{"id":"https://openalex.org/W2033352682","doi":"https://doi.org/10.1016/j.microrel.2008.06.044","title":"Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation","display_name":"Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation","publication_year":2008,"publication_date":"2008-08-01","ids":{"openalex":"https://openalex.org/W2033352682","doi":"https://doi.org/10.1016/j.microrel.2008.06.044","mag":"2033352682"},"language":"en","primary_location":{"id":"doi:10.1016/j.microrel.2008.06.044","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2008.06.044","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059725040","display_name":"Yannick Deshayes","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Y. Deshayes","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":null,"display_name":"I. Bord","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"I. Bord","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":null,"display_name":"G. Barreau","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Barreau","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043216957","display_name":"M. Aiche","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M. Aiche","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031157947","display_name":"P. Moretto","orcid":"https://orcid.org/0000-0002-2957-197X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P.H. Moretto","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066626866","display_name":"Laurent B\u00e9chou","orcid":"https://orcid.org/0000-0002-0920-3619"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"L. B\u00e9chou","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":null,"display_name":"A.C. Roehrig","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A.C. Roehrig","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5043837649","display_name":"Yves Ousten","orcid":"https://orcid.org/0000-0002-3315-057X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Y. Ousten","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5059725040"],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.7014,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.7019026,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"48","issue":"8-9","first_page":"1354","last_page":"1360"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.3822000026702881,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.3822000026702881,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.18459999561309814,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.13940000534057617,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.7596437335014343},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.7126069068908691},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6181667447090149},{"id":"https://openalex.org/keywords/heterojunction","display_name":"Heterojunction","score":0.6022276878356934},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.6002277135848999},{"id":"https://openalex.org/keywords/double-heterostructure","display_name":"Double heterostructure","score":0.595409631729126},{"id":"https://openalex.org/keywords/neutron-irradiation","display_name":"Neutron irradiation","score":0.5606626272201538},{"id":"https://openalex.org/keywords/light-emitting-diode","display_name":"Light-emitting diode","score":0.487868070602417},{"id":"https://openalex.org/keywords/neutron","display_name":"Neutron","score":0.45869722962379456},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14524483680725098},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.1331634521484375},{"id":"https://openalex.org/keywords/semiconductor-laser-theory","display_name":"Semiconductor laser theory","score":0.08064129948616028}],"concepts":[{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.7596437335014343},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.7126069068908691},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6181667447090149},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.6022276878356934},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.6002277135848999},{"id":"https://openalex.org/C14174561","wikidata":"https://www.wikidata.org/wiki/Q3037612","display_name":"Double heterostructure","level":4,"score":0.595409631729126},{"id":"https://openalex.org/C2982764207","wikidata":"https://www.wikidata.org/wiki/Q901707","display_name":"Neutron irradiation","level":3,"score":0.5606626272201538},{"id":"https://openalex.org/C176666156","wikidata":"https://www.wikidata.org/wiki/Q25504","display_name":"Light-emitting diode","level":2,"score":0.487868070602417},{"id":"https://openalex.org/C152568617","wikidata":"https://www.wikidata.org/wiki/Q2348","display_name":"Neutron","level":2,"score":0.45869722962379456},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14524483680725098},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.1331634521484375},{"id":"https://openalex.org/C121477167","wikidata":"https://www.wikidata.org/wiki/Q17154002","display_name":"Semiconductor laser theory","level":3,"score":0.08064129948616028}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1016/j.microrel.2008.06.044","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2008.06.044","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-00326851v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00326851","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Microelectronics Reliability, 2008, 48, pp.1354-1360","raw_type":"Journal articles"},{"id":"pmh:oai:oskar-bordeaux.fr:20.500.12278/122457","is_oa":false,"landing_page_url":"https://oskar-bordeaux.fr/handle/20.500.12278/122457","pdf_url":null,"source":{"id":"https://openalex.org/S4306402569","display_name":"Oskar-Bordeaux (Universite de Bordeaux)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article de revue"},{"id":"pmh:oai:oskar-bordeaux.fr:20.500.12278/138581","is_oa":false,"landing_page_url":"https://oskar-bordeaux.fr/handle/20.500.12278/138581","pdf_url":null,"source":{"id":"https://openalex.org/S4306402569","display_name":"Oskar-Bordeaux (Universite de Bordeaux)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article de revue"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.9100000262260437,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1966054404","https://openalex.org/W1990471304","https://openalex.org/W2042287523","https://openalex.org/W2043369286","https://openalex.org/W2059057954","https://openalex.org/W2083120617","https://openalex.org/W2083419862","https://openalex.org/W2172151235","https://openalex.org/W2172233950"],"related_works":["https://openalex.org/W1515161531","https://openalex.org/W3042595473","https://openalex.org/W2082745643","https://openalex.org/W2921865011","https://openalex.org/W2064813234","https://openalex.org/W1996411845","https://openalex.org/W2013531946","https://openalex.org/W2125347894","https://openalex.org/W2033352682","https://openalex.org/W4298225798"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}