{"id":"https://openalex.org/W1966876020","doi":"https://doi.org/10.1016/s1077-2014(03)00041-x","title":"Real-time surface inspection by texture","display_name":"Real-time surface inspection by texture","publication_year":2003,"publication_date":"2003-09-12","ids":{"openalex":"https://openalex.org/W1966876020","doi":"https://doi.org/10.1016/s1077-2014(03)00041-x","mag":"1966876020"},"language":"en","primary_location":{"id":"doi:10.1016/s1077-2014(03)00041-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s1077-2014(03)00041-x","pdf_url":null,"source":{"id":"https://openalex.org/S4210204452","display_name":"Real-Time Imaging","issn_l":"1077-2014","issn":["1077-2014","1096-116X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319955","host_organization_name":"Academic Press","host_organization_lineage":["https://openalex.org/P4310319955","https://openalex.org/P4310320990"],"host_organization_lineage_names":["Academic Press","Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Real-Time Imaging","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069180171","display_name":"Topi M\u00e4enp\u00e4\u00e4","orcid":null},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":true,"raw_author_name":"Topi M\u00e4enp\u00e4\u00e4","raw_affiliation_strings":["Machine Vision Group, Department of Electrical and Information Engineering, Infotech Oulu, P.O. Box 4500, University of Oulu, FIN-90014, Finland"],"affiliations":[{"raw_affiliation_string":"Machine Vision Group, Department of Electrical and Information Engineering, Infotech Oulu, P.O. Box 4500, University of Oulu, FIN-90014, Finland","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106499897","display_name":"Markus Turtinen","orcid":null},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Markus Turtinen","raw_affiliation_strings":["Machine Vision Group, Department of Electrical and Information Engineering, Infotech Oulu, P.O. Box 4500, University of Oulu, FIN-90014, Finland"],"affiliations":[{"raw_affiliation_string":"Machine Vision Group, Department of Electrical and Information Engineering, Infotech Oulu, P.O. Box 4500, University of Oulu, FIN-90014, Finland","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014611768","display_name":"Matti Pietik\u00e4inen","orcid":"https://orcid.org/0000-0003-2263-6731"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Matti Pietik\u00e4inen","raw_affiliation_strings":["Machine Vision Group, Department of Electrical and Information Engineering, Infotech Oulu, P.O. Box 4500, University of Oulu, FIN-90014, Finland"],"affiliations":[{"raw_affiliation_string":"Machine Vision Group, Department of Electrical and Information Engineering, Infotech Oulu, P.O. Box 4500, University of Oulu, FIN-90014, Finland","institution_ids":["https://openalex.org/I98381234"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5069180171"],"corresponding_institution_ids":["https://openalex.org/I98381234"],"apc_list":null,"apc_paid":null,"fwci":4.6491,"has_fulltext":false,"cited_by_count":56,"citation_normalized_percentile":{"value":0.93626998,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"9","issue":"5","first_page":"289","last_page":"296"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/local-binary-patterns","display_name":"Local binary patterns","score":0.828132152557373},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6660094857215881},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6517512798309326},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.5704163908958435},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5084565877914429},{"id":"https://openalex.org/keywords/operator","display_name":"Operator (biology)","score":0.49484509229660034},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.49418333172798157},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4835750460624695},{"id":"https://openalex.org/keywords/texture","display_name":"Texture (cosmology)","score":0.47972267866134644},{"id":"https://openalex.org/keywords/texture-filtering","display_name":"Texture filtering","score":0.4452793598175049},{"id":"https://openalex.org/keywords/image-texture","display_name":"Image texture","score":0.3529145121574402},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.27511852979660034},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.2558490037918091},{"id":"https://openalex.org/keywords/histogram","display_name":"Histogram","score":0.13507655262947083}],"concepts":[{"id":"https://openalex.org/C87335442","wikidata":"https://www.wikidata.org/wiki/Q2494345","display_name":"Local binary patterns","level":4,"score":0.828132152557373},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6660094857215881},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6517512798309326},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.5704163908958435},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5084565877914429},{"id":"https://openalex.org/C17020691","wikidata":"https://www.wikidata.org/wiki/Q139677","display_name":"Operator (biology)","level":5,"score":0.49484509229660034},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.49418333172798157},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4835750460624695},{"id":"https://openalex.org/C2781195486","wikidata":"https://www.wikidata.org/wiki/Q289436","display_name":"Texture (cosmology)","level":3,"score":0.47972267866134644},{"id":"https://openalex.org/C144743038","wikidata":"https://www.wikidata.org/wiki/Q3267765","display_name":"Texture filtering","level":5,"score":0.4452793598175049},{"id":"https://openalex.org/C63099799","wikidata":"https://www.wikidata.org/wiki/Q17147001","display_name":"Image texture","level":4,"score":0.3529145121574402},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.27511852979660034},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.2558490037918091},{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.13507655262947083},{"id":"https://openalex.org/C158448853","wikidata":"https://www.wikidata.org/wiki/Q425218","display_name":"Repressor","level":4,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C86339819","wikidata":"https://www.wikidata.org/wiki/Q407384","display_name":"Transcription factor","level":3,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s1077-2014(03)00041-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s1077-2014(03)00041-x","pdf_url":null,"source":{"id":"https://openalex.org/S4210204452","display_name":"Real-Time Imaging","issn_l":"1077-2014","issn":["1077-2014","1096-116X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319955","host_organization_name":"Academic Press","host_organization_lineage":["https://openalex.org/P4310319955","https://openalex.org/P4310320990"],"host_organization_lineage_names":["Academic Press","Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Real-Time Imaging","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322426","display_name":"Nokia Foundation","ror":"https://ror.org/0401nzk46"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1588043677","https://openalex.org/W1610836425","https://openalex.org/W1679913846","https://openalex.org/W1988299413","https://openalex.org/W2012399871","https://openalex.org/W2014915963","https://openalex.org/W2056731645","https://openalex.org/W2089395149","https://openalex.org/W2096127742","https://openalex.org/W2112036464","https://openalex.org/W2125148312","https://openalex.org/W2145456339","https://openalex.org/W2148633389","https://openalex.org/W2159988601","https://openalex.org/W2163352848","https://openalex.org/W2164878725","https://openalex.org/W2496453168"],"related_works":["https://openalex.org/W2766950897","https://openalex.org/W4214871693","https://openalex.org/W2471967074","https://openalex.org/W2537156416","https://openalex.org/W1967418220","https://openalex.org/W4200479817","https://openalex.org/W2326926086","https://openalex.org/W1583878499","https://openalex.org/W4377834194","https://openalex.org/W2795417921"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":7},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":3}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}