{"id":"https://openalex.org/W1515437918","doi":"https://doi.org/10.1023/a:1020805224219","title":"A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM","display_name":"A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM","publication_year":2002,"publication_date":"2002-12-01","ids":{"openalex":"https://openalex.org/W1515437918","doi":"https://doi.org/10.1023/a:1020805224219","mag":"1515437918"},"language":"en","primary_location":{"id":"doi:10.1023/a:1020805224219","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1020805224219","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084041065","display_name":"Chih-Wea Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Wea Wang","raw_affiliation_strings":["Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan, Republic of China","Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan 30013, Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan, Republic of China","institution_ids":["https://openalex.org/I25846049"]},{"raw_affiliation_string":"Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan 30013, Republic of China","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102066701","display_name":"Chi-Feng Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chi-Feng Wu","raw_affiliation_strings":["Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan, Republic of China","Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan 30013, Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan, Republic of China","institution_ids":["https://openalex.org/I25846049"]},{"raw_affiliation_string":"Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan 30013, Republic of China","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100741020","display_name":"Jin-Fu Li","orcid":"https://orcid.org/0000-0003-1961-9674"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jin-Fu Li","raw_affiliation_strings":["Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan, Republic of China","Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan 30013, Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan, Republic of China","institution_ids":["https://openalex.org/I25846049"]},{"raw_affiliation_string":"Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan 30013, Republic of China","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075548524","display_name":"Cheng\u2010Wen Wu","orcid":"https://orcid.org/0000-0001-8614-7908"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Cheng-Wen Wu","raw_affiliation_strings":["Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan, Republic of China","Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan 30013, Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan, Republic of China","institution_ids":["https://openalex.org/I25846049"]},{"raw_affiliation_string":"Laboratory for Reliable Computing (LaRC), Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan 30013, Republic of China","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070666934","display_name":"Tony Teng","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112000","display_name":"Faraday Technology (Taiwan)","ror":"https://ror.org/021wyrx76","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210112000"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tony Teng","raw_affiliation_strings":["Faraday Technology Corporation, Hsinchu, 30013, Taiwan, Republic of China","Faraday Technology Corporation, Hsinchu, Taiwan 30013, Republic of China#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faraday Technology Corporation, Hsinchu, 30013, Taiwan, Republic of China","institution_ids":["https://openalex.org/I4210112000"]},{"raw_affiliation_string":"Faraday Technology Corporation, Hsinchu, Taiwan 30013, Republic of China#TAB#","institution_ids":["https://openalex.org/I4210112000"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085112636","display_name":"Kevin Kuan\u2010Shun Chiu","orcid":"https://orcid.org/0009-0009-4164-3735"},"institutions":[{"id":"https://openalex.org/I4210112000","display_name":"Faraday Technology (Taiwan)","ror":"https://ror.org/021wyrx76","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210112000"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kevin Chiu","raw_affiliation_strings":["Faraday Technology Corporation, Hsinchu, 30013, Taiwan, Republic of China","Faraday Technology Corporation, Hsinchu, Taiwan 30013, Republic of China#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faraday Technology Corporation, Hsinchu, 30013, Taiwan, Republic of China","institution_ids":["https://openalex.org/I4210112000"]},{"raw_affiliation_string":"Faraday Technology Corporation, Hsinchu, Taiwan 30013, Republic of China#TAB#","institution_ids":["https://openalex.org/I4210112000"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107920933","display_name":"Hsiao-Ping Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112000","display_name":"Faraday Technology (Taiwan)","ror":"https://ror.org/021wyrx76","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210112000"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Hsiao-Ping Lin","raw_affiliation_strings":["Faraday Technology Corporation, Hsinchu, 30013, Taiwan, Republic of China","Faraday Technology Corporation, Hsinchu, Taiwan 30013, Republic of China#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faraday Technology Corporation, Hsinchu, 30013, Taiwan, Republic of China","institution_ids":["https://openalex.org/I4210112000"]},{"raw_affiliation_string":"Faraday Technology Corporation, Hsinchu, Taiwan 30013, Republic of China#TAB#","institution_ids":["https://openalex.org/I4210112000"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.0275,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.75001424,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"18","issue":"6","first_page":"637","last_page":"647"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.7412837147712708},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.7087701559066772},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6894160509109497},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6107208132743835},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5660215616226196},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5149329304695129},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5024149417877197},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4735516607761383},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4545837640762329},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.39599472284317017},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.34077584743499756},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2926936149597168},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2060510814189911},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08356940746307373},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.0823865532875061},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.05963656306266785}],"concepts":[{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.7412837147712708},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.7087701559066772},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6894160509109497},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6107208132743835},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5660215616226196},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5149329304695129},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5024149417877197},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4735516607761383},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4545837640762329},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.39599472284317017},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.34077584743499756},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2926936149597168},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2060510814189911},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08356940746307373},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0823865532875061},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.05963656306266785},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1023/a:1020805224219","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1020805224219","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1554885925","https://openalex.org/W1675646712","https://openalex.org/W1935370461","https://openalex.org/W1967824305","https://openalex.org/W1994887588","https://openalex.org/W2021130660","https://openalex.org/W2066816466","https://openalex.org/W2078063367","https://openalex.org/W2078286038","https://openalex.org/W2104548962","https://openalex.org/W2106246015","https://openalex.org/W2106935654","https://openalex.org/W2109857771","https://openalex.org/W2112727903","https://openalex.org/W2117531486","https://openalex.org/W2120330602","https://openalex.org/W2121938580","https://openalex.org/W2132778431","https://openalex.org/W2134822007","https://openalex.org/W2142661102","https://openalex.org/W2144828465","https://openalex.org/W2157571503","https://openalex.org/W2159571837","https://openalex.org/W2164333395","https://openalex.org/W4252060717","https://openalex.org/W6679523228"],"related_works":["https://openalex.org/W2989159162","https://openalex.org/W2153201966","https://openalex.org/W2122754719","https://openalex.org/W3192832106","https://openalex.org/W2146381271","https://openalex.org/W2139513292","https://openalex.org/W1982569681","https://openalex.org/W1874778078","https://openalex.org/W2543176856","https://openalex.org/W776711554"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2025-10-10T00:00:00"}