{"id":"https://openalex.org/W2070746369","doi":"https://doi.org/10.1049/iet-cds:20050210","title":"Accurate and computer efficient modelling of single event transients in CMOS circuits","display_name":"Accurate and computer efficient modelling of single event transients in CMOS circuits","publication_year":2007,"publication_date":"2007-04-12","ids":{"openalex":"https://openalex.org/W2070746369","doi":"https://doi.org/10.1049/iet-cds:20050210","mag":"2070746369"},"language":"en","primary_location":{"id":"doi:10.1049/iet-cds:20050210","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cds:20050210","pdf_url":null,"source":{"id":"https://openalex.org/S4210208150","display_name":"IET Circuits Devices & Systems","issn_l":"1751-858X","issn":["1751-858X","1751-8598"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Circuits, Devices &amp; Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022015482","display_name":"Gilson Wirth","orcid":"https://orcid.org/0000-0002-4990-5113"},"institutions":[{"id":"https://openalex.org/I4210112140","display_name":"Universidade Estadual do Rio Grande do Sul","ror":"https://ror.org/01vxwy461","country_code":"BR","type":"education","lineage":["https://openalex.org/I4210112140"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"G.I. Wirth","raw_affiliation_strings":["Estrada de Santa Maria 2300, State University of Rio Grande do Sul - UERGS, Guaiba RS, 92500, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Estrada de Santa Maria 2300, State University of Rio Grande do Sul - UERGS, Guaiba RS, 92500, Brazil","institution_ids":["https://openalex.org/I4210112140"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111822468","display_name":"Michele G. Vieira","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112140","display_name":"Universidade Estadual do Rio Grande do Sul","ror":"https://ror.org/01vxwy461","country_code":"BR","type":"education","lineage":["https://openalex.org/I4210112140"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"M.G. Vieira","raw_affiliation_strings":["Estrada de Santa Maria 2300, State University of Rio Grande do Sul - UERGS, Guaiba RS, 92500, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Estrada de Santa Maria 2300, State University of Rio Grande do Sul - UERGS, Guaiba RS, 92500, Brazil","institution_ids":["https://openalex.org/I4210112140"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024813896","display_name":"Fernanda Lima Kastensmidt","orcid":"https://orcid.org/0000-0001-5767-8582"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"F.G. Lima Kastensmidt","raw_affiliation_strings":["Federal University of Rio Grande do Sul - UFRGS, Porto Alegre, RS, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal University of Rio Grande do Sul - UFRGS, Porto Alegre, RS, Brazil","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2200,"currency":"USD","value_usd":2200},"apc_paid":null,"fwci":3.5297,"has_fulltext":false,"cited_by_count":54,"citation_normalized_percentile":{"value":0.92112758,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"1","issue":"2","first_page":"137","last_page":"142"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5985612869262695},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.5751117467880249},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5728399157524109},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5608838796615601},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5312841534614563},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.48709845542907715},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4632706642150879},{"id":"https://openalex.org/keywords/discrete-circuit","display_name":"Discrete circuit","score":0.4475758373737335},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4293712079524994},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.4146694540977478},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.41182658076286316},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.33979278802871704},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29171353578567505},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2651948928833008},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18857964873313904}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5985612869262695},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.5751117467880249},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5728399157524109},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5608838796615601},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5312841534614563},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.48709845542907715},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4632706642150879},{"id":"https://openalex.org/C188058453","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Discrete