{"id":"https://openalex.org/W7138857800","doi":"https://doi.org/10.1016/j.simpat.2026.103276","title":"Degradation-adaptive digital twin for long-term consistency","display_name":"Degradation-adaptive digital twin for long-term consistency","publication_year":2026,"publication_date":"2026-03-18","ids":{"openalex":"https://openalex.org/W7138857800","doi":"https://doi.org/10.1016/j.simpat.2026.103276"},"language":"en","primary_location":{"id":"doi:10.1016/j.simpat.2026.103276","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.simpat.2026.103276","pdf_url":null,"source":{"id":"https://openalex.org/S114739668","display_name":"Simulation Modelling Practice and Theory","issn_l":"1569-190X","issn":["1569-190X","1878-1462"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Simulation Modelling Practice and Theory","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109754421","display_name":"Tianyu Xia","orcid":null},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianyu Xia","raw_affiliation_strings":["College of Transportation, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0000-5720-2699","affiliations":[{"raw_affiliation_string":"College of Transportation, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080150301","display_name":"Jianyong Zuo","orcid":"https://orcid.org/0000-0001-8844-7453"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jianyong Zuo","raw_affiliation_strings":["Tongji University, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tongji University, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128649077","display_name":"Jingxian Ding","orcid":null},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingxian Ding","raw_affiliation_strings":["College of Transportation, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-5888-6508","affiliations":[{"raw_affiliation_string":"College of Transportation, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064079247","display_name":"Yu Pan","orcid":"https://orcid.org/0000-0003-1576-3396"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Pan","raw_affiliation_strings":["College of Transportation, Tongji University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Transportation, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5080150301"],"corresponding_institution_ids":["https://openalex.org/I116953780"],"apc_list":{"value":3030,"currency":"USD","value_usd":3030},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.59599589,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"149","issue":null,"first_page":"103276","last_page":"103276"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.705299973487854,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.705299973487854,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.14300000667572021,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.007600000128149986,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interpretability","display_name":"Interpretability","score":0.7860000133514404},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5821999907493591},{"id":"https://openalex.org/keywords/consistency","display_name":"Consistency (knowledge bases)","score":0.5411999821662903},{"id":"https://openalex.org/keywords/physical-system","display_name":"Physical system","score":0.4620000123977661},{"id":"https://openalex.org/keywords/unobservable","display_name":"Unobservable","score":0.428600013256073},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.3874000012874603},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.3776000142097473},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.3716999888420105}],"concepts":[{"id":"https://openalex.org/C2781067378","wikidata":"https://www.wikidata.org/wiki/Q17027399","display_name":"Interpretability","level":2,"score":0.7860000133514404},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5821999907493591},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.5411999821662903},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5271000266075134},{"id":"https://openalex.org/C116672817","wikidata":"https://www.wikidata.org/wiki/Q1454986","display_name":"Physical system","level":2,"score":0.4620000123977661},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.45829999446868896},{"id":"https://openalex.org/C2780695315","wikidata":"https://www.wikidata.org/wiki/Q3799040","display_name":"Unobservable","level":2,"score":0.428600013256073},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.38999998569488525},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.38909998536109924},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.3874000012874603},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.3776000142097473},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.3716999888420105},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34700000286102295},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.32910001277923584},{"id":"https://openalex.org/C178650346","wikidata":"https://www.wikidata.org/wiki/Q201984","display_name":"Covariance","level":2,"score":0.302700012922287},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.29750001430511475},{"id":"https://openalex.org/C36390408","wikidata":"https://www.wikidata.org/wiki/Q1163067","display_name":"Digital filter","level":3,"score":0.29589998722076416},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.2736000120639801},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.26510000228881836},{"id":"https://openalex.org/C79518650","wikidata":"https://www.wikidata.org/wiki/Q2081431","display_name":"Integrator","level":3,"score":0.26019999384880066},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.259799987077713},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.258899986743927},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.2515999972820282},{"id":"https://openalex.org/C2778712577","wikidata":"https://www.wikidata.org/wiki/Q3505966","display_name":"Retraining","level":2,"score":0.25040000677108765}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.simpat.2026.103276","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.simpat.2026.103276","pdf_url":null,"source":{"id":"https://openalex.org/S114739668","display_name":"Simulation Modelling Practice and Theory","issn_l":"1569-190X","issn":["1569-190X","1878-1462"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Simulation Modelling Practice and Theory","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W2954713261","https://openalex.org/W2986110703","https://openalex.org/W2989638106","https://openalex.org/W3036215542","https://openalex.org/W4285098908","https://openalex.org/W4297846741","https://openalex.org/W4307956197","https://openalex.org/W4309455674","https://openalex.org/W4313398578","https://openalex.org/W4320039037","https://openalex.org/W4321767348","https://openalex.org/W4324032847","https://openalex.org/W4375851235","https://openalex.org/W4383293068","https://openalex.org/W4386947710","https://openalex.org/W4387794318","https://openalex.org/W4387986919","https://openalex.org/W4388706177","https://openalex.org/W4393201813","https://openalex.org/W4399657770","https://openalex.org/W4399665709","https://openalex.org/W4400086860","https://openalex.org/W4400593610","https://openalex.org/W4403917214","https://openalex.org/W4403929936","https://openalex.org/W4403967422","https://openalex.org/W4404238557","https://openalex.org/W4405930789","https://openalex.org/W4408673768","https://openalex.org/W4409180109","https://openalex.org/W4410999892","https://openalex.org/W4411260473","https://openalex.org/W4411475345","https://openalex.org/W4411930336","https://openalex.org/W4412429476","https://openalex.org/W4413166887"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-03-26T06:05:38.182114","created_date":"2026-03-20T00:00:00"}