{"id":"https://openalex.org/W1584543097","doi":"https://doi.org/10.1023/a:1008233907036","title":"Thermal Monitoring of Self-Checking Systems","display_name":"Thermal Monitoring of Self-Checking Systems","publication_year":1998,"publication_date":"1998-02-01","ids":{"openalex":"https://openalex.org/W1584543097","doi":"https://doi.org/10.1023/a:1008233907036","mag":"1584543097"},"language":"en","primary_location":{"id":"doi:10.1023/a:1008233907036","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008233907036","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/10183/218972","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013802649","display_name":"Vladim\u0131\u0301r Sz\u00e9kely","orcid":"https://orcid.org/0000-0003-2080-9678"},"institutions":[{"id":"https://openalex.org/I106118109","display_name":"E\u00f6tv\u00f6s Lor\u00e1nd University","ror":"https://ror.org/01jsq2704","country_code":"HU","type":"education","lineage":["https://openalex.org/I106118109"]},{"id":"https://openalex.org/I4210161853","display_name":"Budapest Institute","ror":"https://ror.org/050hvq478","country_code":"HU","type":"facility","lineage":["https://openalex.org/I4210161853"]}],"countries":["HU"],"is_corresponding":true,"raw_author_name":"V. Sz\u00e9kely","raw_affiliation_strings":["Department of Electron Devices, Technical University of Budapest, XI Goldmann Gy\u00f6rgy t\u00e9r 3, Budapest, H-1521, Hungary","Technical Univ. of Budapest, Budapest, Hungary#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electron Devices, Technical University of Budapest, XI Goldmann Gy\u00f6rgy t\u00e9r 3, Budapest, H-1521, Hungary","institution_ids":["https://openalex.org/I4210161853","https://openalex.org/I106118109"]},{"raw_affiliation_string":"Technical Univ. of Budapest, Budapest, Hungary#TAB#","institution_ids":["https://openalex.org/I4210161853","https://openalex.org/I106118109"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112893743","display_name":"M. Rencz","orcid":null},"institutions":[{"id":"https://openalex.org/I4210161853","display_name":"Budapest Institute","ror":"https://ror.org/050hvq478","country_code":"HU","type":"facility","lineage":["https://openalex.org/I4210161853"]},{"id":"https://openalex.org/I106118109","display_name":"E\u00f6tv\u00f6s Lor\u00e1nd University","ror":"https://ror.org/01jsq2704","country_code":"HU","type":"education","lineage":["https://openalex.org/I106118109"]}],"countries":["HU"],"is_corresponding":false,"raw_author_name":"M. Rencz","raw_affiliation_strings":["Department of Electron Devices, Technical University of Budapest, XI Goldmann Gy\u00f6rgy t\u00e9r 3, Budapest, H-1521, Hungary","Technical Univ. of Budapest, Budapest, Hungary#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electron Devices, Technical University of Budapest, XI Goldmann Gy\u00f6rgy t\u00e9r 3, Budapest, H-1521, Hungary","institution_ids":["https://openalex.org/I4210161853","https://openalex.org/I106118109"]},{"raw_affiliation_string":"Technical Univ. of Budapest, Budapest, Hungary#TAB#","institution_ids":["https://openalex.org/I4210161853","https://openalex.org/I106118109"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109233531","display_name":"J.M. Karam","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"J.M. Karam","raw_affiliation_strings":["TIMA, 46 Avenue F\u00e9lix Viallet, 38031, Grenoble Cedex, France","TIMA, Grenoble, France#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA, 46 Avenue F\u00e9lix Viallet, 38031, Grenoble Cedex, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA, Grenoble, France#TAB#","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109051779","display_name":"M. Lubaszewski","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Lubaszewski","raw_affiliation_strings":["TIMA, 46 Avenue F\u00e9lix Viallet, 38031, Grenoble Cedex, France","TIMA, Grenoble, France#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA, 46 Avenue F\u00e9lix Viallet, 38031, Grenoble Cedex, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA, Grenoble, France#TAB#","institution_ids":["https://openalex.org/I4210087012"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5106085308","display_name":"B. Courtois","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087012","display_name":"Techniques of Informatics and Microelectronics for Integrated Systems Architecture","ror":"https://ror.org/000063q30","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210087012","https://openalex.org/I4210159245","https://openalex.org/I899635006","https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"B. Courtois","raw_affiliation_strings":["TIMA, 46 Avenue F\u00e9lix Viallet, 38031, Grenoble Cedex, France","TIMA, Grenoble, France#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"TIMA, 46 Avenue F\u00e9lix Viallet, 38031, Grenoble