{"id":"https://openalex.org/W4415504952","doi":"https://doi.org/10.1016/j.infsof.2025.107944","title":"ISVMT: An approach of indicator systems validation based on metamorphic testing and data mutation","display_name":"ISVMT: An approach of indicator systems validation based on metamorphic testing and data mutation","publication_year":2025,"publication_date":"2025-10-24","ids":{"openalex":"https://openalex.org/W4415504952","doi":"https://doi.org/10.1016/j.infsof.2025.107944"},"language":"en","primary_location":{"id":"doi:10.1016/j.infsof.2025.107944","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.infsof.2025.107944","pdf_url":null,"source":{"id":"https://openalex.org/S205010575","display_name":"Information and Software Technology","issn_l":"0950-5849","issn":["0950-5849","1873-6025"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Information and Software Technology","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001285586","display_name":"G. Ma","orcid":null},"institutions":[{"id":"https://openalex.org/I31683504","display_name":"Beijing Forestry University","ror":"https://ror.org/04xv2pc41","country_code":"CN","type":"education","lineage":["https://openalex.org/I1327237609","https://openalex.org/I31683504","https://openalex.org/I4210127390"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"GuoHao Ma","raw_affiliation_strings":["School of Information Science and Technology, Beijing Forestry University, Beijing 100083, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Science and Technology, Beijing Forestry University, Beijing 100083, China","institution_ids":["https://openalex.org/I31683504"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Bo Yang","orcid":"https://orcid.org/0000-0003-1928-7526"},"institutions":[{"id":"https://openalex.org/I31683504","display_name":"Beijing Forestry University","ror":"https://ror.org/04xv2pc41","country_code":"CN","type":"education","lineage":["https://openalex.org/I1327237609","https://openalex.org/I31683504","https://openalex.org/I4210127390"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Bo Yang","raw_affiliation_strings":["School of Information Science and Technology, Beijing Forestry University, Beijing 100083, China"],"raw_orcid":"https://orcid.org/0000-0003-1928-7526","affiliations":[{"raw_affiliation_string":"School of Information Science and Technology, Beijing Forestry University, Beijing 100083, China","institution_ids":["https://openalex.org/I31683504"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5120120555","display_name":"XiaoKai Xia","orcid":null},"institutions":[{"id":"https://openalex.org/I2800372957","display_name":"China Electronics Technology Group Corporation","ror":"https://ror.org/0098hst83","country_code":"CN","type":"company","lineage":["https://openalex.org/I2800372957"]},{"id":"https://openalex.org/I4210104233","display_name":"China Electronics Corporation (China)","ror":"https://ror.org/00vsv8c52","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210104233"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"XiaoKai Xia","raw_affiliation_strings":["China Electronics Technology Group Corporation Information Science Research Institute, Beijing 100042, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electronics Technology Group Corporation Information Science Research Institute, Beijing 100042, China","institution_ids":["https://openalex.org/I2800372957","https://openalex.org/I4210104233"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072686159","display_name":"Xu Luo","orcid":"https://orcid.org/0000-0001-7260-029X"},"institutions":[{"id":"https://openalex.org/I2800372957","display_name":"China Electronics Technology Group Corporation","ror":"https://ror.org/0098hst83","country_code":"CN","type":"company","lineage":["https://openalex.org/I2800372957"]},{"id":"https://openalex.org/I4210104233","display_name":"China Electronics Corporation (China)","ror":"https://ror.org/00vsv8c52","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210104233"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Luo Xu","raw_affiliation_strings":["China Electronics Technology Group Corporation Information Science Research Institute, Beijing 100042, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electronics Technology Group Corporation Information Science Research Institute, Beijing 100042, China","institution_ids":["https://openalex.org/I2800372957","https://openalex.org/I4210104233"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5072686159"],"corresponding_institution_ids":["https://openalex.org/I2800372957","https://openalex.org/I31683504","https://openalex.org/I4210104233"],"apc_list":{"value":3350,"currency":"USD","value_usd":3350},"apc_paid":null,"fwci":2.1259,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.90123707,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"189","issue":null,"first_page":"107944","last_page":"107944"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6416000127792358},{"id":"https://openalex.org/keywords/consistency","display_name":"Consistency (knowledge bases)","score":0.5184000134468079},{"id":"https://openalex.org/keywords/oracle","display_name":"Oracle","score":0.517799973487854},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.47920000553131104},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.46889999508857727},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.4196000099182129},{"id":"https://openalex.org/keywords/mutation","display_name":"Mutation","score":0.40119999647140503}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6416000127792358},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.6147000193595886},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6133999824523926},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.5184000134468079},{"id":"https://openalex.org/C55166926","wikidata":"https://www.wikidata.org/wiki/Q2892946","display_name":"Oracle","level":2,"score":0.517799973487854},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5162000060081482},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.47920000553131104},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.46889999508857727},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.4196000099182129},{"id":"https://openalex.org/C501734568","wikidata":"https://www.wikidata.org/wiki/Q42918","display_name":"Mutation","level":3,"score":0.40119999647140503},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.3896999955177307},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.3573000133037567},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.351500004529953},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3472999930381775},{"id":"https://openalex.org/C92446256","wikidata":"https://www.wikidata.org/wiki/Q3306762","display_name":"Data validation","level":2,"score":0.30469998717308044},{"id":"https://openalex.org/C24756922","wikidata":"https://www.wikidata.org/wiki/Q1757694","display_name":"Data quality","level":3,"score":0.2987000048160553},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.2890999913215637},{"id":"https://openalex.org/C87007009","wikidata":"https://www.wikidata.org/wiki/Q210832","display_name":"Statistical hypothesis testing","level":2,"score":0.2879999876022339},{"id":"https://openalex.org/C25343380","wikidata":"https://www.wikidata.org/wiki/Q277521","display_name":"Relation (database)","level":2,"score":0.2759999930858612},{"id":"https://openalex.org/C27181475","wikidata":"https://www.wikidata.org/wiki/Q541014","display_name":"Cross-validation","level":2,"score":0.2646999955177307}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.infsof.2025.107944","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.infsof.2025.107944","pdf_url":null,"source":{"id":"https://openalex.org/S205010575","display_name":"Information and Software Technology","issn_l":"0950-5849","issn":["0950-5849","1873-6025"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Information and Software Technology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8719515803","display_name":null,"funder_award_id":"2022YFF1302700","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W1981311312","https://openalex.org/W2041650849","https://openalex.org/W2041713059","https://openalex.org/W2061227290","https://openalex.org/W2071112258","https://openalex.org/W2103459159","https://openalex.org/W2121866145","https://openalex.org/W2128666163","https://openalex.org/W2135841285","https://openalex.org/W2136593250","https://openalex.org/W2293505944","https://openalex.org/W2311532076","https://openalex.org/W2544192960","https://openalex.org/W2782311202","https://openalex.org/W2917572361","https://openalex.org/W2951165326","https://openalex.org/W3004493192","https://openalex.org/W3028077580","https://openalex.org/W3106636422","https://openalex.org/W3134748233","https://openalex.org/W3159615912","https://openalex.org/W3167050758","https://openalex.org/W3194858712","https://openalex.org/W3195333052","https://openalex.org/W3196350964","https://openalex.org/W4214589259","https://openalex.org/W4281393087","https://openalex.org/W4281707113","https://openalex.org/W4284690247","https://openalex.org/W4285728233","https://openalex.org/W4288774103","https://openalex.org/W4289824822","https://openalex.org/W4292640864","https://openalex.org/W4313154583","https://openalex.org/W4387055719","https://openalex.org/W4387848581","https://openalex.org/W4394015350","https://openalex.org/W4394606321","https://openalex.org/W4398765535","https://openalex.org/W4400768472","https://openalex.org/W4402757116","https://openalex.org/W4403536427","https://openalex.org/W4405543795"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-01-20T17:24:06.736184","created_date":"2025-10-24T00:00:00"}