{"id":"https://openalex.org/W2082765997","doi":"https://doi.org/10.1016/0303-1268(79)90056-7","title":"Microprocessor systems testing \u2014 a review and future prospects","display_name":"Microprocessor systems testing \u2014 a review and future prospects","publication_year":1979,"publication_date":"1979-01-01","ids":{"openalex":"https://openalex.org/W2082765997","doi":"https://doi.org/10.1016/0303-1268(79)90056-7","mag":"2082765997"},"language":"en","primary_location":{"id":"doi:10.1016/0303-1268(79)90056-7","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0303-1268(79)90056-7","pdf_url":null,"source":{"id":"https://openalex.org/S199543014","display_name":"Euromicro Newsletter","issn_l":"0303-1268","issn":["0303-1268","1878-3015"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Euromicro Newsletter","raw_type":"journal-article"},"type":"review","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110137341","display_name":"C. Robach","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"C Robach","raw_affiliation_strings":["IMAG, B.P. 53, F-38041 Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMAG, B.P. 53, F-38041 Grenoble, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110070055","display_name":"G. Saucier","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G Saucier","raw_affiliation_strings":["IMAG, B.P. 53, F-38041 Grenoble, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IMAG, B.P. 53, F-38041 Grenoble, France","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045652279","display_name":"C Al\u00e9onard","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"C Al\u00e9onard","raw_affiliation_strings":["Crouzet, B.P. 1014, F-26010 Valence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Crouzet, B.P. 1014, F-26010 Valence, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6057,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.83838384,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"5","issue":"1","first_page":"31","last_page":"37"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.8836551904678345},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7050684094429016},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6434203386306763},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5225790739059448},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.48160693049430847},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4797416925430298},{"id":"https://openalex.org/keywords/integration-testing","display_name":"Integration testing","score":0.46253517270088196},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4225388467311859},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.42162230610847473},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24185290932655334},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12044772505760193},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10347321629524231},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.10039705038070679}],"concepts":[{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.8836551904678345},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7050684094429016},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6434203386306763},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5225790739059448},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.48160693049430847},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4797416925430298},{"id":"https://openalex.org/C107683887","wikidata":"https://www.wikidata.org/wiki/Q782466","display_name":"Integration testing","level":3,"score":0.46253517270088196},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4225388467311859},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.42162230610847473},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24185290932655334},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12044772505760193},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10347321629524231},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.10039705038070679},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/0303-1268(79)90056-7","is_oa":false,"landing_page_url":"https://doi.org/10.1016/0303-1268(79)90056-7","pdf_url":null,"source":{"id":"https://openalex.org/S199543014","display_name":"Euromicro Newsletter","issn_l":"0303-1268","issn":["0303-1268","1878-3015"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Euromicro Newsletter","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.4099999964237213,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1773837414","https://openalex.org/W1839177332","https://openalex.org/W2008521622","https://openalex.org/W2017814762","https://openalex.org/W2046817879","https://openalex.org/W2094540043","https://openalex.org/W2111994103","https://openalex.org/W2173426812","https://openalex.org/W2223496872","https://openalex.org/W2621062827","https://openalex.org/W3208707238","https://openalex.org/W6620485788","https://openalex.org/W6674537631","https://openalex.org/W6689282687","https://openalex.org/W6738749308","https://openalex.org/W6803063750"],"related_works":["https://openalex.org/W39373273","https://openalex.org/W2098026815","https://openalex.org/W2390545901","https://openalex.org/W2351709090","https://openalex.org/W2735012529","https://openalex.org/W2732121450","https://openalex.org/W1619273082","https://openalex.org/W98007137","https://openalex.org/W1979324833","https://openalex.org/W2754317536"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}