{"id":"https://openalex.org/W163757519","doi":"https://doi.org/10.1023/a:1008266305694","title":"Delay Fault Coverage Enhancement Using Variable Observation Times","display_name":"Delay Fault Coverage Enhancement Using Variable Observation Times","publication_year":1997,"publication_date":"1997-10-01","ids":{"openalex":"https://openalex.org/W163757519","doi":"https://doi.org/10.1023/a:1008266305694","mag":"163757519"},"language":"en","primary_location":{"id":"doi:10.1023/a:1008266305694","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008266305694","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110217608","display_name":"W.B. Jone","orcid":null},"institutions":[{"id":"https://openalex.org/I148099254","display_name":"National Chung Cheng University","ror":"https://ror.org/0028v3876","country_code":"TW","type":"education","lineage":["https://openalex.org/I148099254"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"W.B. Jone","raw_affiliation_strings":["Department of Computer Science and Information Engineering, National Chung-Cheng University, Chiayi, Taiwan R.O.C","Department of Computer Science and Information Engineering, National Chung-Cheng University, Chiayi, Taiwan R.O.C. E-mail: jone@cs.ccu.edu.tw, ho@cs.ccu.edu.tw"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, National Chung-Cheng University, Chiayi, Taiwan R.O.C","institution_ids":["https://openalex.org/I148099254"]},{"raw_affiliation_string":"Department of Computer Science and Information Engineering, National Chung-Cheng University, Chiayi, Taiwan R.O.C. E-mail: jone@cs.ccu.edu.tw, ho@cs.ccu.edu.tw","institution_ids":["https://openalex.org/I148099254"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114055762","display_name":"Yu-Hsuan Ho","orcid":null},"institutions":[{"id":"https://openalex.org/I148099254","display_name":"National Chung Cheng University","ror":"https://ror.org/0028v3876","country_code":"TW","type":"education","lineage":["https://openalex.org/I148099254"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Y.P. Ho","raw_affiliation_strings":["Department of Computer Science and Information Engineering, National Chung-Cheng University, Chiayi, Taiwan R.O.C","Department of Computer Science and Information Engineering, National Chung-Cheng University, Chiayi, Taiwan R.O.C. E-mail: jone@cs.ccu.edu.tw, ho@cs.ccu.edu.tw"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, National Chung-Cheng University, Chiayi, Taiwan R.O.C","institution_ids":["https://openalex.org/I148099254"]},{"raw_affiliation_string":"Department of Computer Science and Information Engineering, National Chung-Cheng University, Chiayi, Taiwan R.O.C. E-mail: jone@cs.ccu.edu.tw, ho@cs.ccu.edu.tw","institution_ids":["https://openalex.org/I148099254"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101921227","display_name":"S.R. Das","orcid":"https://orcid.org/0000-0002-0668-1981"},"institutions":[{"id":"https://openalex.org/I148099254","display_name":"National Chung Cheng University","ror":"https://ror.org/0028v3876","country_code":"TW","type":"education","lineage":["https://openalex.org/I148099254"]},{"id":"https://openalex.org/I153718931","display_name":"University of Ottawa","ror":"https://ror.org/03c4mmv16","country_code":"CA","type":"education","lineage":["https://openalex.org/I153718931"]}],"countries":["CA","TW"],"is_corresponding":true,"raw_author_name":"S.R. Das","raw_affiliation_strings":["Department of Computer Science and Information Engineering, National Chung-Cheng University, Chiayi, Taiwan R.O.C","Department of Electrical Engineering, University of Ottawa, Ottawa, Ontario K1n 6n4, Canada. E-mail: das@trix.genie.uottawa.ca#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, National Chung-Cheng University, Chiayi, Taiwan R.O.C","institution_ids":["https://openalex.org/I148099254"]},{"raw_affiliation_string":"Department of Electrical Engineering, University of Ottawa, Ottawa, Ontario K1n 6n4, Canada. E-mail: das@trix.genie.uottawa.ca#TAB#","institution_ids":["https://openalex.org/I153718931"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101921227","https://openalex.org/A5110217608"],"corresponding_institution_ids":["https://openalex.org/I148099254","https://openalex.org/I153718931"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":1.0456,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.7915,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"11","issue":"2","first_page":"131","last_page":"146"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6390752792358398},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5667794942855835},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.5617241263389587},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5410460829734802},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4961291253566742},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4601131081581116},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2937379479408264},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13766032457351685},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.082863450050354},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.07684457302093506}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6390752792358398},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5667794942855835},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5617241263389587},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5410460829734802},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4961291253566742},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4601131081581116},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2937379479408264},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13766032457351685},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.082863450050354},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.07684457302093506},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1023/a:1008266305694","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008266305694","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1554885925","https://openalex.org/W1967061303","https://openalex.org/W1988192422","https://openalex.org/W2005319125","https://openalex.org/W2096165491","https://openalex.org/W2096487899","https://openalex.org/W2096554094","https://openalex.org/W2098598480","https://openalex.org/W2106585148","https://openalex.org/W2108812492","https://openalex.org/W2110968362","https://openalex.org/W2112062619","https://openalex.org/W2116280612","https://openalex.org/W2118744758","https://openalex.org/W2119130057","https://openalex.org/W2124507438","https://openalex.org/W2125187803","https://openalex.org/W2128627202","https://openalex.org/W2135802341","https://openalex.org/W2137012712","https://openalex.org/W2147973376","https://openalex.org/W2149417654","https://openalex.org/W2149991436","https://openalex.org/W2543989790","https://openalex.org/W4234887147","https://openalex.org/W4238178324","https://openalex.org/W4243947484","https://openalex.org/W6678242351"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2021253405","https://openalex.org/W1986228509","https://openalex.org/W2147400189","https://openalex.org/W1600468096","https://openalex.org/W2340957901","https://openalex.org/W1991935474"],"abstract_inverted_index":null,"counts_by_year":[{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2016-06-24T00:00:00"}