{"id":"https://openalex.org/W1998021419","doi":"https://doi.org/10.1016/j.microrel.2013.10.019","title":"Analytical compact modeling and statistical variability study of LDMOS","display_name":"Analytical compact modeling and statistical variability study of LDMOS","publication_year":2013,"publication_date":"2013-10-28","ids":{"openalex":"https://openalex.org/W1998021419","doi":"https://doi.org/10.1016/j.microrel.2013.10.019","mag":"1998021419"},"language":"en","primary_location":{"id":"doi:10.1016/j.microrel.2013.10.019","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2013.10.019","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051150850","display_name":"Hongtao Zhou","orcid":"https://orcid.org/0000-0002-4703-0106"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Hongtao Zhou","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore","School of Electrical and Electronic Engineering, Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101851241","display_name":"Xing Zhou","orcid":"https://orcid.org/0000-0003-2509-6726"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Xing Zhou","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore","School of Electrical and Electronic Engineering, Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University , 50 Nanyang Avenue, Singapore, 639798, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024206043","display_name":"F. B\u00e9nistant","orcid":null},"institutions":[{"id":"https://openalex.org/I4210136567","display_name":"GlobalFoundries (Singapore)","ror":"https://ror.org/03whnfd14","country_code":"SG","type":"company","lineage":["https://openalex.org/I35662394","https://openalex.org/I4210136567"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Francis Benistant","raw_affiliation_strings":["GLOBALFOUNDRIES Singapore Pte Ltd., 60 Woodlands Industrial Park D Street 2, Singapore 738406, Singapore","GlobalFoundries Singapore Pte. Ltd., 60 Woodlands Industrial Park D, Street 2, Singapore 738406, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"GLOBALFOUNDRIES Singapore Pte Ltd., 60 Woodlands Industrial Park D Street 2, Singapore 738406, Singapore","institution_ids":["https://openalex.org/I4210136567"]},{"raw_affiliation_string":"GlobalFoundries Singapore Pte. Ltd., 60 Woodlands Industrial Park D, Street 2, Singapore 738406, Singapore","institution_ids":["https://openalex.org/I4210136567"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5051150850"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.2349,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.58581906,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"54","issue":"6-7","first_page":"1096","last_page":"1102"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ldmos","display_name":"LDMOS","score":0.9527143836021423},{"id":"https://openalex.org/keywords/uncorrelated","display_name":"Uncorrelated","score":0.6159168481826782},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.526093602180481},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.516332745552063},{"id":"https://openalex.org/keywords/statistical-model","display_name":"Statistical model","score":0.47877752780914307},{"id":"https://openalex.org/keywords/breakdown-voltage","display_name":"Breakdown voltage","score":0.4480102062225342},{"id":"https://openalex.org/keywords/saturation","display_name":"Saturation (graph theory)","score":0.4268019199371338},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3970780372619629},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25691187381744385},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2375512421131134},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11982426047325134}],"concepts":[{"id":"https://openalex.org/C31672976","wikidata":"https://www.wikidata.org/wiki/Q4042432","display_name":"LDMOS","level":4,"score":0.9527143836021423},{"id":"https://openalex.org/C169345407","wikidata":"https://www.wikidata.org/wiki/Q8216221","display_name":"Uncorrelated","level":2,"score":0.6159168481826782},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.526093602180481},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.516332745552063},{"id":"https://openalex.org/C114289077","wikidata":"https://www.wikidata.org/wiki/Q3284399","display_name":"Statistical model","level":2,"score":0.47877752780914307},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.4480102062225342},{"id":"https://openalex.org/C9930424","wikidata":"https://www.wikidata.org/wiki/Q7426587","display_name":"Saturation (graph theory)","level":2,"score":0.4268019199371338},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3970780372619629},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25691187381744385},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2375512421131134},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11982426047325134},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.microrel.2013.10.019","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2013.10.019","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5699999928474426,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1527067980","https://openalex.org/W1965950439","https://openalex.org/W2000200978","https://openalex.org/W2043506327","https://openalex.org/W2052824980","https://openalex.org/W2074598226","https://openalex.org/W2075210127","https://openalex.org/W2075387865","https://openalex.org/W2084072961","https://openalex.org/W2110870100","https://openalex.org/W2111815659","https://openalex.org/W2112774088","https://openalex.org/W2121232426","https://openalex.org/W2134435755","https://openalex.org/W2138181478","https://openalex.org/W2143170485","https://openalex.org/W2148090399","https://openalex.org/W2148577828","https://openalex.org/W2171046834","https://openalex.org/W2921031556","https://openalex.org/W6684754813"],"related_works":["https://openalex.org/W2102587867","https://openalex.org/W1948552993","https://openalex.org/W2042869602","https://openalex.org/W3119695895","https://openalex.org/W2121403888","https://openalex.org/W2349697166","https://openalex.org/W1920421228","https://openalex.org/W2019621655","https://openalex.org/W1984559868","https://openalex.org/W2996641098"],"abstract_inverted_index":null,"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}