Cedex, France","institution_ids":["https://openalex.org/I4210087012"]},{"raw_affiliation_string":"TIMA, Grenoble, France#TAB#","institution_ids":["https://openalex.org/I4210087012"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5013802649"],"corresponding_institution_ids":["https://openalex.org/I106118109","https://openalex.org/I4210161853"],"apc_list":{"value":2390,"currency":"EUR","value_usd":2990},"apc_paid":null,"fwci":2.2121,"has_fulltext":false,"cited_by_count":21,"citation_normalized_percentile":{"value":0.87506112,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"12","issue":"1-2","first_page":"81","last_page":"92"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overheating","display_name":"Overheating (electricity)","score":0.9085928797721863},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5068419575691223},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.5011696815490723},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.48820120096206665},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.42509615421295166},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29681089520454407},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2911219596862793},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1439666748046875}],"concepts":[{"id":"https://openalex.org/C2778284599","wikidata":"https://www.wikidata.org/wiki/Q25340000","display_name":"Overheating (electricity)","level":2,"score":0.9085928797721863},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5068419575691223},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.5011696815490723},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.48820120096206665},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.42509615421295166},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29681089520454407},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2911219596862793},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1439666748046875},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1023/a:1008233907036","is_oa":false,"landing_page_url":"https://doi.org/10.1023/a:1008233907036","pdf_url":null,"source":{"id":"https://openalex.org/S200807567","display_name":"Journal of Electronic Testing","issn_l":"0923-8174","issn":["0923-8174","1573-0727"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electronic Testing","raw_type":"journal-article"},{"id":"pmh:oai:www.lume.ufrgs.br:10183/218972","is_oa":true,"landing_page_url":"http://hdl.handle.net/10183/218972","pdf_url":null,"source":{"id":"https://openalex.org/S4306401468","display_name":"Lume (Universidade Federal do Rio Grande do Sul)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097146","host_organization_name":"Hospital de Cl\u00ednicas de Porto Alegre","host_organization_lineage":["https://openalex.org/I4210097146"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"instacron:UFRGS","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:HAL:hal-00007896v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00007896","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electronic Testing: : Theory and Applications, 1998, Feb.-April 1998; Volume 12, Numbers 1-2, pp.81-92. ⟨10.1023/A:1008233907036⟩","raw_type":"Journal articles"}],"best_oa_location":{"id":"pmh:oai:www.lume.ufrgs.br:10183/218972","is_oa":true,"landing_page_url":"http://hdl.handle.net/10183/218972","pdf_url":null,"source":{"id":"https://openalex.org/S4306401468","display_name":"Lume (Universidade Federal do Rio Grande do Sul)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210097146","host_organization_name":"Hospital de Cl\u00ednicas de Porto Alegre","host_organization_lineage":["https://openalex.org/I4210097146"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"instacron:UFRGS","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W183560287","https://openalex.org/W1511279643","https://openalex.org/W1564201208","https://openalex.org/W1567682942","https://openalex.org/W1570342004","https://openalex.org/W1582734741","https://openalex.org/W1672592200","https://openalex.org/W1884805277","https://openalex.org/W1959459420","https://openalex.org/W1966872721","https://openalex.org/W1991663910","https://openalex.org/W2023758271","https://openalex.org/W2028504835","https://openalex.org/W2034260569","https://openalex.org/W2034789965","https://openalex.org/W2041452980","https://openalex.org/W2052408697","https://openalex.org/W2055248005","https://openalex.org/W2076048321","https://openalex.org/W2083356181","https://openalex.org/W2098071322","https://openalex.org/W2144481067","https://openalex.org/W2160710178","https://openalex.org/W2171232284","https://openalex.org/W3143836336","https://openalex.org/W3211427399"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2380377017","https://openalex.org/W1811598931","https://openalex.org/W1523184867","https://openalex.org/W2391203258","https://openalex.org/W2354827036","https://openalex.org/W2057683340","https://openalex.org/W2043907596","https://openalex.org/W2752463234","https://openalex.org/W2354641548"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-05-07T13:39:58.223016","created_date":"2025-10-10T00:00:00"}