{"id":"https://openalex.org/W1542521181","doi":"https://doi.org/10.1023/a:1011169626409","title":"Fault Models and Test Generation for OpAmp Circuits\u2014The FFM","display_name":"Fault Models and Test Generation for OpAmp Circuits\u2014The FFM","publication_year":2001,"publication_date":"2001-04-01","ids":{"openalex":"https://openalex.org/W1542521181","doi":"https://doi.org/10.1023/a:1011169626409","mag":"1542521181"},"language":"en","primary_location":{"id":"doi:10.1023/a:1011169626409","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1011169626409","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076090842","display_name":"J.V. Calvano","orcid":"https://orcid.org/0000-0003-0155-1405"},"institutions":[{"id":"https://openalex.org/I2941883833","display_name":"Brazilian Naval School","ror":"https://ror.org/00gq58w69","country_code":"BR","type":"education","lineage":["https://openalex.org/I2941883833"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Jos\u00e9 Vicente Calvano","raw_affiliation_strings":["Brazilian Navy Research Institute, R. Ipiru, 2, Rio de Janeiro, Brazil","Brazilian Navy Research Institute, R. Ipiru, 2, Rio de Janeiro, Brazil. calvano@olimpo.com.br"],"affiliations":[{"raw_affiliation_string":"Brazilian Navy Research Institute, R. Ipiru, 2, Rio de Janeiro, Brazil","institution_ids":["https://openalex.org/I2941883833"]},{"raw_affiliation_string":"Brazilian Navy Research Institute, R. Ipiru, 2, Rio de Janeiro, Brazil. calvano@olimpo.com.br","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021764887","display_name":"Ant\u00f4nio Carneiro de Mesquita Filho","orcid":null},"institutions":[{"id":"https://openalex.org/I122140584","display_name":"Universidade Federal do Rio de Janeiro","ror":"https://ror.org/03490as77","country_code":"BR","type":"education","lineage":["https://openalex.org/I122140584"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Ant\u00f4nio Carneiro de Mesquita Filho","raw_affiliation_strings":["Federal University of Rio de Janeiro/COPPE, Av. Brigadeiro Trompowski, s/n, Brazil","Federal University of Rio de Janeiro/COPPE, Av. Brigadeiro Trompowski, s/n, Brazil. mesquita@coe.ufrj.br"],"affiliations":[{"raw_affiliation_string":"Federal University of Rio de Janeiro/COPPE, Av. Brigadeiro Trompowski, s/n, Brazil","institution_ids":["https://openalex.org/I122140584"]},{"raw_affiliation_string":"Federal University of Rio de Janeiro/COPPE, Av. Brigadeiro Trompowski, s/n, Brazil. mesquita@coe.ufrj.br","institution_ids":["https://openalex.org/I122140584"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108221647","display_name":"V.C. Alves","orcid":null},"institutions":[{"id":"https://openalex.org/I122140584","display_name":"Universidade Federal do Rio de Janeiro","ror":"https://ror.org/03490as77","country_code":"BR","type":"education","lineage":["https://openalex.org/I122140584"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Vladimir Castro Alves","raw_affiliation_strings":["Federal University of Rio de Janeiro/COPPE, Av. Brigadeiro Trompowski, s/n, Brazil","Federal University of Rio de Janeiro/COPPE, Av. Brigadeiro Trompowski, s/n, Brazil. castro@lpc.ufrj.br#TAB#"],"affiliations":[{"raw_affiliation_string":"Federal University of Rio de Janeiro/COPPE, Av. Brigadeiro Trompowski, s/n, Brazil","institution_ids":["https://openalex.org/I122140584"]},{"raw_affiliation_string":"Federal University of Rio de Janeiro/COPPE, Av. Brigadeiro Trompowski, s/n, Brazil. castro@lpc.ufrj.br#TAB#","institution_ids":["https://openalex.org/I122140584"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5105973341","display_name":"Marcelo Lubaszewski","orcid":null},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Marcelo Soares Lubaszewski","raw_affiliation_strings":["Federal University of Rio Grande do Sul/DELET, Av. Oswaldo Aranha, 103, Porto Alegre, Brazil","Federal University of Rio Grande do Sul/DELET, Av. Oswaldo Aranha, 103, Porto Alegre, Brazil. luba@iee.ufrgs.br#TAB#"],"affiliations":[{"raw_affiliation_string":"Federal University of Rio Grande do Sul/DELET, Av. Oswaldo Aranha, 103, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Federal University of Rio Grande do Sul/DELET, Av. Oswaldo Aranha, 103, Porto Alegre, Brazil. luba@iee.ufrgs.br#TAB#","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5076090842"],"corresponding_institution_ids":["https://openalex.org/I2941883833"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.2215,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.80347625,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"17","issue":"2","first_page":"121","last_page":"138"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.650736927986145},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6412981748580933},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.6067551374435425},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.5645045638084412},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5345076322555542},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5195479989051819},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.515905499458313},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.5074941515922546},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46132248640060425},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.43818360567092896},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.42897331714630127},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.42760446667671204},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4191761016845703},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.3745560646057129},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34968602657318115},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.3453894257545471},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.22494623064994812},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.2033216655254364},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12817218899726868},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.10716694593429565},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08447223901748657}],"concepts":[{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.650736927986145},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6412981748580933},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6067551374435425},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.5645045638084412},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5345076322555542},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5195479989051819},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.515905499458313},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.5074941515922546},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46132248640060425},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.43818360567092896},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.42897331714630127},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.42760446667671204},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4191761016845703},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.3745560646057129},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34968602657318115},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.3453894257545471},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.22494623064994812},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.2033216655254364},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12817218899726868},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.10716694593429565},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08447223901748657},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1023/a:1011169626409","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1011169626409","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W649199415","https://openalex.org/W654616574","https://openalex.org/W1495449425","https://openalex.org/W1548102932","https://openalex.org/W1550240879","https://openalex.org/W1554885925","https://openalex.org/W1559191642","https://openalex.org/W1899986308","https://openalex.org/W1907046986","https://openalex.org/W1920426359","https://openalex.org/W1934570129","https://openalex.org/W1935758203","https://openalex.org/W2024473487","https://openalex.org/W2068571131","https://openalex.org/W2071235072","https://openalex.org/W2072406665","https://openalex.org/W2076420009","https://openalex.org/W2077565595","https://openalex.org/W2091052068","https://openalex.org/W2095416034","https://openalex.org/W2097113656","https://openalex.org/W2099425240","https://openalex.org/W2102378583","https://openalex.org/W2106816366","https://openalex.org/W2124217752","https://openalex.org/W2130605160","https://openalex.org/W2144132370","https://openalex.org/W2154242671","https://openalex.org/W2156213538","https://openalex.org/W3013099818","https://openalex.org/W3145363696","https://openalex.org/W6607948906"],"related_works":["https://openalex.org/W2157191248","https://openalex.org/W2107525390","https://openalex.org/W2150046587","https://openalex.org/W2164493372","https://openalex.org/W2153086993","https://openalex.org/W2114980936","https://openalex.org/W2082120371","https://openalex.org/W2143028225","https://openalex.org/W2147400189","https://openalex.org/W2134390217"],"abstract_inverted_index":null,"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}