{"id":"https://openalex.org/W3163480844","doi":"https://doi.org/10.1023/a:1008378912411","title":"On Random Pattern Testability of Cryptographic VLSI Cores","display_name":"On Random Pattern Testability of Cryptographic VLSI Cores","publication_year":2000,"publication_date":"2000-06-01","ids":{"openalex":"https://openalex.org/W3163480844","doi":"https://doi.org/10.1023/a:1008378912411","mag":"3163480844"},"language":"en","primary_location":{"id":"doi:10.1023/a:1008378912411","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008378912411","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101864044","display_name":"A. Schubert","orcid":"https://orcid.org/0009-0003-4810-3551"},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"A. Schubert","raw_affiliation_strings":["Institut f\u00fcr Theoretische Elektrotechnik und Mikroelektronik (ITEM), University of Bremen, P.O. Box 330440, D-28334, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Theoretische Elektrotechnik und Mikroelektronik (ITEM), University of Bremen, P.O. Box 330440, D-28334, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083499070","display_name":"W. Anheier","orcid":null},"institutions":[{"id":"https://openalex.org/I180437899","display_name":"University of Bremen","ror":"https://ror.org/04ers2y35","country_code":"DE","type":"education","lineage":["https://openalex.org/I180437899"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"W. Anheier","raw_affiliation_strings":["Institut f\u00fcr Theoretische Elektrotechnik und Mikroelektronik (ITEM), University of Bremen, P.O. Box 330440, D-28334, Bremen, Germany"],"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Theoretische Elektrotechnik und Mikroelektronik (ITEM), University of Bremen, P.O. Box 330440, D-28334, Bremen, Germany","institution_ids":["https://openalex.org/I180437899"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5101864044"],"corresponding_institution_ids":["https://openalex.org/I180437899"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.37904718,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"16","issue":"3","first_page":"185","last_page":"192"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9496999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pseudorandom-number-generator","display_name":"Pseudorandom number generator","score":0.8290068507194519},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6997715830802917},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.6581540703773499},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.6287097930908203},{"id":"https://openalex.org/keywords/block-cipher","display_name":"Block cipher","score":0.6238558888435364},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.5006365776062012},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4586676359176636},{"id":"https://openalex.org/keywords/pseudorandom-function-family","display_name":"Pseudorandom function family","score":0.4478314518928528},{"id":"https://openalex.org/keywords/encryption","display_name":"Encryption","score":0.4406471848487854},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4283455014228821},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.346660315990448},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.33148252964019775},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2079281210899353},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18599772453308105}],"concepts":[{"id":"https://openalex.org/C140642157","wikidata":"https://www.wikidata.org/wiki/Q1623338","display_name":"Pseudorandom number generator","level":2,"score":0.8290068507194519},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6997715830802917},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6581540703773499},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.6287097930908203},{"id":"https://openalex.org/C106544461","wikidata":"https://www.wikidata.org/wiki/Q543151","display_name":"Block cipher","level":3,"score":0.6238558888435364},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.5006365776062012},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4586676359176636},{"id":"https://openalex.org/C178774983","wikidata":"https://www.wikidata.org/wiki/Q734896","display_name":"Pseudorandom function family","level":3,"score":0.4478314518928528},{"id":"https://openalex.org/C148730421","wikidata":"https://www.wikidata.org/wiki/Q141090","display_name":"Encryption","level":2,"score":0.4406471848487854},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4283455014228821},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.346660315990448},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.33148252964019775},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2079281210899353},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18599772453308105},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1023/a:1008378912411","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008378912411","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1492619099","https://openalex.org/W1515082873","https://openalex.org/W1585665690"],"related_works":["https://openalex.org/W2148555789","https://openalex.org/W2523211787","https://openalex.org/W1484296207","https://openalex.org/W2087400319","https://openalex.org/W1576065320","https://openalex.org/W2362191648","https://openalex.org/W1600807921","https://openalex.org/W1972464518","https://openalex.org/W2077300005","https://openalex.org/W2129499974"],"abstract_inverted_index":null,"counts_by_year":[{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2021-05-24T00:00:00"}