{"id":"https://openalex.org/W4413764743","doi":"https://doi.org/10.1049/cds2/1773323","title":"Adaptive Temperature\u2010Compensation of Charge\u2010Pump PLL\u2013Based MTJ/CMOS for Frequency Stability","display_name":"Adaptive Temperature\u2010Compensation of Charge\u2010Pump PLL\u2013Based MTJ/CMOS for Frequency Stability","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4413764743","doi":"https://doi.org/10.1049/cds2/1773323"},"language":"en","primary_location":{"id":"doi:10.1049/cds2/1773323","is_oa":true,"landing_page_url":"https://doi.org/10.1049/cds2/1773323","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1049/cds2/1773323","source":{"id":"https://openalex.org/S4210208150","display_name":"IET Circuits Devices & Systems","issn_l":"1751-858X","issn":["1751-858X","1751-8598"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Circuits, Devices & Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1049/cds2/1773323","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075966974","display_name":"Chunyu Peng","orcid":"https://orcid.org/0000-0003-2408-5048"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]},{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunyu Peng","raw_affiliation_strings":["Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","HF Agile Device Co., Ltd. ,  Hefei ,  China","School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn"],"affiliations":[{"raw_affiliation_string":"Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"HF Agile Device Co., Ltd. ,  Hefei ,  China","institution_ids":["https://openalex.org/I16365422"]},{"raw_affiliation_string":"School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111139709","display_name":"Jingxue Zhong","orcid":"https://orcid.org/0009-0006-4550-8774"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingxue Zhong","raw_affiliation_strings":["Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn"],"affiliations":[{"raw_affiliation_string":"Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020797174","display_name":"Yingxue Sun","orcid":"https://orcid.org/0000-0002-9971-6644"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingxue Sun","raw_affiliation_strings":["Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn"],"affiliations":[{"raw_affiliation_string":"Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071226600","display_name":"W.W. Tan","orcid":"https://orcid.org/0009-0006-6755-5387"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weizhe Tan","raw_affiliation_strings":["Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn"],"affiliations":[{"raw_affiliation_string":"Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089721649","display_name":"Chengxing Dai","orcid":null},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengxing Dai","raw_affiliation_strings":["Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn"],"affiliations":[{"raw_affiliation_string":"Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100353783","display_name":"Xin Li","orcid":"https://orcid.org/0000-0002-0144-9489"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Li","raw_affiliation_strings":["Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn"],"affiliations":[{"raw_affiliation_string":"Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037391840","display_name":"Xiulong Wu","orcid":"https://orcid.org/0000-0002-5012-2570"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiulong Wu","raw_affiliation_strings":["Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn"],"affiliations":[{"raw_affiliation_string":"Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085770846","display_name":"Yongliang Zhou","orcid":"https://orcid.org/0000-0002-7327-6759"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yongliang Zhou","raw_affiliation_strings":["Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn"],"affiliations":[{"raw_affiliation_string":"Anhui High-Performance Integrated Circuit Engineering Research Center ,  Hefei ,  China","institution_ids":["https://openalex.org/I143868143"]},{"raw_affiliation_string":"School of Integrated Circuits ,  Anhui University ,  Hefei ,  230601 ,  China ,  ahu.edu.cn","institution_ids":["https://openalex.org/I143868143"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5085770846"],"corresponding_institution_ids":["https://openalex.org/I143868143"],"apc_list":{"value":2000,"currency":"EUR","value_usd":2200},"apc_paid":{"value":2000,"currency":"EUR","value_usd":2200},"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.22227691,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2025","issue":"1","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.8059587478637695},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7174683213233948},{"id":"https://openalex.org/keywords/charge-pump","display_name":"Charge