{"id":"https://openalex.org/W4210562780","doi":"https://doi.org/10.1017/s0890060421000342","title":"An ontology-based fault generation and fault propagation analysis approach for safety-critical computer systems at the design stage","display_name":"An ontology-based fault generation and fault propagation analysis approach for safety-critical computer systems at the design stage","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4210562780","doi":"https://doi.org/10.1017/s0890060421000342"},"language":"en","primary_location":{"id":"doi:10.1017/s0890060421000342","is_oa":true,"landing_page_url":"https://doi.org/10.1017/s0890060421000342","pdf_url":"https://www.cambridge.org/core/services/aop-cambridge-core/content/view/AD15034EFCC51B7E2165127CF53C89A5/S0890060421000342a.pdf/div-class-title-an-ontology-based-fault-generation-and-fault-propagation-analysis-approach-for-safety-critical-computer-systems-at-the-design-stage-div.pdf","source":{"id":"https://openalex.org/S4210193102","display_name":"Artificial intelligence for engineering design analysis and manufacturing","issn_l":"0890-0604","issn":["0890-0604","1469-1760"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Artificial Intelligence for Engineering Design, Analysis and Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://www.cambridge.org/core/services/aop-cambridge-core/content/view/AD15034EFCC51B7E2165127CF53C89A5/S0890060421000342a.pdf/div-class-title-an-ontology-based-fault-generation-and-fault-propagation-analysis-approach-for-safety-critical-computer-systems-at-the-design-stage-div.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075526306","display_name":"Xiaoxu Diao","orcid":"https://orcid.org/0000-0003-4672-6352"},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Xiaoxu Diao","raw_affiliation_strings":["The Ohio State University, 201 W. 19th AVE, Columbus, OH 43210, USA","The Ohio State University, 201 W. 19th AVE, Columbus, OH43210, USA"],"affiliations":[{"raw_affiliation_string":"The Ohio State University, 201 W. 19th AVE, Columbus, OH 43210, USA","institution_ids":["https://openalex.org/I52357470"]},{"raw_affiliation_string":"The Ohio State University, 201 W. 19th AVE, Columbus, OH43210, USA","institution_ids":["https://openalex.org/I52357470"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089798729","display_name":"Mike Pietrykowski","orcid":null},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mike Pietrykowski","raw_affiliation_strings":["The Ohio State University, 201 W. 19th AVE, Columbus, OH 43210, USA","The Ohio State University, 201 W. 19th AVE, Columbus, OH43210, USA"],"affiliations":[{"raw_affiliation_string":"The Ohio State University, 201 W. 19th AVE, Columbus, OH 43210, USA","institution_ids":["https://openalex.org/I52357470"]},{"raw_affiliation_string":"The Ohio State University, 201 W. 19th AVE, Columbus, OH43210, USA","institution_ids":["https://openalex.org/I52357470"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040598834","display_name":"Fuqun Huang","orcid":"https://orcid.org/0000-0001-7973-5808"},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fuqun Huang","raw_affiliation_strings":["The Ohio State University, 201 W. 19th AVE, Columbus, OH 43210, USA","The Ohio State University, 201 W. 19th AVE, Columbus, OH43210, USA"],"affiliations":[{"raw_affiliation_string":"The Ohio State University, 201 W. 19th AVE, Columbus, OH 43210, USA","institution_ids":["https://openalex.org/I52357470"]},{"raw_affiliation_string":"The Ohio State University, 201 W. 19th AVE, Columbus, OH43210, USA","institution_ids":["https://openalex.org/I52357470"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004014102","display_name":"Chetan Mutha","orcid":null},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chetan Mutha","raw_affiliation_strings":["The Ohio State University, 201 W. 19th AVE, Columbus, OH 43210, USA","The Ohio State University, 201 W. 19th AVE, Columbus, OH43210, USA"],"affiliations":[{"raw_affiliation_string":"The Ohio State University, 201 W. 19th AVE, Columbus, OH 43210, USA","institution_ids":["https://openalex.org/I52357470"]},{"raw_affiliation_string":"The Ohio State University, 201 W. 19th AVE, Columbus, OH43210, USA","institution_ids":["https://openalex.org/I52357470"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085970288","display_name":"Carol Smidts","orcid":"https://orcid.org/0000-0001-7867-023X"},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Carol Smidts","raw_affiliation_strings":["The Ohio State University, 201 W. 19th AVE, Columbus, OH 43210, USA","The Ohio State University, 201 W. 19th AVE, Columbus, OH43210, USA"],"affiliations":[{"raw_affiliation_string":"The Ohio State University, 201 W. 19th AVE, Columbus, OH 43210, USA","institution_ids":["https://openalex.org/I52357470"]},{"raw_affiliation_string":"The Ohio State University, 201 W. 19th