{"id":"https://openalex.org/W3087898221","doi":"https://doi.org/10.1016/j.ress.2020.107252","title":"Balanced Systems by Considering Multi-state Competing Risks Under Degradation Processes","display_name":"Balanced Systems by Considering Multi-state Competing Risks Under Degradation Processes","publication_year":2020,"publication_date":"2020-09-24","ids":{"openalex":"https://openalex.org/W3087898221","doi":"https://doi.org/10.1016/j.ress.2020.107252","mag":"3087898221"},"language":"en","primary_location":{"id":"doi:10.1016/j.ress.2020.107252","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ress.2020.107252","pdf_url":null,"source":{"id":"https://openalex.org/S202403813","display_name":"Reliability Engineering & System Safety","issn_l":"0951-8320","issn":["0951-8320","1879-0836"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Reliability Engineering & System Safety","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100630020","display_name":"Chen Fang","orcid":"https://orcid.org/0000-0003-3237-5600"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]},{"id":"https://openalex.org/I31847773","display_name":"Zhejiang Ocean University","ror":"https://ror.org/03mys6533","country_code":"CN","type":"education","lineage":["https://openalex.org/I31847773"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chen Fang","raw_affiliation_strings":["School of Economics & Management, Zhejiang Ocean University, Zhejiang, China","School of Management & Economics, Beijing Institute of Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Economics & Management, Zhejiang Ocean University, Zhejiang, China","institution_ids":["https://openalex.org/I31847773"]},{"raw_affiliation_string":"School of Management & Economics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068547916","display_name":"Lirong Cui","orcid":"https://orcid.org/0000-0002-8987-4307"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lirong Cui","raw_affiliation_strings":["School of Management & Economics, Beijing Institute of Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Management & Economics, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100630020"],"corresponding_institution_ids":["https://openalex.org/I125839683","https://openalex.org/I31847773"],"apc_list":{"value":2900,"currency":"USD","value_usd":2900},"apc_paid":null,"fwci":2.5563,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.87910576,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"205","issue":null,"first_page":"107252","last_page":"107252"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7694387435913086},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7003741264343262},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6361017227172852},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5885713696479797},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.5134699940681458},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.493988573551178},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4798716604709625},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.43618786334991455},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4187261760234833},{"id":"https://openalex.org/keywords/operations-research","display_name":"Operations research","score":0.36356544494628906},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.3359912037849426},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23347550630569458},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17857971787452698},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.14677965641021729},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.12966758012771606},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10021290183067322}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7694387435913086},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7003741264343262},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6361017227172852},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5885713696479797},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.5134699940681458},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.493988573551178},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4798716604709625},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.43618786334991455},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4187261760234833},{"id":"https://openalex.org/C42475967","wikidata":"https://www.wikidata.org/wiki/Q194292","display_name":"Operations research","level":1,"score":0.36356544494628906},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.3359912037849426},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23347550630569458},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17857971787452698},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.14677965641021729},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.12966758012771606},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10021290183067322},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.ress.2020.107252","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ress.2020.107252","pdf_url":null,"source":{"id":"https://openalex.org/S202403813","display_name":"Reliability Engineering & System Safety","issn_l":"0951-8320","issn":["0951-8320","1879-0836"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Reliability Engineering & System Safety","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:eee:reensy:v:205:y:2021:i:c:s0951832020307523","is_oa":false,"landing_page_url":"http://www.sciencedirect.com/science/article/pii/S0951832020307523","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W168213108","https://openalex.org/W1523710038","https://openalex.org/W1976823375","https://openalex.org/W2007326202","https://openalex.org/W2013168395","https://openalex.org/W2020977657","https://openalex.org/W2029407302","https://openalex.org/W2031812418","https://openalex.org/W2083592025","https://openalex.org/W2092640118","https://openalex.org/W2096708537","https://openalex.org/W2123803428","https://openalex.org/W2124004584","https://openalex.org/W2322524800","https://openalex.org/W2343535568","https://openalex.org/W2345185961","https://openalex.org/W2523713720","https://openalex.org/W2601623226","https://openalex.org/W2605925837","https://openalex.org/W2612806996","https://openalex.org/W2613553863","https://openalex.org/W2766163420","https://openalex.org/W2773454992","https://openalex.org/W2789561576","https://openalex.org/W2791384746","https://openalex.org/W2883471023","https://openalex.org/W2891108772","https://openalex.org/W2896380870","https://openalex.org/W2897486160","https://openalex.org/W2914770205","https://openalex.org/W2914800765","https://openalex.org/W2947520691","https://openalex.org/W2966912864","https://openalex.org/W2972928078","https://openalex.org/W2982465647","https://openalex.org/W3001989784","https://openalex.org/W3009805702","https://openalex.org/W3082088307","https://openalex.org/W4254246540","https://openalex.org/W4302377426","https://openalex.org/W6651974064","https://openalex.org/W6678313437","https://openalex.org/W6737698422","https://openalex.org/W6759283054","https://openalex.org/W6763328995","https://openalex.org/W6766930446","https://openalex.org/W6773213100","https://openalex.org/W6782766735"],"related_works":["https://openalex.org/W1815542355","https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2994319598","https://openalex.org/W2369695847","https://openalex.org/W2110842462"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":6}],"updated_date":"2026-08-28T12:50:07.497085","created_date":"2025-10-10T00:00:00"}