{"id":"https://openalex.org/W1511579434","doi":"https://doi.org/10.1023/a:1018923012867","title":"Test workload measurement and reliability analysis for large commercial software systems","display_name":"Test workload measurement and reliability analysis for large commercial software systems","publication_year":1997,"publication_date":"1997-01-01","ids":{"openalex":"https://openalex.org/W1511579434","doi":"https://doi.org/10.1023/a:1018923012867","mag":"1511579434"},"language":"en","primary_location":{"id":"doi:10.1023/a:1018923012867","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1018923012867","pdf_url":null,"source":{"id":"https://openalex.org/S104191512","display_name":"Annals of Software Engineering","issn_l":"1022-7091","issn":["1022-7091","1573-7489"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Annals of Software Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102121181","display_name":"Jeff Tian","orcid":null},"institutions":[{"id":"https://openalex.org/I178169726","display_name":"Southern Methodist University","ror":"https://ror.org/042tdr378","country_code":"US","type":"education","lineage":["https://openalex.org/I178169726"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jeff Tian","raw_affiliation_strings":["Department of Computer Science and Engineering, Southern Methodist University, Dallas, TX, 75275, USA","Department of Computer Science and Engineering, Southern Methodist University, Dallas, TX 75275, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Southern Methodist University, Dallas, TX, 75275, USA","institution_ids":["https://openalex.org/I178169726"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, Southern Methodist University, Dallas, TX 75275, USA","institution_ids":["https://openalex.org/I178169726"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110166793","display_name":"Joe Palma","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210113654","display_name":"IBM (Canada)","ror":"https://ror.org/025sxka56","country_code":"CA","type":"company","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210113654"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Joe Palma","raw_affiliation_strings":["IBM Software Solutions Toronto Laboratory, 1150 Eglinton Ave. E., North York, Ontario, Canada, M3C 1H7","IBM Software Solutions Toronto Laboratory, 1150 Eglinton Ave. E.,  North York, Ontario, Canada M3C 1H7"],"affiliations":[{"raw_affiliation_string":"IBM Software Solutions Toronto Laboratory, 1150 Eglinton Ave. E., North York, Ontario, Canada, M3C 1H7","institution_ids":["https://openalex.org/I4210113654"]},{"raw_affiliation_string":"IBM Software Solutions Toronto Laboratory, 1150 Eglinton Ave. E.,  North York, Ontario, Canada M3C 1H7","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5102121181"],"corresponding_institution_ids":["https://openalex.org/I178169726"],"apc_list":null,"apc_paid":null,"fwci":1.8278,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.85235732,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"4","issue":"1","first_page":"201","last_page":"222"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/workload","display_name":"Workload","score":0.8344930410385132},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7235373258590698},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.708722710609436},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6383594274520874},{"id":"https://openalex.org/keywords/ibm","display_name":"IBM","score":0.599130392074585},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.5847188830375671},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5666003227233887},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5351292490959167},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4773997366428375},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.23517769575119019},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22061288356781006},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.12469139695167542}],"concepts":[{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.8344930410385132},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7235373258590698},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.708722710609436},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6383594274520874},{"id":"https://openalex.org/C70388272","wikidata":"https://www.wikidata.org/wiki/Q5968558","display_name":"IBM","level":2,"score":0.599130392074585},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.5847188830375671},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5666003227233887},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5351292490959167},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4773997366428375},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.23517769575119019},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22061288356781006},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.12469139695167542},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1023/a:1018923012867","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1018923012867","pdf_url":null,"source":{"id":"https://openalex.org/S104191512","display_name":"Annals of Software Engineering","issn_l":"1022-7091","issn":["1022-7091","1573-7489"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Annals of Software Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5600000023841858}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W124052719","https://openalex.org/W1534452456","https://openalex.org/W1554758995","https://openalex.org/W1910771831","https://openalex.org/W1975372980","https://openalex.org/W1980595883","https://openalex.org/W2008510077","https://openalex.org/W2023730632","https://openalex.org/W2090823212","https://openalex.org/W2113004249","https://openalex.org/W2123554630","https://openalex.org/W2138709157","https://openalex.org/W2162553153","https://openalex.org/W2171242934","https://openalex.org/W2767396501","https://openalex.org/W6605014292","https://openalex.org/W6745478857"],"related_works":["https://openalex.org/W1521772560","https://openalex.org/W82714704","https://openalex.org/W4238386252","https://openalex.org/W1519020487","https://openalex.org/W4226182203","https://openalex.org/W2383505837","https://openalex.org/W234065253","https://openalex.org/W2382583096","https://openalex.org/W2512801408","https://openalex.org/W147463599"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}