AVE, Columbus, OH43210, USA","institution_ids":["https://openalex.org/I52357470"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5075526306"],"corresponding_institution_ids":["https://openalex.org/I52357470"],"apc_list":null,"apc_paid":null,"fwci":2.2015,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.86654252,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"36","issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6485521793365479},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.5776589512825012},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5711336731910706},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.5423941612243652},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5123051404953003},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4978067874908447},{"id":"https://openalex.org/keywords/life-critical-system","display_name":"Life-critical system","score":0.49274805188179016},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.45539915561676025},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4369758367538452},{"id":"https://openalex.org/keywords/ontology","display_name":"Ontology","score":0.43507298827171326},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.43483391404151917},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.43245214223861694},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.39688968658447266},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.3966461420059204},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.36760300397872925},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22271466255187988},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1395418345928192},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.0953669548034668}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6485521793365479},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.5776589512825012},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5711336731910706},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.5423941612243652},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5123051404953003},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4978067874908447},{"id":"https://openalex.org/C163707989","wikidata":"https://www.wikidata.org/wiki/Q1996307","display_name":"Life-critical system","level":3,"score":0.49274805188179016},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.45539915561676025},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4369758367538452},{"id":"https://openalex.org/C25810664","wikidata":"https://www.wikidata.org/wiki/Q44325","display_name":"Ontology","level":2,"score":0.43507298827171326},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.43483391404151917},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.43245214223861694},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.39688968658447266},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.3966461420059204},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.36760300397872925},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22271466255187988},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1395418345928192},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0953669548034668},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1017/s0890060421000342","is_oa":true,"landing_page_url":"https://doi.org/10.1017/s0890060421000342","pdf_url":"https://www.cambridge.org/core/services/aop-cambridge-core/content/view/AD15034EFCC51B7E2165127CF53C89A5/S0890060421000342a.pdf/div-class-title-an-ontology-based-fault-generation-and-fault-propagation-analysis-approach-for-safety-critical-computer-systems-at-the-design-stage-div.pdf","source":{"id":"https://openalex.org/S4210193102","display_name":"Artificial intelligence for engineering design analysis and manufacturing","issn_l":"0890-0604","issn":["0890-0604","1469-1760"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Artificial Intelligence for Engineering Design, Analysis and Manufacturing","raw_type":"journal-article"},{"id":"pmh:oai:osti.gov:1843513","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1843513","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},{"id":"pmh:oai:osti.gov:1981810","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1981810","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"doi:10.1017/s0890060421000342","is_oa":true,"landing_page_url":"https://doi.org/10.1017/s0890060421000342","pdf_url":"https://www.cambridge.org/core/services/aop-cambridge-core/content/view/AD15034EFCC51B7E2165127CF53C89A5/S0890060421000342a.pdf/div-class-title-an-ontology-based-fault-generation-and-fault-propagation-analysis-approach-for-safety-critical-computer-systems-at-the-design-stage-div.pdf","source":{"id":"https://openalex.org/S4210193102","display_name":"Artificial intelligence for engineering design analysis and manufacturing","issn_l":"0890-0604","issn":["0890-0604","1469-1760"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310311721","host_organization_name":"Cambridge University Press","host_organization_lineage":["https://openalex.org/P4310311721","https://openalex.org/P4310311702"],"host_organization_lineage_names":["Cambridge