{"id":"https://openalex.org/W146143826","doi":"https://doi.org/10.1023/a:1008313901938","title":"Test Set and Fault Partitioning Techniques for Static Test Sequence Compaction for Sequential Circuits","display_name":"Test Set and Fault Partitioning Techniques for Static Test Sequence Compaction for Sequential Circuits","publication_year":2000,"publication_date":"2000-08-01","ids":{"openalex":"https://openalex.org/W146143826","doi":"https://doi.org/10.1023/a:1008313901938","mag":"146143826"},"language":"en","primary_location":{"id":"doi:10.1023/a:1008313901938","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008313901938","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108516165","display_name":"Michael S. Hsiao","orcid":null},"institutions":[{"id":"https://openalex.org/I102322142","display_name":"Rutgers, The State University of New Jersey","ror":"https://ror.org/05vt9qd57","country_code":"US","type":"education","lineage":["https://openalex.org/I102322142"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael S. Hsiao","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ 08854-8058. mhsiao@ece.rutgers.edu#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ 08854-8058. mhsiao@ece.rutgers.edu#TAB#","institution_ids":["https://openalex.org/I102322142"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042424184","display_name":"Srimat Chakradhar","orcid":"https://orcid.org/0000-0003-3530-3901"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Srimat Chakradhar","raw_affiliation_strings":["Computer & Communications Research Lab., NEC USA, Princeton, NJ 08540. chak@ccrl.nj.nec.com#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer & Communications Research Lab., NEC USA, Princeton, NJ 08540. chak@ccrl.nj.nec.com#TAB#","institution_ids":["https://openalex.org/I118347220"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2990,"currency":"USD","value_usd":2990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.02024412,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"16","issue":"4","first_page":"329","last_page":"338"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.7547261118888855},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7296375632286072},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.7174291014671326},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.7076122760772705},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.604841411113739},{"id":"https://openalex.org/keywords/compaction","display_name":"Compaction","score":0.6035282015800476},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.5805931091308594},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5800658464431763},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5456039905548096},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5107269287109375},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.44500023126602173},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3271540105342865},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2860165536403656},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19107061624526978},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09480392932891846}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7547261118888855},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7296375632286072},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.7174291014671326},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.7076122760772705},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.604841411113739},{"id":"https://openalex.org/C196715460","wikidata":"https://www.wikidata.org/wiki/Q1414356","display_name":"Compaction","level":2,"score":0.6035282015800476},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.5805931091308594},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5800658464431763},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5456039905548096},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5107269287109375},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.44500023126602173},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3271540105342865},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2860165536403656},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19107061624526978},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09480392932891846},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C187320778","wikidata":"https://www.wikidata.org/wiki/Q1349130","display_name":"Geotechnical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1023/a:1008313901938","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008313901938","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W193103005","https://openalex.org/W1972479656","https://openalex.org/W2002339134","https://openalex.org/W2107737008","https://openalex.org/W2114923527","https://openalex.org/W2135931142","https://openalex.org/W2137843962","https://openalex.org/W2140817218","https://openalex.org/W2143744297","https://openalex.org/W2145007734","https://openalex.org/W2147556474","https://openalex.org/W2152406824","https://openalex.org/W2154175844","https://openalex.org/W2154178009","https://openalex.org/W2161913439","https://openalex.org/W2169702711","https://openalex.org/W2170139658","https://openalex.org/W2170656965","https://openalex.org/W2171438054","https://openalex.org/W2752885492","https://openalex.org/W3149357776","https://openalex.org/W4230587734","https://openalex.org/W4230759791","https://openalex.org/W4233760791","https://openalex.org/W4242575540","https://openalex.org/W4242736882","https://openalex.org/W4243200393","https://openalex.org/W4243599948","https://openalex.org/W4245940100"],"related_works":["https://openalex.org/W1588361197","https://openalex.org/W1991935474","https://openalex.org/W2091533492","https://openalex.org/W2098752843","https://openalex.org/W2154529098","https://openalex.org/W4285708951","https://openalex.org/W2408214455","https://openalex.org/W1953724919","https://openalex.org/W2019719714","https://openalex.org/W2151556234"],"abstract_inverted_index":null,"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2016-06-24T00:00:00"}