circuit","level":4,"score":0.4475758373737335},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4293712079524994},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.4146694540977478},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.41182658076286316},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.33979278802871704},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29171353578567505},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2651948928833008},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18857964873313904},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1049/iet-cds:20050210","is_oa":false,"landing_page_url":"https://doi.org/10.1049/iet-cds:20050210","pdf_url":null,"source":{"id":"https://openalex.org/S4210208150","display_name":"IET Circuits Devices & Systems","issn_l":"1751-858X","issn":["1751-858X","1751-8598"],"is_oa":false,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Circuits, Devices &amp; Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1935014183","https://openalex.org/W2006097283","https://openalex.org/W2006645145","https://openalex.org/W2030501553","https://openalex.org/W2033346530","https://openalex.org/W2063837668","https://openalex.org/W2098274007","https://openalex.org/W2106771474","https://openalex.org/W2132280722","https://openalex.org/W2132387933","https://openalex.org/W2141068710","https://openalex.org/W2153130122","https://openalex.org/W2159087151","https://openalex.org/W3183763003","https://openalex.org/W6651977010"],"related_works":["https://openalex.org/W2015676400","https://openalex.org/W2903040555","https://openalex.org/W2129446522","https://openalex.org/W2018705424","https://openalex.org/W2488431532","https://openalex.org/W1972185800","https://openalex.org/W2053420533","https://openalex.org/W2017848804","https://openalex.org/W3216318046","https://openalex.org/W2181172762"],"abstract_inverted_index":{"A":[0],"new":[1],"analytical":[2,126],"modelling":[3],"approach":[4],"to":[5,38,101,145,155,178,197,207,223,242,249],"evaluate":[6],"the":[7,32,36,85,120,146,161,165,176,198,209],"impact":[8],"of":[9,24,80,98,119,138,149,164,167,211,246,257],"single":[10],"event":[11],"transients":[12],"(SETs)":[13],"on":[14,107],"CMOS":[15,173],"circuits":[16,49],"has":[17],"been":[18],"developed.":[19],"The":[20,44,57,78,95,124,151,182,232],"model":[21,83,158,183,233],"allows":[22,160],"evaluation":[23,245],"transient":[25],"pulse":[26],"amplitude":[27],"and":[28,65,76,116,131,142],"width":[29],"(duration)":[30],"at":[31,84],"logic":[33,86,147,169,200],"level,":[34],"without":[35,175],"need":[37,177],"run":[39,179],"circuit":[40,55,72,92,100,112,114,180,224,247],"level":[41,88,148],"(Spice-like)":[42],"simulations.":[43,181],"SET":[45,250],"mechanism":[46],"in":[47,171,214],"MOS":[48],"is":[50,59,63,129,154,220,234],"normally":[51],"investigated":[52],"by":[53],"Spice-like":[54],"simulation.":[56],"problem":[58],"that":[60,159],"electrical":[61,96,225],"simulation":[62],"time-consuming":[64],"must":[66],"be":[67],"performed":[68],"for":[69,236],"each":[70,212],"different":[71],"topology,":[73,113],"incident":[74],"particle":[75,104,140,189],"track.":[77],"availability":[79],"a":[81,99,157,172,188,192,215],"simple":[82],"gate":[87,170,201],"may":[89,195],"greatly":[90],"improve":[91],"sensitivity":[93,166,210,248],"analysis.":[94],"response":[97],"an":[102],"ionising":[103,139],"hit":[105,190],"depends":[106],"many":[108],"parameters,":[109],"such":[110],"as":[111,252,254],"geometry":[115],"waveform":[117],"shape":[118],"charge":[121],"injection":[122],"mechanism.":[123],"proposed":[125],"model,":[127],"which":[128,194],"accurate":[130],"computer":[132],"efficient,":[133],"captures":[134],"these":[135],"transistor-level":[136],"effects":[137],"hits":[141],"models":[143],"them":[144],"abstraction.":[150],"key":[152],"idea":[153],"exploit":[156],"rapid":[162],"determination":[163],"any":[168],"circuit,":[174],"predicts":[184],"whether":[185],"or":[186,202],"not":[187],"generates":[191],"SET,":[193],"propagate":[196],"next":[199],"memory":[203],"element,":[204],"making":[205],"possible":[206],"analyse":[208],"node":[213],"complex":[216],"circuit.":[217],"Model":[218],"derivation":[219],"strongly":[221],"related":[222],"behaviour,":[226],"being":[227],"consistent":[228],"with":[229],"technology":[230],"scaling.":[231],"suitable":[235],"integration":[237],"into":[238],"CAD":[239],"tools,":[240],"intending":[241],"make":[243],"automated":[244,255],"possible,":[251],"well":[253],"estimation":[256],"soft":[258],"error":[259],"rate.":[260]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":4}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}