University Press","University of Cambridge"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Artificial Intelligence for Engineering Design, Analysis and Manufacturing","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2782353421","display_name":null,"funder_award_id":"(ARPA-E)","funder_id":"https://openalex.org/F4320332276","funder_display_name":"Advanced Research Projects Agency - Energy"}],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320332276","display_name":"Advanced Research Projects Agency - Energy","ror":"https://ror.org/03q1rgc19"},{"id":"https://openalex.org/F4320332815","display_name":"Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"},{"id":"https://openalex.org/F4320338279","display_name":"Air Force Office of Scientific Research","ror":"https://ror.org/011e9bt93"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4210562780.pdf","grobid_xml":"https://content.openalex.org/works/W4210562780.grobid-xml"},"referenced_works_count":44,"referenced_works":["https://openalex.org/W166521425","https://openalex.org/W1100957899","https://openalex.org/W1497313266","https://openalex.org/W1617557841","https://openalex.org/W1667843264","https://openalex.org/W1981514768","https://openalex.org/W1990396483","https://openalex.org/W1992534129","https://openalex.org/W2003007107","https://openalex.org/W2005383221","https://openalex.org/W2021696583","https://openalex.org/W2030180265","https://openalex.org/W2079090978","https://openalex.org/W2090886888","https://openalex.org/W2094042081","https://openalex.org/W2094486430","https://openalex.org/W2099880542","https://openalex.org/W2110189958","https://openalex.org/W2117003432","https://openalex.org/W2119907556","https://openalex.org/W2125424208","https://openalex.org/W2137351629","https://openalex.org/W2145071552","https://openalex.org/W2146878883","https://openalex.org/W2163025340","https://openalex.org/W2165165066","https://openalex.org/W2205106151","https://openalex.org/W2261812172","https://openalex.org/W2340060637","https://openalex.org/W2396918837","https://openalex.org/W2612833832","https://openalex.org/W2766679380","https://openalex.org/W2792938677","https://openalex.org/W2888609085","https://openalex.org/W2923191064","https://openalex.org/W2966563969","https://openalex.org/W3023641965","https://openalex.org/W3093840748","https://openalex.org/W4231944131","https://openalex.org/W6602303454","https://openalex.org/W6650699703","https://openalex.org/W6712575616","https://openalex.org/W6784261873","https://openalex.org/W6837515404"],"related_works":["https://openalex.org/W2971479921","https://openalex.org/W2098626762","https://openalex.org/W4285207289","https://openalex.org/W2355966237","https://openalex.org/W4312447017","https://openalex.org/W2742111403","https://openalex.org/W2032374522","https://openalex.org/W2083209667","https://openalex.org/W4300923837","https://openalex.org/W2121043529"],"abstract_inverted_index":{"Abstract":[0],"Fault":[1],"propagation":[2,56,69,88,158],"analysis":[3,146],"is":[4,78,153,166],"a":[5,16,102],"process":[6],"used":[7],"to":[8,40,45,63,138],"determine":[9,54],"the":[10,33,67,84,99,109,150,170],"consequences":[11],"of":[12,24,91,98,101,155,172],"faults":[13,34,93],"residing":[14],"in":[15,36,66,168],"computer":[17,21,103,143],"system.":[18,104,144],"A":[19],"typical":[20],"system":[22,114],"consists":[23],"diverse":[25,42,50,92],"components":[26,38,59,164],"(e.g.,":[27],"electronic":[28],"and":[29,47,52,87,116,119,135,162,165],"software":[30,161],"components),":[31],"thus,":[32],"contained":[35],"these":[37],"tend":[39],"possess":[41],"characteristics.":[43],"How":[44],"describe":[46],"model":[48],"such":[49],"faults,":[51],"further":[53],"fault":[55,68,157],"through":[57,89,160],"different":[58],"are":[60],"challenging":[61],"problems":[62],"be":[64],"addressed":[65],"analysis.":[70],"This":[71],"paper":[72],"proposes":[73],"an":[74,79,95,132,140],"ontology-based":[75],"approach,":[76],"which":[77],"integrated":[80],"method":[81],"allowing":[82],"for":[83],"generation,":[85],"injection,":[86],"inference":[90],"at":[94],"early":[96],"stage":[97],"design":[100,124],"The":[105,145],"results":[106],"generated":[107],"by":[108],"proposed":[110,151],"framework":[111,134,152],"can":[112],"verify":[113],"robustness":[115],"identify":[117],"safety":[118],"reliability":[120],"risks":[121],"with":[122],"limited":[123],"level":[125],"information.":[126],"In":[127],"this":[128],"paper,":[129],"we":[130],"propose":[131],"ontological":[133],"its":[136],"application":[137],"analyze":[139],"example":[141],"safety-critical":[142],"result":[147],"shows":[148],"that":[149],"capable":[154],"inferring":[156],"paths":[159],"hardware":[163],"effective":[167],"predicting":[169],"impact":[171],"faults.":[173]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2022,"cited_by_count":1}],"updated_date":"2026-04-10T15:06:20.359241","created_date":"2025-10-10T00:00:00"}