pump","score":0.7081942558288574},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.636022686958313},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5500773191452026},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47741949558258057},{"id":"https://openalex.org/keywords/pll-multibit","display_name":"PLL multibit","score":0.4273070991039276},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.412349671125412},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3734791874885559},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3409196138381958},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2535594701766968},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2256464958190918},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18926414847373962},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.10081285238265991},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.08254122734069824},{"id":"https://openalex.org/keywords/psychology","display_name":"Psychology","score":0.05886301398277283}],"concepts":[{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.8059587478637695},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7174683213233948},{"id":"https://openalex.org/C114825011","wikidata":"https://www.wikidata.org/wiki/Q440704","display_name":"Charge pump","level":4,"score":0.7081942558288574},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.636022686958313},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5500773191452026},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47741949558258057},{"id":"https://openalex.org/C77881186","wikidata":"https://www.wikidata.org/wiki/Q7119642","display_name":"PLL multibit","level":4,"score":0.4273070991039276},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.412349671125412},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3734791874885559},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3409196138381958},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2535594701766968},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2256464958190918},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18926414847373962},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.10081285238265991},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.08254122734069824},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.05886301398277283},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1049/cds2/1773323","is_oa":true,"landing_page_url":"https://doi.org/10.1049/cds2/1773323","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1049/cds2/1773323","source":{"id":"https://openalex.org/S4210208150","display_name":"IET Circuits Devices & Systems","issn_l":"1751-858X","issn":["1751-858X","1751-8598"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Circuits, Devices & Systems","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:5a8e8b88db7e45aa9caac79d8d014d25","is_oa":true,"landing_page_url":"https://doaj.org/article/5a8e8b88db7e45aa9caac79d8d014d25","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IET Circuits, Devices and Systems, Vol 2025 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1049/cds2/1773323","is_oa":true,"landing_page_url":"https://doi.org/10.1049/cds2/1773323","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1049/cds2/1773323","source":{"id":"https://openalex.org/S4210208150","display_name":"IET Circuits Devices & Systems","issn_l":"1751-858X","issn":["1751-858X","1751-8598"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310311714","host_organization_name":"Institution of Engineering and Technology","host_organization_lineage":["https://openalex.org/P4310311714"],"host_organization_lineage_names":["Institution of Engineering and Technology"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IET Circuits, Devices & Systems","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1121271761","display_name":null,"funder_award_id":"Program","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2087396116","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2671108851","display_name":null,"funder_award_id":"2023AH040011","funder_id":"https://openalex.org/F4320334897","funder_display_name":"Natural Science Foundation of Anhui Province"},{"id":"https://openalex.org/G3317480652","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3783266103","display_name":null,"funder_award_id":"62274001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G391238517","display_name":null,"funder_award_id":", and","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4734890220","display_name":null,"funder_award_id":"2308085QF214","funder_id":"https://openalex.org/F4320334897","funder_display_name":"Natural