{"id":"https://openalex.org/W3013099818","doi":"https://doi.org/10.1023/a:1008395125678","title":"Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling","display_name":"Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling","publication_year":1999,"publication_date":"1999-08-01","ids":{"openalex":"https://openalex.org/W3013099818","doi":"https://doi.org/10.1023/a:1008395125678","mag":"3013099818"},"language":"en","primary_location":{"id":"doi:10.1023/a:1008395125678","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008395125678","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://research.tue.nl/en/publications/383c8553-39ea-4e30-8edc-6faed67f6ada","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111608674","display_name":"R. de Vries","orcid":null},"institutions":[{"id":"https://openalex.org/I4210131230","display_name":"Philips (United States)","ror":"https://ror.org/03kw6wr76","country_code":"US","type":"company","lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210131230"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"R. De Vries","raw_affiliation_strings":["Philips Semiconductors, 811 E. Arques Ave, Sunnyvale, CA, 94088-3409, USA"],"affiliations":[{"raw_affiliation_string":"Philips Semiconductors, 811 E. Arques Ave, Sunnyvale, CA, 94088-3409, USA","institution_ids":["https://openalex.org/I4210131230"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110900927","display_name":"A. J. E. M. Janssen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"A.J.E.M. Janssen","raw_affiliation_strings":["Philips Research Lab., Prof. Holstlaan 4, 5656 AA, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Philips Research Lab., Prof. Holstlaan 4, 5656 AA, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5111608674"],"corresponding_institution_ids":["https://openalex.org/I4210131230"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.4048,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.76755588,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"15","issue":"1-2","first_page":"23","last_page":"29"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.975600004196167,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.975600004196167,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9690999984741211,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9128999710083008,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dither","display_name":"Dither","score":0.8422925472259521},{"id":"https://openalex.org/keywords/subtractive-color","display_name":"Subtractive color","score":0.7191469669342041},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.6518062353134155},{"id":"https://openalex.org/keywords/rounding","display_name":"Rounding","score":0.6375572085380554},{"id":"https://openalex.org/keywords/amplitude-distortion","display_name":"Amplitude distortion","score":0.48378607630729675},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.4794953465461731},{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"Total harmonic distortion","score":0.46343690156936646},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45967724919319153},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.4452039897441864},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4443354308605194},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3972741663455963},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34850937128067017},{"id":"https://openalex.org/keywords/nonlinear-distortion","display_name":"Nonlinear distortion","score":0.3373821973800659},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3346402049064636},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.33379945158958435},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3232586979866028},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22203093767166138},{"id":"https://openalex.org/keywords/noise-shaping","display_name":"Noise shaping","score":0.21184468269348145},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.14629888534545898},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1326756775379181},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10047537088394165},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.0732012391090393}],"concepts":[{"id":"https://openalex.org/C70451592","wikidata":"https://www.wikidata.org/wiki/Q376493","display_name":"Dither","level":3,"score":0.8422925472259521},{"id":"https://openalex.org/C150799807","wikidata":"https://www.wikidata.org/wiki/Q374081","display_name":"Subtractive color","level":2,"score":0.7191469669342041},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.6518062353134155},{"id":"https://openalex.org/C136625980","wikidata":"https://www.wikidata.org/wiki/Q663208","display_name":"Rounding","level":2,"score":0.6375572085380554},{"id":"https://openalex.org/C201154478","wikidata":"https://www.wikidata.org/wiki/Q4748515","display_name":"Amplitude distortion","level":5,"score":0.48378607630729675},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.4794953465461731},{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.46343690156936646},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45967724919319153},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.4452039897441864},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4443354308605194},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3972741663455963},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34850937128067017},{"id":"https://openalex.org/C173413354","wikidata":"https://www.wikidata.org/wiki/Q7049470","display_name":"Nonlinear distortion","level":4,"score":0.3373821973800659},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3346402049064636},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.33379945158958435},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3232586979866028},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22203093767166138},{"id":"https://openalex.org/C9083635","wikidata":"https://www.wikidata.org/wiki/Q2133535","display_name":"Noise shaping","level":2,"score":0.21184468269348145},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.14629888534545898},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1326756775379181},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10047537088394165},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0732012391090393},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1023/a:1008395125678","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008395125678","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:pure.tue.nl:openaire/383c8553-39ea-4e30-8edc-6faed67f6ada","is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/383c8553-39ea-4e30-8edc-6faed67f6ada","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Vries, de, R & Janssen, A J E M 1999, 'Decreasing the sensitivity of ADC test parameters by means of wobbling', Journal of Electronic Testing : Theory and Applications, vol. 15, no. 1, pp. 23-29. https://doi.org/10.1023/A:1008395125678","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:tue:oai:pure.tue.nl:publications/383c8553-39ea-4e30-8edc-6faed67f6ada","is_oa":true,"landing_page_url":"https://research.tue.nl/nl/publications/383c8553-39ea-4e30-8edc-6faed67f6ada","pdf_url":"https://research.tue.nl/nl/publications/383c8553-39ea-4e30-8edc-6faed67f6ada","source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing : Theory and Applications, 15(1), 23 - 29. Springer","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:pure.tue.nl:openaire/383c8553-39ea-4e30-8edc-6faed67f6ada","is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/383c8553-39ea-4e30-8edc-6faed67f6ada","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Vries, de, R & Janssen, A J E M 1999, 'Decreasing the sensitivity of ADC test parameters by means of wobbling', Journal of Electronic Testing : Theory and Applications, vol. 15, no. 1, pp. 23-29. https://doi.org/10.1023/A:1008395125678","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1494738794","https://openalex.org/W1580872065","https://openalex.org/W1982697965","https://openalex.org/W2097987516","https://openalex.org/W2116910964","https://openalex.org/W2151257599","https://openalex.org/W2293423476","https://openalex.org/W6634683573"],"related_works":["https://openalex.org/W2418428616","https://openalex.org/W2375273197","https://openalex.org/W2503119535","https://openalex.org/W2515931684","https://openalex.org/W1561097362","https://openalex.org/W2543986011","https://openalex.org/W2378754589","https://openalex.org/W3134441632","https://openalex.org/W3148644222","https://openalex.org/W2185780713"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2020-04-03T00:00:00"}