{"id":"https://openalex.org/W180695524","doi":"https://doi.org/10.1023/a:1008314320628","title":"A Method for Designing a Deterministic Test Pattern Generator Based on Cellular Automata","display_name":"A Method for Designing a Deterministic Test Pattern Generator Based on Cellular Automata","publication_year":1999,"publication_date":"1999-06-01","ids":{"openalex":"https://openalex.org/W180695524","doi":"https://doi.org/10.1023/a:1008314320628","mag":"180695524"},"language":"en","primary_location":{"id":"doi:10.1023/a:1008314320628","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008314320628","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101527907","display_name":"Mar\u00eda Jos\u00e9 Gonz\u00e1lez L\u00f3pez","orcid":"https://orcid.org/0000-0003-2519-5812"},"institutions":[{"id":"https://openalex.org/I13134134","display_name":"Universidad de Cantabria","ror":"https://ror.org/046ffzj20","country_code":"ES","type":"education","lineage":["https://openalex.org/I13134134"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Mar\u00eda Jos\u00e9 L\u00f3pez","raw_affiliation_strings":["TEISA Department, University of Cantabria, E.T.S.I.I.T., Avda. de los Castros, s/n, 39005, Santander, Spain","TEISA Department, University of Cantabria, E.T.S.I.I.T., Avda. de los Castros, s/n 39005 Santander Spain. lopez@teisa.unican.es"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TEISA Department, University of Cantabria, E.T.S.I.I.T., Avda. de los Castros, s/n, 39005, Santander, Spain","institution_ids":["https://openalex.org/I13134134"]},{"raw_affiliation_string":"TEISA Department, University of Cantabria, E.T.S.I.I.T., Avda. de los Castros, s/n 39005 Santander Spain. lopez@teisa.unican.es","institution_ids":["https://openalex.org/I13134134"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079728472","display_name":"M. Mart\u00ednez","orcid":"https://orcid.org/0000-0001-5482-9242"},"institutions":[{"id":"https://openalex.org/I13134134","display_name":"Universidad de Cantabria","ror":"https://ror.org/046ffzj20","country_code":"ES","type":"education","lineage":["https://openalex.org/I13134134"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Mar Mart\u00ednez","raw_affiliation_strings":["TEISA Department, University of Cantabria, E.T.S.I.I.T., Avda. de los Castros, s/n, 39005, Santander, Spain","TEISA Department, University of Cantabria, E.T.S.I.I.T., Avda. de los Castros, s/n 39005 Santander Spain. martinez@teisa.unican.es#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TEISA Department, University of Cantabria, E.T.S.I.I.T., Avda. de los Castros, s/n, 39005, Santander, Spain","institution_ids":["https://openalex.org/I13134134"]},{"raw_affiliation_string":"TEISA Department, University of Cantabria, E.T.S.I.I.T., Avda. de los Castros, s/n 39005 Santander Spain. martinez@teisa.unican.es#TAB#","institution_ids":["https://openalex.org/I13134134"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103831882","display_name":"Salvador Bracho","orcid":null},"institutions":[{"id":"https://openalex.org/I13134134","display_name":"Universidad de Cantabria","ror":"https://ror.org/046ffzj20","country_code":"ES","type":"education","lineage":["https://openalex.org/I13134134"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Salvador Bracho","raw_affiliation_strings":["TEISA Department, University of Cantabria, E.T.S.I.I.T., Avda. de los Castros, s/n, 39005, Santander, Spain","TEISA Department, University of Cantabria, E.T.S.I.I.T., Avda. de los Castros, s/n 39005 Santander Spain. bracho@teisa.unican.es"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TEISA Department, University of Cantabria, E.T.S.I.I.T., Avda. de los Castros, s/n, 39005, Santander, Spain","institution_ids":["https://openalex.org/I13134134"]},{"raw_affiliation_string":"TEISA Department, University of Cantabria, E.T.S.I.I.T., Avda. de los Castros, s/n 39005 Santander Spain. bracho@teisa.unican.es","institution_ids":["https://openalex.org/I13134134"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I13134134"],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.03815325,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":"3","first_page":"245","last_page":"258"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12162","display_name":"Cellular Automata and Applications","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.71323561668396},{"id":"https://openalex.org/keywords/vhdl","display_name":"VHDL","score":0.6957042217254639},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5812239050865173},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.5642194747924805},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5157642364501953},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4920734763145447},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.48277750611305237},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.4714190661907196},{"id":"https://openalex.org/keywords/digital-pattern-generator","display_name":"Digital pattern generator","score":0.44626376032829285},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.44127020239830017},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.42783859372138977},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4220025837421417},{"id":"https://openalex.org/keywords/cellular-automaton","display_name":"Cellular automaton","score":0.4107569754123688},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.32799845933914185},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.30574432015419006},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.27502208948135376},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.23822727799415588},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.23596477508544922},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.14283189177513123},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11232829093933105},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10264730453491211},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.10017812252044678}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.71323561668396},{"id":"https://openalex.org/C36941000","wikidata":"https://www.wikidata.org/wiki/Q209455","display_name":"VHDL","level":3,"score":0.6957042217254639},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5812239050865173},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.5642194747924805},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5157642364501953},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4920734763145447},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.48277750611305237},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.4714190661907196},{"id":"https://openalex.org/C151346624","wikidata":"https://www.wikidata.org/wiki/Q5276129","display_name":"Digital pattern generator","level":3,"score":0.44626376032829285},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.44127020239830017},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.42783859372138977},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4220025837421417},{"id":"https://openalex.org/C35527583","wikidata":"https://www.wikidata.org/wiki/Q189156","display_name":"Cellular automaton","level":2,"score":0.4107569754123688},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.32799845933914185},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.30574432015419006},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.27502208948135376},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.23822727799415588},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.23596477508544922},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.14283189177513123},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11232829093933105},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10264730453491211},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.10017812252044678},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1023/a:1008314320628","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008314320628","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W29127030","https://openalex.org/W36314620","https://openalex.org/W53566495","https://openalex.org/W1725132248","https://openalex.org/W1895251011","https://openalex.org/W1972369552","https://openalex.org/W2017067455","https://openalex.org/W2020092809","https://openalex.org/W2031058591","https://openalex.org/W2036424138","https://openalex.org/W2109319621","https://openalex.org/W2112214397","https://openalex.org/W2115303996","https://openalex.org/W2123357399","https://openalex.org/W2126693329","https://openalex.org/W2137362315","https://openalex.org/W2138530143","https://openalex.org/W2158154693","https://openalex.org/W2270317352","https://openalex.org/W4231274804","https://openalex.org/W4235798251","https://openalex.org/W4241244417","https://openalex.org/W4285719527","https://openalex.org/W6601491935","https://openalex.org/W6602162315"],"related_works":["https://openalex.org/W2091533492","https://openalex.org/W2082561435","https://openalex.org/W1588361197","https://openalex.org/W1991935474","https://openalex.org/W4319302805","https://openalex.org/W2341817401","https://openalex.org/W2162370517","https://openalex.org/W1953724919","https://openalex.org/W2914961374","https://openalex.org/W2128426877"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2016-06-24T00:00:00"}