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11252176761627197},{"id":"https://openalex.org/C136536468","wikidata":"https://www.wikidata.org/wiki/Q1225894","display_name":"Undersampling","level":2,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/iet-cds:20070119","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cds:20070119","pdf_url":null,"source":{"id":"https://openalex.org/S4210208150","display_name":"IET Circuits Devices & Systems","issn_l":"1751-858X","issn":["1751-858X","1751-8598"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Circuits, Devices & Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.4099999964237213}],"awards":[],"funders":[{"id":"https://openalex.org/F4320334593","display_name":"Natural Sciences and Engineering Research Council of Canada","ror":"https://ror.org/01h531d29"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":58,"referenced_works":["https://openalex.org/W91884329","https://openalex.org/W100035992","https://openalex.org/W308651918","https://openalex.org/W1502477161","https://openalex.org/W1541983701","https://openalex.org/W1547126889","https://openalex.org/W1593809099","https://openalex.org/W1601643892","https://openalex.org/W1823755974","https://openalex.org/W1950209922","https://openalex.org/W1967620093","https://openalex.org/W1967664042","https://openalex.org/W1971806064","https://openalex.org/W1982848136","https://openalex.org/W1984082405","https://openalex.org/W1988380797","https://openalex.org/W1997593029","https://openalex.org/W2000140246","https://openalex.org/W2011039300","https://openalex.org/W2038380992","https://openalex.org/W2051398574","https://openalex.org/W2067328529","https://openalex.org/W2069666139","https://openalex.org/W2074357681","https://openalex.org/W2082758488","https://openalex.org/W2088391469","https://openalex.org/W2095947186","https://openalex.org/W2098516903","https://openalex.org/W2102735893","https://openalex.org/W2103690360","https://openalex.org/W2107995582","https://openalex.org/W2109328323","https://openalex.org/W2109678242","https://openalex.org/W2116007667","https://openalex.org/W2120612135","https://openalex.org/W2130022711","https://openalex.org/W2130828593","https://openalex.org/W2135321691","https://openalex.org/W2139009001","https://openalex.org/W2142682203","https://openalex.org/W2146931154","https://openalex.org/W2147367480","https://openalex.org/W2149581564","https://openalex.org/W2155507393","https://openalex.org/W2161191982","https://openalex.org/W2163601061","https://openalex.org/W2165132030","https://openalex.org/W2172198098","https://openalex.org/W2266625984","https://openalex.org/W2587271961","https://openalex.org/W2983111368","https://openalex.org/W2986436079","https://openalex.org/W2988216865","https://openalex.org/W4285719527","https://openalex.org/W4301205042","https://openalex.org/W6630208181","https://openalex.org/W6659847936","https://openalex.org/W6944535943"],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W2745001401","https://openalex.org/W4321353415","https://openalex.org/W2130974462","https://openalex.org/W972276598","https://openalex.org/W4246352526","https://openalex.org/W2048582679","https://openalex.org/W2782226720","https://openalex.org/W3155846967","https://openalex.org/W3114476551"],"abstract_inverted_index":{"The":[0,38,98],"design":[1,30],"of":[2,10,16,29,44,68,73,105,110,114,116],"space-efficient":[3],"support":[4],"hardware":[5,51],"for":[6,58,108,121],"built-in":[7],"self-testing":[8],"is":[9],"immense":[11],"significance":[12],"in":[13,26,52,62,95,126],"the":[14,27,41,65,102,117,127],"synthesis":[15],"present":[17,101],"day":[18],"very":[19],"large-scale":[20],"integration":[21],"circuits":[22],"and":[23,72,138,150],"systems,":[24],"particularly":[25],"context":[28],"paradigm":[31],"shift":[32],"from":[33],"system-on-board":[34],"to":[35,54,76],"system-on-chip":[36],"(SOC).":[37],"authors":[39,99],"revisit":[40],"general":[42],"problem":[43],"designing":[45],"zero-aliasing":[46],"(or":[47],"aliasing-free)":[48],"space":[49],"compression":[50],"relation":[53,75],"embedded":[55],"cores-based":[56],"SOC":[57],"single":[59],"stuck-line":[60],"faults":[61],"particular,":[63],"extending":[64],"well-known":[66],"concepts":[67],"conventional":[69],"switching":[70],"theory":[71,83],"incompatibility":[74],"generate":[77],"maximal":[78],"compatibility":[79],"classes":[80],"utilising":[81],"graph":[82],"concepts,":[84],"based":[85],"on":[86,134],"optimal":[87,112],"generalised":[88],"sequence":[89],"mergeability,":[90],"as":[91],"developed":[92],"by":[93],"them":[94],"earlier":[96],"works.":[97],"briefly":[100],"mathematical":[103],"basis":[104],"selection":[106],"criteria":[107],"merger":[109],"an":[111],"number":[113],"outputs":[115],"module":[118],"under":[119],"test":[120],"realising":[122],"maximum":[123],"compaction":[124],"ratio":[125],"design,":[128],"along":[129],"with":[130,145],"extensive":[131],"simulation":[132,146],"results":[133],"ISCAS":[135,139],"85":[136],"combinational":[137],"89":[140],"full-scan":[141],"sequential":[142],"benchmark":[143],"circuits,":[144],"programs":[147],"ATALANTA,":[148],"FSIM":[149],"COMPACTEST.":[151]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}