{"id":"https://openalex.org/W3166708816","doi":"https://doi.org/10.1023/a:1021991828423","title":"Multiple Scan Chain Design for Two-Pattern Testing","display_name":"Multiple Scan Chain Design for Two-Pattern Testing","publication_year":2003,"publication_date":"2003-02-01","ids":{"openalex":"https://openalex.org/W3166708816","doi":"https://doi.org/10.1023/a:1021991828423","mag":"3166708816"},"language":"en","primary_location":{"id":"doi:10.1023/a:1021991828423","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1021991828423","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027416202","display_name":"Ilia Polian","orcid":"https://orcid.org/0000-0002-6563-2725"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ilia Polian","raw_affiliation_strings":["Institute of Computer Science, Albert-Ludwigs-University, Georges-K\u00f6hler-Allee 51, 79110, Freiburg im Breisgau, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Science, Albert-Ludwigs-University, Georges-K\u00f6hler-Allee 51, 79110, Freiburg im Breisgau, Germany","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038861833","display_name":"Bernd Becker","orcid":"https://orcid.org/0000-0003-4031-3258"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bernd Becker","raw_affiliation_strings":["Institute of Computer Science, Albert-Ludwigs-University, Georges-K\u00f6hler-Allee 51, 79110, Freiburg im Breisgau, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computer Science, Albert-Ludwigs-University, Georges-K\u00f6hler-Allee 51, 79110, Freiburg im Breisgau, Germany","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.5757,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.75080906,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"19","issue":"1","first_page":"37","last_page":"48"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9745000004768372,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.787799060344696},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6080834865570068},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5835433602333069},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.5744052529335022},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5734411478042603},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5023918151855469},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.48674750328063965},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.4701519012451172},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4682886004447937},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4349658489227295},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3783855140209198},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.34622111916542053},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21604368090629578},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.18906563520431519},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.17825713753700256},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.12939131259918213},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.11135125160217285},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07487651705741882},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.06765037775039673}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.787799060344696},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6080834865570068},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5835433602333069},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.5744052529335022},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5734411478042603},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5023918151855469},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.48674750328063965},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.4701519012451172},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4682886004447937},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4349658489227295},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3783855140209198},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.34622111916542053},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21604368090629578},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.18906563520431519},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.17825713753700256},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.12939131259918213},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.11135125160217285},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07487651705741882},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06765037775039673},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1023/a:1021991828423","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1021991828423","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W30844492","https://openalex.org/W1589317331","https://openalex.org/W1610717462","https://openalex.org/W1921119665","https://openalex.org/W2011039300","https://openalex.org/W2098335680","https://openalex.org/W2112062619","https://openalex.org/W2116830400","https://openalex.org/W2119393576","https://openalex.org/W2123774679","https://openalex.org/W2133913685","https://openalex.org/W2134122368","https://openalex.org/W2160010735","https://openalex.org/W3147914313","https://openalex.org/W4248365469","https://openalex.org/W6600530048","https://openalex.org/W6601491935"],"related_works":["https://openalex.org/W2131499522","https://openalex.org/W2006457427","https://openalex.org/W2142519941","https://openalex.org/W1996111092","https://openalex.org/W2014831604","https://openalex.org/W3147038789","https://openalex.org/W2543744537","https://openalex.org/W2098289641","https://openalex.org/W2569480541","https://openalex.org/W1994136514"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2021-06-22T00:00:00"}