{"id":"https://openalex.org/W2086897666","doi":"https://doi.org/10.1016/s0026-2714(02)00178-6","title":"Electrical characteristics of high-energy proton irradiated ultra-thin gate oxides","display_name":"Electrical characteristics of high-energy proton irradiated ultra-thin gate oxides","publication_year":2002,"publication_date":"2002-09-01","ids":{"openalex":"https://openalex.org/W2086897666","doi":"https://doi.org/10.1016/s0026-2714(02)00178-6","mag":"2086897666"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(02)00178-6","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00178-6","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://digital.csic.es/bitstream/10261/256995/1/paper35_Esref02.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043936121","display_name":"J.M. Raf\u0131\u0301","orcid":"https://orcid.org/0000-0003-4581-9477"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"J.M. Raf\u0131\u0301","raw_affiliation_strings":["Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain"],"affiliations":[{"raw_affiliation_string":"Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070948992","display_name":"B. Vergnet","orcid":null},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"B. Vergnet","raw_affiliation_strings":["Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain"],"affiliations":[{"raw_affiliation_string":"Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089712120","display_name":"F. Campabadal","orcid":"https://orcid.org/0000-0001-7758-4567"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"F. Campabadal","raw_affiliation_strings":["Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain"],"affiliations":[{"raw_affiliation_string":"Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075657255","display_name":"C. Fleta","orcid":"https://orcid.org/0000-0002-6591-6744"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"C. Fleta","raw_affiliation_strings":["Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain"],"affiliations":[{"raw_affiliation_string":"Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055281913","display_name":"L. Fonseca","orcid":"https://orcid.org/0000-0002-1394-8074"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"L. Fonseca","raw_affiliation_strings":["Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain"],"affiliations":[{"raw_affiliation_string":"Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100758473","display_name":"M. Lozano","orcid":"https://orcid.org/0000-0001-5826-5544"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. Lozano","raw_affiliation_strings":["Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain"],"affiliations":[{"raw_affiliation_string":"Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018985591","display_name":"Carlos Barreira Martinez","orcid":"https://orcid.org/0000-0002-0653-5298"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"C. Mart\u0131\u0301nez","raw_affiliation_strings":["Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain"],"affiliations":[{"raw_affiliation_string":"Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065993753","display_name":"M. Ull\u00e1n","orcid":"https://orcid.org/0000-0003-0728-1805"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. Ull\u00e1n","raw_affiliation_strings":["Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain"],"affiliations":[{"raw_affiliation_string":"Institut de Microelectr\u00f2nica de Barcelona (1MB), CNM-CSIC, Campus UAB, 08193 Bellaterra, Spain","institution_ids":["https://openalex.org/I4210160312"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5043936121"],"corresponding_institution_ids":["https://openalex.org/I4210160312"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.3425,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.58796455,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"42","issue":"9-11","first_page":"1501","last_page":"1504"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.7489844560623169},{"id":"https://openalex.org/keywords/proton","display_name":"Proton","score":0.6319445967674255},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6053274869918823},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.45276960730552673},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.425758421421051},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.3630415201187134},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35813382267951965},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20918163657188416},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.1940925419330597},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16162794828414917}],"concepts":[{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.7489844560623169},{"id":"https://openalex.org/C54516573","wikidata":"https://www.wikidata.org/wiki/Q2294","display_name":"Proton","level":2,"score":0.6319445967674255},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6053274869918823},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.45276960730552673},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.425758421421051},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.3630415201187134},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35813382267951965},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20918163657188416},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.1940925419330597},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16162794828414917},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/s0026-2714(02)00178-6","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00178-6","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:digital.csic.es:10261/256995","is_oa":true,"landing_page_url":"http://hdl.handle.net/10261/256995","pdf_url":"https://digital.csic.es/bitstream/10261/256995/1/paper35_Esref02.pdf","source":{"id":"https://openalex.org/S4306400616","display_name":"DIGITAL.CSIC (Spanish National Research Council (CSIC))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I134820265","host_organization_name":"Consejo Superior de Investigaciones Cient\u00edficas","host_organization_lineage":["https://openalex.org/I134820265"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"http://purl.org/coar/resource_type/c_6501"}],"best_oa_location":{"id":"pmh:oai:digital.csic.es:10261/256995","is_oa":true,"landing_page_url":"http://hdl.handle.net/10261/256995","pdf_url":"https://digital.csic.es/bitstream/10261/256995/1/paper35_Esref02.pdf","source":{"id":"https://openalex.org/S4306400616","display_name":"DIGITAL.CSIC (Spanish National Research Council (CSIC))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I134820265","host_organization_name":"Consejo Superior de Investigaciones Cient\u00edficas","host_organization_lineage":["https://openalex.org/I134820265"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"http://purl.org/coar/resource_type/c_6501"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8500000238418579}],"awards":[],"funders":[{"id":"https://openalex.org/F4320324278","display_name":"Comisi\u00f3n Interministerial de Ciencia y Tecnolog\u00eda","ror":"https://ror.org/034900433"}],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W2086897666.pdf"},"referenced_works_count":3,"referenced_works":["https://openalex.org/W2053058500","https://openalex.org/W2169925409","https://openalex.org/W4245206535"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W1985871717","https://openalex.org/W2902546961","https://openalex.org/W2744919934","https://openalex.org/W2035286355","https://openalex.org/W2058676402","https://openalex.org/W2399397734","https://openalex.org/W1974283415","https://openalex.org/W2007223904","https://openalex.org/W2036853086"],"abstract_inverted_index":null,"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}