{"id":"https://openalex.org/W1530746673","doi":"https://doi.org/10.1023/a:1012751118746","title":"Frequency Response Verification of Analog Circuits Using Global Optimization Techniques","display_name":"Frequency Response Verification of Analog Circuits Using Global Optimization Techniques","publication_year":2001,"publication_date":"2001-10-01","ids":{"openalex":"https://openalex.org/W1530746673","doi":"https://doi.org/10.1023/a:1012751118746","mag":"1530746673"},"language":"en","primary_location":{"id":"doi:10.1023/a:1012751118746","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1012751118746","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113859502","display_name":"Suresh Seshadri","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Suresh Seshadri","raw_affiliation_strings":["Computer Engineering Research Center, The University of Texas at Austin, Austin, TX, 78712, USA","Computer Engineering Research Center, The University of Texas at Austin, Austin, TX 78712, USA. suresh.seshadri@eng.sun.com#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, The University of Texas at Austin, Austin, TX, 78712, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Computer Engineering Research Center, The University of Texas at Austin, Austin, TX 78712, USA. suresh.seshadri@eng.sun.com#TAB#","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068070739","display_name":"Jacob A. Abraham","orcid":"https://orcid.org/0000-0002-5336-5631"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jacob A. Abraham","raw_affiliation_strings":["Computer Engineering Research Center, The University of Texas at Austin, Austin, TX, 78712, USA","Computer Engineering Research Center, The University of Texas at Austin, Austin, TX 78712, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, The University of Texas at Austin, Austin, TX, 78712, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Computer Engineering Research Center, The University of Texas at Austin, Austin, TX 78712, USA#TAB#","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5113859502"],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.07510058,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"17","issue":"5","first_page":"395","last_page":"408"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.6373751163482666},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6217802166938782},{"id":"https://openalex.org/keywords/envelope","display_name":"Envelope (radar)","score":0.4979109764099121},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.4540851414203644},{"id":"https://openalex.org/keywords/frequency-response","display_name":"Frequency response","score":0.43458127975463867},{"id":"https://openalex.org/keywords/bounded-function","display_name":"Bounded function","score":0.42785516381263733},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42126280069351196},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3886597454547882},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2505173683166504},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1358223557472229},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09067568182945251},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08831167221069336}],"concepts":[{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.6373751163482666},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6217802166938782},{"id":"https://openalex.org/C65155139","wikidata":"https://www.wikidata.org/wiki/Q5380912","display_name":"Envelope (radar)","level":3,"score":0.4979109764099121},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.4540851414203644},{"id":"https://openalex.org/C8590192","wikidata":"https://www.wikidata.org/wiki/Q1054694","display_name":"Frequency response","level":2,"score":0.43458127975463867},{"id":"https://openalex.org/C34388435","wikidata":"https://www.wikidata.org/wiki/Q2267362","display_name":"Bounded function","level":2,"score":0.42785516381263733},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42126280069351196},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3886597454547882},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2505173683166504},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1358223557472229},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09067568182945251},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08831167221069336},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1023/a:1012751118746","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1012751118746","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1536945048","https://openalex.org/W1924227955","https://openalex.org/W1989194333","https://openalex.org/W2090098281","https://openalex.org/W2097451232","https://openalex.org/W2117350447","https://openalex.org/W2125681407","https://openalex.org/W2133973893","https://openalex.org/W2138839649","https://openalex.org/W2168629268","https://openalex.org/W4232944630","https://openalex.org/W4246719277"],"related_works":["https://openalex.org/W4294364856","https://openalex.org/W2315570462","https://openalex.org/W2164522043","https://openalex.org/W2299552569","https://openalex.org/W4383216082","https://openalex.org/W2163912400","https://openalex.org/W4298018575","https://openalex.org/W2700088093","https://openalex.org/W2359419821","https://openalex.org/W2798178534"],"abstract_inverted_index":null,"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2016-06-24T00:00:00"}