Science Foundation of Anhui Province"},{"id":"https://openalex.org/G5994120800","display_name":null,"funder_award_id":"Natural","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6770163833","display_name":null,"funder_award_id":"2308085Q","funder_id":"https://openalex.org/F4320334897","funder_display_name":"Natural Science Foundation of Anhui Province"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320334897","display_name":"Natural Science Foundation of Anhui Province","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4413764743.pdf","grobid_xml":"https://content.openalex.org/works/W4413764743.grobid-xml"},"referenced_works_count":49,"referenced_works":["https://openalex.org/W1971556564","https://openalex.org/W1977219826","https://openalex.org/W1983035550","https://openalex.org/W2036086508","https://openalex.org/W2139465209","https://openalex.org/W2163231597","https://openalex.org/W2180955662","https://openalex.org/W2335708709","https://openalex.org/W2410273639","https://openalex.org/W2490956927","https://openalex.org/W2512393356","https://openalex.org/W2520742814","https://openalex.org/W2543078426","https://openalex.org/W2545365416","https://openalex.org/W2736058244","https://openalex.org/W2738149697","https://openalex.org/W2761050975","https://openalex.org/W2779702701","https://openalex.org/W2785315525","https://openalex.org/W2792938883","https://openalex.org/W2895235416","https://openalex.org/W2901934666","https://openalex.org/W2907230505","https://openalex.org/W2911302551","https://openalex.org/W2955839119","https://openalex.org/W2983214264","https://openalex.org/W3023667408","https://openalex.org/W3046332930","https://openalex.org/W3091474853","https://openalex.org/W3098639703","https://openalex.org/W3108778382","https://openalex.org/W3165882939","https://openalex.org/W3173579980","https://openalex.org/W3206434616","https://openalex.org/W3209444343","https://openalex.org/W4205221087","https://openalex.org/W4205434287","https://openalex.org/W4220984365","https://openalex.org/W4292406520","https://openalex.org/W4292969001","https://openalex.org/W4361763991","https://openalex.org/W4385831747","https://openalex.org/W4388469760","https://openalex.org/W4390190551","https://openalex.org/W4390414948","https://openalex.org/W4400877656","https://openalex.org/W4402753667","https://openalex.org/W4403612167","https://openalex.org/W4406461145"],"related_works":["https://openalex.org/W2511498111","https://openalex.org/W2087564251","https://openalex.org/W2369807905","https://openalex.org/W4206188327","https://openalex.org/W2752021769","https://openalex.org/W2339860780","https://openalex.org/W4385624389","https://openalex.org/W2128445318","https://openalex.org/W2115565809","https://openalex.org/W2953546518"],"abstract_inverted_index":{"The":[0],"charge":[1,43],"pump":[2,44],"phase\u2010locked":[3],"loop":[4],"(CP\u2010PLL)":[5],"is":[6,31],"a":[7,108,113,154],"critical":[8],"component":[9],"in":[10,23,78],"modern":[11],"mixed\u2010signal":[12],"electronics,":[13],"widely":[14],"used":[15],"for":[16,146],"clock":[17],"generation,":[18],"synchronization,":[19],"and":[20,25,46,80,99],"frequency":[21,48,127,151],"synthesis":[22],"digital":[24],"wireless":[26],"applications.":[27],"However,":[28],"its":[29],"performance":[30],"significantly":[32,124],"impacted":[33],"by":[34],"nonideal":[35],"effects,":[36],"particularly":[37],"the":[38,42,47,68,74,81,87,101,105,121,126,130,136,143,149],"current":[39,102,114],"mismatch":[40,103,115],"of":[41,50,53,73,86,104,116,129,138,148],"(CP)":[45],"variation":[49],"oscillator,":[51],"both":[52],"which":[54],"are":[55],"highly":[56],"sensitive":[57],"to":[58,159],"temperature":[59,70,83,110,155],"fluctuations.":[60],"To":[61],"address":[62],"these":[63],"challenges,":[64],"this":[65],"work":[66],"leverages":[67],"positive":[69],"coefficient":[71,84],"(PTC)":[72],"drain\u2010source":[75],"on\u2010state":[76],"resistance":[77],"CMOS":[79,95],"negative":[82],"(NTC)":[85],"magnetic":[88],"tunnel":[89],"junction":[90],"(MTJ).":[91],"Using":[92],"28":[93],"nm":[94],"technology,":[96],"we":[97],"analyze":[98],"simulate":[100],"CP":[106],"across":[107],"wide":[109],"range,":[111],"achieving":[112],"less":[117],"than":[118],"0.3%.":[119],"Furthermore,":[120],"proposed":[122],"approach":[123],"improves":[125],"stability":[128],"ring":[131],"oscillator.":[132],"Simulation":[133],"results":[134],"validate":[135],"effectiveness":[137],"our":[139],"design,":[140],"demonstrating":[141],"that":[142],"MTJ":[144],"compensates":[145],"90%":[147],"output":[150],"drift":[152],"over":[153],"range":[156],"from":[157],"\u221280":[158],"125\u00b0C.":[160]},"counts_by_year":[],"updated_date":"2026-03-18T14:38:29.013473","created_date":"2025-10-10T00:00:00"}