{"id":"https://openalex.org/W143503425","doi":"https://doi.org/10.1023/a:1008325420970","title":"Catastrophic Short and Open Fault Detection in Bipolar CML Circuits: A Case Study","display_name":"Catastrophic Short and Open Fault Detection in Bipolar CML Circuits: A Case Study","publication_year":2000,"publication_date":"2000-12-01","ids":{"openalex":"https://openalex.org/W143503425","doi":"https://doi.org/10.1023/a:1008325420970","mag":"143503425"},"language":"en","primary_location":{"id":"doi:10.1023/a:1008325420970","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008325420970","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062724257","display_name":"A. Ivanov","orcid":"https://orcid.org/0000-0002-0882-6750"},"institutions":[{"id":"https://openalex.org/I141945490","display_name":"University of British Columbia","ror":"https://ror.org/03rmrcq20","country_code":"CA","type":"education","lineage":["https://openalex.org/I141945490"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Andr\u00e9 Ivanov","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of British Columbia, 2356 Main Mall, Vancouver, B.C., V6T IZ4, Canada. ivanov@ece.ubc.ca#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of British Columbia, 2356 Main Mall, Vancouver, B.C., V6T IZ4, Canada. ivanov@ece.ubc.ca#TAB#","institution_ids":["https://openalex.org/I141945490"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034249149","display_name":"Vikram Devdas","orcid":null},"institutions":[{"id":"https://openalex.org/I141945490","display_name":"University of British Columbia","ror":"https://ror.org/03rmrcq20","country_code":"CA","type":"education","lineage":["https://openalex.org/I141945490"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Vikram Devdas","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of British Columbia, 2356 Main Mall, Vancouver, B.C., V6T IZ4, Canada.#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of British Columbia, 2356 Main Mall, Vancouver, B.C., V6T IZ4, Canada.#TAB#","institution_ids":["https://openalex.org/I141945490"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5062724257"],"corresponding_institution_ids":["https://openalex.org/I141945490"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.01803885,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"16","issue":"6","first_page":"631","last_page":"634"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9107999801635742,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9107999801635742,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.04690000042319298,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.013100000098347664,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/synchronous-optical-networking","display_name":"Synchronous optical networking","score":0.7869421243667603},{"id":"https://openalex.org/keywords/current-mode-logic","display_name":"Current-mode logic","score":0.6183369159698486},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.522729218006134},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.44567161798477173},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3984775245189667},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3706299662590027},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3474644422531128},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3445179760456085},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.32029372453689575},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30385786294937134},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.24254029989242554},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24082010984420776},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.19768697023391724}],"concepts":[{"id":"https://openalex.org/C198306430","wikidata":"https://www.wikidata.org/wiki/Q51823","display_name":"Synchronous optical networking","level":2,"score":0.7869421243667603},{"id":"https://openalex.org/C2780295579","wikidata":"https://www.wikidata.org/wiki/Q5195108","display_name":"Current-mode logic","level":3,"score":0.6183369159698486},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.522729218006134},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.44567161798477173},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3984775245189667},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3706299662590027},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3474644422531128},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3445179760456085},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.32029372453689575},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30385786294937134},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.24254029989242554},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24082010984420776},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.19768697023391724}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1023/a:1008325420970","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008325420970","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5600000023841858,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1569555474","https://openalex.org/W2079402470","https://openalex.org/W2157446347","https://openalex.org/W2160076932","https://openalex.org/W2291260092"],"related_works":["https://openalex.org/W2049889603","https://openalex.org/W2136406454","https://openalex.org/W2901267638","https://openalex.org/W2056314744","https://openalex.org/W2171302144","https://openalex.org/W2171305391","https://openalex.org/W2061966795","https://openalex.org/W2511749978","https://openalex.org/W1558283416","https://openalex.org/W2757601177"],"abstract_inverted_index":null,"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}