{"id":"https://openalex.org/W2581692531","doi":"https://doi.org/10.1023/a:1014941525735","title":"Hardware Generation of Random Single Input Change Test Sequences","display_name":"Hardware Generation of Random Single Input Change Test Sequences","publication_year":2002,"publication_date":"2002-04-01","ids":{"openalex":"https://openalex.org/W2581692531","doi":"https://doi.org/10.1023/a:1014941525735","mag":"2581692531"},"language":"en","primary_location":{"id":"doi:10.1023/a:1014941525735","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1014941525735","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"R. David","orcid":null},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I177483745","display_name":"Universit\u00e9 Joseph Fourier","ror":"https://ror.org/02aj0kh94","country_code":"FR","type":"education","lineage":["https://openalex.org/I177483745"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"R. David","raw_affiliation_strings":["Laboratoire d'Automatique de Grenoble (INPG-CNRS-UJF), BP 46, 38402, St-Martin-d'H\u00e8res, France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Automatique de Grenoble (INPG-CNRS-UJF), BP 46, 38402, St-Martin-d'H\u00e8res, France","institution_ids":["https://openalex.org/I177483745","https://openalex.org/I1294671590","https://openalex.org/I106785703"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Girard","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier, CNRS/Universit\u00e9 Montpellier II, 161 rue Ada, 34392, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier, CNRS/Universit\u00e9 Montpellier II, 161 rue Ada, 34392, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071534551","display_name":"C. Landrault","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C. Landrault","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier, CNRS/Universit\u00e9 Montpellier II, 161 rue Ada, 34392, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier, CNRS/Universit\u00e9 Montpellier II, 161 rue Ada, 34392, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041515093","display_name":"S. Pravossoudovitch","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. Pravossoudovitch","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier, CNRS/Universit\u00e9 Montpellier II, 161 rue Ada, 34392, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier, CNRS/Universit\u00e9 Montpellier II, 161 rue Ada, 34392, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089236739","display_name":"A. Virazel","orcid":"https://orcid.org/0000-0001-7398-7107"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Virazel","raw_affiliation_strings":["Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier, CNRS/Universit\u00e9 Montpellier II, 161 rue Ada, 34392, Montpellier, France"],"affiliations":[{"raw_affiliation_string":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier, CNRS/Universit\u00e9 Montpellier II, 161 rue Ada, 34392, Montpellier, France","institution_ids":["https://openalex.org/I19894307","https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I177483745"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.411,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.6302205,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"18","issue":"2","first_page":"145","last_page":"157"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6023464798927307},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5904554724693298},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5606983304023743},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.534908652305603},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5191928148269653},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5086129903793335},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4422295093536377},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.44215235114097595},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.4328489303588867},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39780065417289734},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.38704127073287964},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3552118241786957},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32994282245635986},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20221245288848877},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09915223717689514},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08481466770172119},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.0645914375782013}],"concepts":[{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6023464798927307},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5904554724693298},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5606983304023743},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.534908652305603},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5191928148269653},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5086129903793335},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4422295093536377},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.44215235114097595},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.4328489303588867},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39780065417289734},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.38704127073287964},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3552118241786957},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32994282245635986},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20221245288848877},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09915223717689514},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08481466770172119},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0645914375782013},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1023/a:1014941525735","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1014941525735","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:HAL:lirmm-00268540v1","is_oa":false,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268540","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing: : Theory and Applications, 2002, 18 (2), pp.145-157. ⟨10.1023/A:1014941525735⟩","raw_type":"Journal articles"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W13277579","https://openalex.org/W145079818","https://openalex.org/W1554885925","https://openalex.org/W1899041031","https://openalex.org/W1989655566","https://openalex.org/W2152406824","https://openalex.org/W2153253425","https://openalex.org/W2157111192","https://openalex.org/W2161273337","https://openalex.org/W2336197036","https://openalex.org/W2752853835","https://openalex.org/W2897970066","https://openalex.org/W3014502717","https://openalex.org/W3099826813","https://openalex.org/W6600530048"],"related_works":["https://openalex.org/W2989159162","https://openalex.org/W2122754719","https://openalex.org/W2153201966","https://openalex.org/W1749299286","https://openalex.org/W2139513292","https://openalex.org/W1982569681","https://openalex.org/W1874778078","https://openalex.org/W2005858638","https://openalex.org/W2068588503","https://openalex.org/W2536854812"],"abstract_inverted_index":null,"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-04-16T08:26:57.006410","created_date":"2017-02-03T00:00:00"}