{"id":"https://openalex.org/W1972083495","doi":"https://doi.org/10.1016/s0951-8320(03)00036-x","title":"A quantification algorithm for a repairable system in the GO methodology","display_name":"A quantification algorithm for a repairable system in the GO methodology","publication_year":2003,"publication_date":"2003-04-23","ids":{"openalex":"https://openalex.org/W1972083495","doi":"https://doi.org/10.1016/s0951-8320(03)00036-x","mag":"1972083495"},"language":"en","primary_location":{"id":"doi:10.1016/s0951-8320(03)00036-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0951-8320(03)00036-x","pdf_url":null,"source":{"id":"https://openalex.org/S202403813","display_name":"Reliability Engineering & System Safety","issn_l":"0951-8320","issn":["0951-8320","1879-0836"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Reliability Engineering & System Safety","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073920915","display_name":"Zupei Shen","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shen Zupei","raw_affiliation_strings":["Department of Engineering Physics, Tsinghua University, Beijing 100084, People's Republic of China"],"affiliations":[{"raw_affiliation_string":"Department of Engineering Physics, Tsinghua University, Beijing 100084, People's Republic of China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100319045","display_name":"Yao Wang","orcid":"https://orcid.org/0000-0003-4207-5273"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wang Yao","raw_affiliation_strings":["Department of Engineering Physics, Tsinghua University, Beijing 100084, People's Republic of China"],"affiliations":[{"raw_affiliation_string":"Department of Engineering Physics, Tsinghua University, Beijing 100084, People's Republic of China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":null,"display_name":"Huang Xiangrui","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huang Xiangrui","raw_affiliation_strings":["Department of Engineering Physics, Tsinghua University, Beijing 100084, People's Republic of China"],"affiliations":[{"raw_affiliation_string":"Department of Engineering Physics, Tsinghua University, Beijing 100084, People's Republic of China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5073920915"],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":{"value":4190,"currency":"USD","value_usd":4190},"apc_paid":null,"fwci":2.7607,"has_fulltext":false,"cited_by_count":48,"citation_normalized_percentile":{"value":0.89863779,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"80","issue":"3","first_page":"293","last_page":"298"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9707000255584717,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5223082900047302},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5102739334106445},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4669820964336395},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4153994619846344},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30137068033218384},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09413442015647888}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5223082900047302},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5102739334106445},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4669820964336395},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4153994619846344},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30137068033218384},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09413442015647888},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0951-8320(03)00036-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0951-8320(03)00036-x","pdf_url":null,"source":{"id":"https://openalex.org/S202403813","display_name":"Reliability Engineering & System Safety","issn_l":"0951-8320","issn":["0951-8320","1879-0836"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Reliability Engineering & System Safety","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1947190698","https://openalex.org/W2001880575","https://openalex.org/W2091588108","https://openalex.org/W2501931341","https://openalex.org/W2970626942"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2374901194","https://openalex.org/W2764722704","https://openalex.org/W3147033875","https://openalex.org/W2373081051","https://openalex.org/W2351837102","https://openalex.org/W654682640","https://openalex.org/W2465406227","https://openalex.org/W2347732194","https://openalex.org/W2364659519"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-16T08:26:57.006410","created_date":"2025-10-10T00:00:00"}