{"id":"https://openalex.org/W2081437186","doi":"https://doi.org/10.1016/s1383-7621(01)00034-0","title":"Behavioral test generation for the selection of BIST logic","display_name":"Behavioral test generation for the selection of BIST logic","publication_year":2002,"publication_date":"2002-04-01","ids":{"openalex":"https://openalex.org/W2081437186","doi":"https://doi.org/10.1016/s1383-7621(01)00034-0","mag":"2081437186"},"language":"en","primary_location":{"id":"doi:10.1016/s1383-7621(01)00034-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s1383-7621(01)00034-0","pdf_url":null,"source":{"id":"https://openalex.org/S127660348","display_name":"Journal of Systems Architecture","issn_l":"1383-7621","issn":["1383-7621","1873-6165"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Systems Architecture","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079951409","display_name":"Giuseppe Biasoli","orcid":null},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Giuseppe Biasoli","raw_affiliation_strings":["Dipartimento di Elettronica e Informazione, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milano, Italy","Dipartimento di Elettronica e Informazione, Politecnico di Milano, Piazza Leonardo da Vinci, 32-20133, Milano, Italy#TAB#"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica e Informazione, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica e Informazione, Politecnico di Milano, Piazza Leonardo da Vinci, 32-20133, Milano, Italy#TAB#","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028565685","display_name":"Fabrizio Ferrandi","orcid":"https://orcid.org/0000-0003-0301-4419"},"institutions":[{"id":"https://openalex.org/I59361560","display_name":"Instituto Polit\u00e9cnico Nacional","ror":"https://ror.org/059sp8j34","country_code":"MX","type":"education","lineage":["https://openalex.org/I59361560"]},{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT","MX"],"is_corresponding":true,"raw_author_name":"Fabrizio Ferrandi","raw_affiliation_strings":["Dipartimento di Elettronica e Informazione, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milano, Italy","Dipartimento di Elettronica e Informazione, Politecnico di ~filano, Piazza Leonardo da Vinci 32, 20133 Milano, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica e Informazione, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica e Informazione, Politecnico di ~filano, Piazza Leonardo da Vinci 32, 20133 Milano, Italy","institution_ids":["https://openalex.org/I59361560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037661652","display_name":"Alessandro Fin","orcid":null},"institutions":[{"id":"https://openalex.org/I119439378","display_name":"University of Verona","ror":"https://ror.org/039bp8j42","country_code":"IT","type":"education","lineage":["https://openalex.org/I119439378"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessandro Fin","raw_affiliation_strings":["Dipartimento di Informatica, Universit\u00e0 di Verona, Strada le Grazie 15, 37134 Verona, Italy","Dipartimento di Informatica, Universit\u00e0 di Verona, Strada Le Grazie 15, 37134 Verona, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Informatica, Universit\u00e0 di Verona, Strada le Grazie 15, 37134 Verona, Italy","institution_ids":["https://openalex.org/I119439378"]},{"raw_affiliation_string":"Dipartimento di Informatica, Universit\u00e0 di Verona, Strada Le Grazie 15, 37134 Verona, Italy","institution_ids":["https://openalex.org/I119439378"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040302302","display_name":"Franco Fummi","orcid":"https://orcid.org/0000-0002-4404-5791"},"institutions":[{"id":"https://openalex.org/I119439378","display_name":"University of Verona","ror":"https://ror.org/039bp8j42","country_code":"IT","type":"education","lineage":["https://openalex.org/I119439378"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Franco Fummi","raw_affiliation_strings":["Dipartimento di Informatica, Universit\u00e0 di Verona, Strada le Grazie 15, 37134 Verona, Italy","Dipartimento di Informatica, Universit\u00e0 di Verona, Strada Le Grazie 15, 37134 Verona, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Informatica, Universit\u00e0 di Verona, Strada le Grazie 15, 37134 Verona, Italy","institution_ids":["https://openalex.org/I119439378"]},{"raw_affiliation_string":"Dipartimento di Informatica, Universit\u00e0 di Verona, Strada Le Grazie 15, 37134 Verona, Italy","institution_ids":["https://openalex.org/I119439378"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014181688","display_name":"Donatella Sciuto","orcid":"https://orcid.org/0000-0001-9030-6940"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Donatella Sciuto","raw_affiliation_strings":["Dipartimento di Elettronica e Informazione, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milano, Italy","Dipartimento di Elettronica e Informazione, Politecnico di Milano, Piazza Leonardo da Vinci, 32-20133, Milano, Italy#TAB#"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Elettronica e Informazione, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milano, Italy","institution_ids":["https://openalex.org/I93860229"]},{"raw_affiliation_string":"Dipartimento di Elettronica e Informazione, Politecnico di Milano, Piazza Leonardo da Vinci, 32-20133, Milano, Italy#TAB#","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5028565685"],"corresponding_institution_ids":["https://openalex.org/I59361560","https://openalex.org/I93860229"],"apc_list":{"value":2800,"currency":"USD","value_usd":2800},"apc_paid":null,"fwci":0.2085,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.44641023,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"47","issue":"10","first_page":"821","last_page":"829"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7780767679214478},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6376808285713196},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.6144258379936218},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6066192984580994},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.5493967533111572},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5007302761077881},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.4990193843841553},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4470955729484558},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.4251408874988556},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.41926896572113037},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.38607269525527954},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.36197638511657715},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.22876974940299988},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2000366449356079},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1064113974571228},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.090892493724823}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7780767679214478},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6376808285713196},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.6144258379936218},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6066192984580994},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.5493967533111572},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5007302761077881},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.4990193843841553},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4470955729484558},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.4251408874988556},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.41926896572113037},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.38607269525527954},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.36197638511657715},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.22876974940299988},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2000366449356079},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1064113974571228},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.090892493724823},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/s1383-7621(01)00034-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s1383-7621(01)00034-0","pdf_url":null,"source":{"id":"https://openalex.org/S127660348","display_name":"Journal of Systems Architecture","issn_l":"1383-7621","issn":["1383-7621","1873-6165"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Systems Architecture","raw_type":"journal-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1000527","is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/1000527","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1554885925","https://openalex.org/W2031058591","https://openalex.org/W2104478015","https://openalex.org/W2116059337","https://openalex.org/W2128575665","https://openalex.org/W2152889194","https://openalex.org/W2157337442","https://openalex.org/W4245478677","https://openalex.org/W6677190564","https://openalex.org/W6679343368","https://openalex.org/W6682418931"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2021253405","https://openalex.org/W1986228509","https://openalex.org/W2147400189","https://openalex.org/W1600468096","https://openalex.org/W2154529098","https://openalex.org/W2109319621"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}