{"id":"https://openalex.org/W129982019","doi":"https://doi.org/10.1023/a:1008332723359","title":"On Non-Statistical Techniques for Fast Fault Coverage Estimation","display_name":"On Non-Statistical Techniques for Fast Fault Coverage Estimation","publication_year":1999,"publication_date":"1999-12-01","ids":{"openalex":"https://openalex.org/W129982019","doi":"https://doi.org/10.1023/a:1008332723359","mag":"129982019"},"language":"en","primary_location":{"id":"doi:10.1023/a:1008332723359","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008332723359","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108516165","display_name":"Michael S. Hsiao","orcid":null},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]},{"id":"https://openalex.org/I4210109165","display_name":"Environmental and Occupational Health Sciences Institute","ror":"https://ror.org/01vta4r13","country_code":"US","type":"education","lineage":["https://openalex.org/I4210109165"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Michael S. Hsiao","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ, 08854-8058","Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ 08854-8058. mhsiao@ece.rutgers.edu#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ, 08854-8058","institution_ids":["https://openalex.org/I102322142","https://openalex.org/I4210109165"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ 08854-8058. mhsiao@ece.rutgers.edu#TAB#","institution_ids":["https://openalex.org/I102322142"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5108516165"],"corresponding_institution_ids":["https://openalex.org/I102322142","https://openalex.org/I4210109165"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.03013786,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"15","issue":"3","first_page":"239","last_page":"254"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9336000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6306491494178772},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6278870105743408},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6047438383102417},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5714529752731323},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5582380890846252},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.50668865442276},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.49361860752105713},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.41967514157295227},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3763386011123657},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.33692246675491333},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.324264258146286},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18456703424453735},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.07255449891090393},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.057338207960128784},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.05207902193069458}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6306491494178772},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6278870105743408},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6047438383102417},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5714529752731323},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5582380890846252},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.50668865442276},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.49361860752105713},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.41967514157295227},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3763386011123657},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.33692246675491333},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.324264258146286},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18456703424453735},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.07255449891090393},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.057338207960128784},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.05207902193069458},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1023/a:1008332723359","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008332723359","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1554885925","https://openalex.org/W1899662483","https://openalex.org/W1964801859","https://openalex.org/W1964839541","https://openalex.org/W1978303825","https://openalex.org/W2074094683","https://openalex.org/W2093079979","https://openalex.org/W2097293950","https://openalex.org/W2107737008","https://openalex.org/W2111891776","https://openalex.org/W2118032958","https://openalex.org/W2134076825","https://openalex.org/W2135931142","https://openalex.org/W2143744297","https://openalex.org/W2151599823","https://openalex.org/W2152406824","https://openalex.org/W2153806029","https://openalex.org/W2153914893","https://openalex.org/W3148474785","https://openalex.org/W3149357776","https://openalex.org/W4230587734","https://openalex.org/W4253517522","https://openalex.org/W6676416089"],"related_works":["https://openalex.org/W2130922779","https://openalex.org/W2082366402","https://openalex.org/W1607312467","https://openalex.org/W2120242933","https://openalex.org/W1657300322","https://openalex.org/W2055295790","https://openalex.org/W2083209667","https://openalex.org/W2743480384","https://openalex.org/W2185394135","https://openalex.org/W3155997325"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2016-06-24T00:00:00"}