{"id":"https://openalex.org/W2143693264","doi":"https://doi.org/10.1016/s1383-7621(98)00079-4","title":"An improved register\u2013transfer level functional partitioning approach for testability","display_name":"An improved register\u2013transfer level functional partitioning approach for testability","publication_year":2000,"publication_date":"2000-01-01","ids":{"openalex":"https://openalex.org/W2143693264","doi":"https://doi.org/10.1016/s1383-7621(98)00079-4","mag":"2143693264"},"language":"en","primary_location":{"id":"doi:10.1016/s1383-7621(98)00079-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s1383-7621(98)00079-4","pdf_url":null,"source":{"id":"https://openalex.org/S127660348","display_name":"Journal of Systems Architecture","issn_l":"1383-7621","issn":["1383-7621","1873-6165"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Systems Architecture","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111476819","display_name":"Tianruo Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I102134673","display_name":"Link\u00f6ping University","ror":"https://ror.org/05ynxx418","country_code":"SE","type":"education","lineage":["https://openalex.org/I102134673"]}],"countries":["SE"],"is_corresponding":true,"raw_author_name":"Tianruo Yang","raw_affiliation_strings":["Department of Computer and Information Science, Link\u00f6ping University, 581 83 Linkoping, Sweden"],"affiliations":[{"raw_affiliation_string":"Department of Computer and Information Science, Link\u00f6ping University, 581 83 Linkoping, Sweden","institution_ids":["https://openalex.org/I102134673"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003372884","display_name":"Zebo Peng","orcid":"https://orcid.org/0000-0002-5137-565X"},"institutions":[{"id":"https://openalex.org/I102134673","display_name":"Link\u00f6ping University","ror":"https://ror.org/05ynxx418","country_code":"SE","type":"education","lineage":["https://openalex.org/I102134673"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Zebo Peng","raw_affiliation_strings":["Department of Computer and Information Science, Link\u00f6ping University, 581 83 Linkoping, Sweden"],"affiliations":[{"raw_affiliation_string":"Department of Computer and Information Science, Link\u00f6ping University, 581 83 Linkoping, Sweden","institution_ids":["https://openalex.org/I102134673"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5111476819"],"corresponding_institution_ids":["https://openalex.org/I102134673"],"apc_list":{"value":2800,"currency":"USD","value_usd":2800},"apc_paid":null,"fwci":0.3137,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.66535615,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"46","issue":"3","first_page":"209","last_page":"223"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7968645095825195},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.761988639831543},{"id":"https://openalex.org/keywords/reachability","display_name":"Reachability","score":0.7156303524971008},{"id":"https://openalex.org/keywords/partition","display_name":"Partition (number theory)","score":0.5572423338890076},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5467303395271301},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.5229350328445435},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4900296926498413},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.18884655833244324},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16433143615722656},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.094908207654953}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7968645095825195},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.761988639831543},{"id":"https://openalex.org/C136643341","wikidata":"https://www.wikidata.org/wiki/Q1361526","display_name":"Reachability","level":2,"score":0.7156303524971008},{"id":"https://openalex.org/C42812","wikidata":"https://www.wikidata.org/wiki/Q1082910","display_name":"Partition (number theory)","level":2,"score":0.5572423338890076},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5467303395271301},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.5229350328445435},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4900296926498413},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.18884655833244324},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16433143615722656},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.094908207654953},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s1383-7621(98)00079-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s1383-7621(98)00079-4","pdf_url":null,"source":{"id":"https://openalex.org/S127660348","display_name":"Journal of Systems Architecture","issn_l":"1383-7621","issn":["1383-7621","1873-6165"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Systems Architecture","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/17","score":0.47999998927116394,"display_name":"Partnerships for the goals"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W112644247","https://openalex.org/W1873259207","https://openalex.org/W1943249282","https://openalex.org/W1969070758","https://openalex.org/W2011039300","https://openalex.org/W2024186760","https://openalex.org/W2042706458","https://openalex.org/W2052140395","https://openalex.org/W2053013213","https://openalex.org/W2066974842","https://openalex.org/W2093842169","https://openalex.org/W2103538449","https://openalex.org/W2106669085","https://openalex.org/W2115308831","https://openalex.org/W2117922323","https://openalex.org/W2133388220","https://openalex.org/W2134626087","https://openalex.org/W2135129887","https://openalex.org/W2140331695","https://openalex.org/W2148663017","https://openalex.org/W2149020879","https://openalex.org/W2149787112","https://openalex.org/W2151419451","https://openalex.org/W2160162958","https://openalex.org/W2161515843","https://openalex.org/W2161843063","https://openalex.org/W2162256736","https://openalex.org/W2162922464","https://openalex.org/W2171343951","https://openalex.org/W2172154421","https://openalex.org/W3149957258","https://openalex.org/W3203937550","https://openalex.org/W4230713863","https://openalex.org/W4231857510","https://openalex.org/W4285719527","https://openalex.org/W6600045627","https://openalex.org/W6602474744","https://openalex.org/W6634551668"],"related_works":["https://openalex.org/W2135836819","https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2150046587","https://openalex.org/W2142405811","https://openalex.org/W2114980936","https://openalex.org/W2164493372","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2164349885"],"abstract_inverted_index":null,"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}