{"id":"https://openalex.org/W3016724731","doi":"https://doi.org/10.1023/a:1008374811502","title":"Deterministic BIST with Partial Scan","display_name":"Deterministic BIST with Partial Scan","publication_year":2000,"publication_date":"2000-06-01","ids":{"openalex":"https://openalex.org/W3016724731","doi":"https://doi.org/10.1023/a:1008374811502","mag":"3016724731"},"language":"en","primary_location":{"id":"doi:10.1023/a:1008374811502","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008374811502","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074916200","display_name":"Gundolf Kiefer","orcid":null},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Gundolf Kiefer","raw_affiliation_strings":["Computer Architecture Lab, University of Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Architecture Lab, University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008775226","display_name":"Hans-Joachim Wunderlich","orcid":"https://orcid.org/0000-0003-4536-8290"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hans-Joachim Wunderlich","raw_affiliation_strings":["Computer Architecture Lab, University of Stuttgart, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Architecture Lab, University of Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I100066346"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.3877,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.73116999,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"16","issue":"3","first_page":"169","last_page":"177"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9355999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.7278556823730469},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.7210501432418823},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5773685574531555},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.49284911155700684},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4857940673828125},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4634734094142914},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.43675506114959717},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3808578848838806},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.34696730971336365},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.2834215760231018}],"concepts":[{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.7278556823730469},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.7210501432418823},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5773685574531555},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.49284911155700684},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4857940673828125},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4634734094142914},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.43675506114959717},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3808578848838806},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.34696730971336365},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.2834215760231018},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1023/a:1008374811502","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008374811502","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:informatik.uni-stuttgart.de:ART-2000-18","is_oa":false,"landing_page_url":"http://www2.informatik.uni-stuttgart.de/cgi-bin/NCSTRL/NCSTRL_view.pl?id=ART-2000-18&engl=1","pdf_url":null,"source":{"id":"https://openalex.org/S4306401306","display_name":"Fachbereich Informatik (University of Stuttgart)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I100066346","host_organization_name":"University of Stuttgart","host_organization_lineage":["https://openalex.org/I100066346"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"\\n In: Journal of Electronic Testing - Theory and Applications (JETTA).\\n Vol. 16(3), pp. 169-177\\n","raw_type":"Text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W327215","https://openalex.org/W154493537","https://openalex.org/W1975442866","https://openalex.org/W2030106932","https://openalex.org/W2069650309","https://openalex.org/W2097973512","https://openalex.org/W2098300587","https://openalex.org/W2104478015","https://openalex.org/W2105761964","https://openalex.org/W2106669085","https://openalex.org/W2111667834","https://openalex.org/W2113524639","https://openalex.org/W2116254096","https://openalex.org/W2124629389","https://openalex.org/W2124731399","https://openalex.org/W2135129887","https://openalex.org/W2137549092","https://openalex.org/W2140826730","https://openalex.org/W2144033909","https://openalex.org/W2152406824","https://openalex.org/W2156809456","https://openalex.org/W2160162958","https://openalex.org/W2401610261","https://openalex.org/W4230343699","https://openalex.org/W4246972245","https://openalex.org/W4247591377","https://openalex.org/W6600011832"],"related_works":["https://openalex.org/W2620506035","https://openalex.org/W2168810991","https://openalex.org/W201174846","https://openalex.org/W2386562503","https://openalex.org/W2110779944","https://openalex.org/W4253215698","https://openalex.org/W2121199343","https://openalex.org/W2105536286","https://openalex.org/W1602344805","https://openalex.org/W2111641757"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2020-04-24T00:00:00"}