{"id":"https://openalex.org/W2020901993","doi":"https://doi.org/10.1016/s1383-7621(98)00077-0","title":"A scheme for multiple on-chip signature checking for embedded SRAMS","display_name":"A scheme for multiple on-chip signature checking for embedded SRAMS","publication_year":2000,"publication_date":"2000-01-01","ids":{"openalex":"https://openalex.org/W2020901993","doi":"https://doi.org/10.1016/s1383-7621(98)00077-0","mag":"2020901993"},"language":"en","primary_location":{"id":"doi:10.1016/s1383-7621(98)00077-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s1383-7621(98)00077-0","pdf_url":null,"source":{"id":"https://openalex.org/S127660348","display_name":"Journal of Systems Architecture","issn_l":"1383-7621","issn":["1383-7621","1873-6165"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Systems Architecture","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112846709","display_name":"M.F. Abdulla","orcid":null},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"M.F. Abdulla","raw_affiliation_strings":["Department of Computer Science and Engineering, Indian Institute of Technology, Hauz Khas, New Delhi 110016, India"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Indian Institute of Technology, Hauz Khas, New Delhi 110016, India","institution_ids":["https://openalex.org/I68891433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036733255","display_name":"C.P. Ravikumar","orcid":"https://orcid.org/0000-0003-0809-5545"},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"C.P. Ravikumar","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology, Hauz Khas, New Delhi 110016, India","Department of Electrical Engineering, Indian Institute of Technology, Hauz Khas, New Delhi-110016, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Hauz Khas, New Delhi 110016, India","institution_ids":["https://openalex.org/I68891433"]},{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Hauz Khas, New Delhi-110016, India","institution_ids":["https://openalex.org/I68891433"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101478917","display_name":"Anshul Kumar","orcid":"https://orcid.org/0000-0002-3871-5402"},"institutions":[{"id":"https://openalex.org/I68891433","display_name":"Indian Institute of Technology Delhi","ror":"https://ror.org/049tgcd06","country_code":"IN","type":"education","lineage":["https://openalex.org/I68891433"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anshul Kumar","raw_affiliation_strings":["Department of Computer Science and Engineering, Indian Institute of Technology, Hauz Khas, New Delhi 110016, India"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, Indian Institute of Technology, Hauz Khas, New Delhi 110016, India","institution_ids":["https://openalex.org/I68891433"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5036733255"],"corresponding_institution_ids":["https://openalex.org/I68891433"],"apc_list":{"value":2800,"currency":"USD","value_usd":2800},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12511563,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"46","issue":"2","first_page":"181","last_page":"199"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8686325550079346},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5912579894065857},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5358852744102478},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.4595370292663574},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4536905884742737},{"id":"https://openalex.org/keywords/signature","display_name":"Signature (topology)","score":0.44266074895858765},{"id":"https://openalex.org/keywords/controllability","display_name":"Controllability","score":0.4350394606590271},{"id":"https://openalex.org/keywords/aliasing","display_name":"Aliasing","score":0.4290873110294342},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.4224080741405487},{"id":"https://openalex.org/keywords/digital-signature","display_name":"Digital signature","score":0.41331690549850464},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.4121232032775879},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.40072351694107056},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.37611839175224304},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.2298187017440796}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8686325550079346},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5912579894065857},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5358852744102478},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.4595370292663574},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4536905884742737},{"id":"https://openalex.org/C2779696439","wikidata":"https://www.wikidata.org/wiki/Q7512811","display_name":"Signature (topology)","level":2,"score":0.44266074895858765},{"id":"https://openalex.org/C48209547","wikidata":"https://www.wikidata.org/wiki/Q1331104","display_name":"Controllability","level":2,"score":0.4350394606590271},{"id":"https://openalex.org/C4069607","wikidata":"https://www.wikidata.org/wiki/Q868732","display_name":"Aliasing","level":3,"score":0.4290873110294342},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.4224080741405487},{"id":"https://openalex.org/C118463975","wikidata":"https://www.wikidata.org/wiki/Q220849","display_name":"Digital signature","level":3,"score":0.41331690549850464},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.4121232032775879},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.40072351694107056},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.37611839175224304},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.2298187017440796},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C99138194","wikidata":"https://www.wikidata.org/wiki/Q183427","display_name":"Hash function","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s1383-7621(98)00077-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s1383-7621(98)00077-0","pdf_url":null,"source":{"id":"https://openalex.org/S127660348","display_name":"Journal of Systems Architecture","issn_l":"1383-7621","issn":["1383-7621","1873-6165"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Systems Architecture","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.6100000143051147,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W74134275","https://openalex.org/W1506429504","https://openalex.org/W1526026495","https://openalex.org/W2001696462","https://openalex.org/W2040381583","https://openalex.org/W2047810296","https://openalex.org/W2078286038","https://openalex.org/W2101457407","https://openalex.org/W2106935654","https://openalex.org/W2121938580","https://openalex.org/W2125465843","https://openalex.org/W2128035705","https://openalex.org/W2131581275","https://openalex.org/W2144642106","https://openalex.org/W2160743988","https://openalex.org/W6600266142"],"related_works":["https://openalex.org/W2036697162","https://openalex.org/W2332386680","https://openalex.org/W2561315646","https://openalex.org/W2248621902","https://openalex.org/W2142592902","https://openalex.org/W2535563940","https://openalex.org/W2115073733","https://openalex.org/W2138141123","https://openalex.org/W2185945449","https://openalex.org/W2080947141"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}