{"id":"https://openalex.org/W2088685840","doi":"https://doi.org/10.1049/iet-cds:20060318","title":"Statistical static timing analysis using symbolic event propagation","display_name":"Statistical static timing analysis using symbolic event propagation","publication_year":2007,"publication_date":"2007-08-16","ids":{"openalex":"https://openalex.org/W2088685840","doi":"https://doi.org/10.1049/iet-cds:20060318","mag":"2088685840"},"language":"en","primary_location":{"id":"doi:10.1049/iet-cds:20060318","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cds:20060318","pdf_url":null,"source":{"id":"https://openalex.org/S4210208150","display_name":"IET Circuits Devices & Systems","issn_l":"1751-858X","issn":["1751-858X","1751-8598"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Circuits, Devices & Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101597016","display_name":"Arijit Mondal","orcid":"https://orcid.org/0000-0002-9716-4356"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"A. Mondal","raw_affiliation_strings":["Deptartment of Computer Science and Engineering, Indian Institute of Technology, Kharagpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Deptartment of Computer Science and Engineering, Indian Institute of Technology, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013205698","display_name":"P. P. Chakrabarti","orcid":"https://orcid.org/0000-0002-3553-8834"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"P.P. Chakrabarti","raw_affiliation_strings":["Deptartment of Computer Science and Engineering, Indian Institute of Technology, Kharagpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Deptartment of Computer Science and Engineering, Indian Institute of Technology, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033329960","display_name":"Pallab Dasgupta","orcid":"https://orcid.org/0000-0002-2178-8154"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"P. Dasgupta","raw_affiliation_strings":["Deptartment of Computer Science and Engineering, Indian Institute of Technology, Kharagpur, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Deptartment of Computer Science and Engineering, Indian Institute of Technology, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2000,"currency":"EUR","value_usd":2200},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.13758621,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"1","issue":"4","first_page":"283","last_page":"291"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7016249895095825},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.6863883137702942},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6797318458557129},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6363215446472168},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5338334441184998},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.5021178722381592},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.4572969377040863},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.387908399105072},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.11063516139984131},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09129509329795837}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7016249895095825},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.6863883137702942},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6797318458557129},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6363215446472168},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5338334441184998},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.5021178722381592},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.4572969377040863},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.387908399105072},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.11063516139984131},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09129509329795837},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/iet-cds:20060318","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cds:20060318","pdf_url":null,"source":{"id":"https://openalex.org/S4210208150","display_name":"IET Circuits Devices & Systems","issn_l":"1751-858X","issn":["1751-858X","1751-8598"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Circuits, Devices & Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1952931758","https://openalex.org/W1964078389","https://openalex.org/W2007078120","https://openalex.org/W2034948999","https://openalex.org/W2047518460","https://openalex.org/W2058767802","https://openalex.org/W2079771879","https://openalex.org/W2103323734","https://openalex.org/W2126827022","https://openalex.org/W2135694842","https://openalex.org/W2138086100","https://openalex.org/W2142599304","https://openalex.org/W2149342513","https://openalex.org/W2149447807","https://openalex.org/W2154769617","https://openalex.org/W2158750015","https://openalex.org/W2163262735","https://openalex.org/W4230035938"],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W2745001401","https://openalex.org/W4321353415","https://openalex.org/W2130974462","https://openalex.org/W972276598","https://openalex.org/W4246352526","https://openalex.org/W2028665553","https://openalex.org/W4230315250","https://openalex.org/W2086519370","https://openalex.org/W2087343574"],"abstract_inverted_index":{"Accurate":[0],"estimation":[1],"of":[2,53,57,73,108,116,120],"critical":[3],"path":[4],"delays":[5],"in":[6],"circuits":[7,22,72,126],"is":[8,29,64,91],"a":[9,48,105],"challenging":[10],"task,":[11],"particularly":[12],"when":[13],"variations":[14],"due":[15],"to":[16,71],"manufacturing":[17],"are":[18,41,127],"considered.":[19],"For":[20,34],"small":[21],"(such":[23],"as":[24],"standard":[25],"cells),":[26],"simulation-based":[27],"characterisation":[28],"preferred":[30],"for":[31],"better":[32],"accuracy.":[33],"large":[35],"circuits,":[36],"statistical":[37,99],"timing":[38,85,100],"analysis":[39,86,101,121],"techniques":[40],"used,":[42],"but":[43],"these":[44],"methods":[45],"typically":[46],"yield":[47],"pessimistic":[49],"overestimate.":[50],"In":[51],"view":[52],"the":[54,117,123],"growing":[55],"size":[56,75],"custom":[58],"cell":[59],"designs,":[60],"an":[61],"intermediate":[62],"approach":[63],"required":[65],"\u2013":[66],"one":[67],"that":[68,93],"can":[69,77],"scale":[70],"moderate":[74],"and":[76,102],"produce":[78],"more":[79],"accurate":[80],"estimates":[81],"than":[82],"traditional":[83],"static":[84],"methods.":[87],"A":[88],"new":[89,118],"method":[90],"presented":[92],"combines":[94],"symbolic":[95],"event":[96],"propagation":[97],"with":[98,110],"thereby":[103],"achieves":[104],"significant":[106],"level":[107],"accuracy":[109],"acceptable":[111],"computational":[112],"overhead.":[113],"The":[114],"benefits":[115],"style":[119],"over":[122],"ISCAS'89":[124],"benchmark":[125],"demonstrated.":[128]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}