{"id":"https://openalex.org/W2016645428","doi":"https://doi.org/10.1016/s0951-8320(01)00036-9","title":"Semi-parametric PWP model robustness for log-linear increasing rates of occurrence of failures","display_name":"Semi-parametric PWP model robustness for log-linear increasing rates of occurrence of failures","publication_year":2001,"publication_date":"2001-08-01","ids":{"openalex":"https://openalex.org/W2016645428","doi":"https://doi.org/10.1016/s0951-8320(01)00036-9","mag":"2016645428"},"language":"en","primary_location":{"id":"doi:10.1016/s0951-8320(01)00036-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0951-8320(01)00036-9","pdf_url":null,"source":{"id":"https://openalex.org/S202403813","display_name":"Reliability Engineering & System Safety","issn_l":"0951-8320","issn":["0951-8320","1879-0836"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Reliability Engineering & System Safety","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103386566","display_name":"Thomas L. Landers","orcid":null},"institutions":[{"id":"https://openalex.org/I8692664","display_name":"University of Oklahoma","ror":"https://ror.org/02aqsxs83","country_code":"US","type":"education","lineage":["https://openalex.org/I8692664"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"T.L. Landers","raw_affiliation_strings":["School of Industrial Engineering, University of Oklahoma, 202 West Boyd, Suite 124, Norman, OK 73019-0631, USA"],"affiliations":[{"raw_affiliation_string":"School of Industrial Engineering, University of Oklahoma, 202 West Boyd, Suite 124, Norman, OK 73019-0631, USA","institution_ids":["https://openalex.org/I8692664"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110244829","display_name":"S.T. Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I8692664","display_name":"University of Oklahoma","ror":"https://ror.org/02aqsxs83","country_code":"US","type":"education","lineage":["https://openalex.org/I8692664"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.T. Jiang","raw_affiliation_strings":["School of Industrial Engineering, University of Oklahoma, 202 West Boyd, Suite 124, Norman, OK 73019-0631, USA"],"affiliations":[{"raw_affiliation_string":"School of Industrial Engineering, University of Oklahoma, 202 West Boyd, Suite 124, Norman, OK 73019-0631, USA","institution_ids":["https://openalex.org/I8692664"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020838837","display_name":"Jerry R. Peek","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jerry R. Peek","raw_affiliation_strings":["US Army School of Engineering and Logistics (AMXMC-SEL), Texarkana, TX 75507-5000, USA"],"affiliations":[{"raw_affiliation_string":"US Army School of Engineering and Logistics (AMXMC-SEL), Texarkana, TX 75507-5000, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5103386566"],"corresponding_institution_ids":["https://openalex.org/I8692664"],"apc_list":{"value":4190,"currency":"USD","value_usd":4190},"apc_paid":null,"fwci":0.3999,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.62570971,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"73","issue":"2","first_page":"145","last_page":"153"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9847999811172485,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/maintainability","display_name":"Maintainability","score":0.8321844339370728},{"id":"https://openalex.org/keywords/covariate","display_name":"Covariate","score":0.7807947397232056},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.7572604417800903},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6639002561569214},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5801330208778381},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.5221748352050781},{"id":"https://openalex.org/keywords/log-linear-model","display_name":"Log-linear model","score":0.492527574300766},{"id":"https://openalex.org/keywords/generalized-linear-model","display_name":"Generalized linear model","score":0.4507210850715637},{"id":"https://openalex.org/keywords/poisson-distribution","display_name":"Poisson distribution","score":0.4455410838127136},{"id":"https://openalex.org/keywords/parametric-model","display_name":"Parametric model","score":0.4296756982803345},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4262131452560425},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40525150299072266},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3851899206638336},{"id":"https://openalex.org/keywords/linear-model","display_name":"Linear model","score":0.36977502703666687},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22965264320373535}],"concepts":[{"id":"https://openalex.org/C160713754","wikidata":"https://www.wikidata.org/wiki/Q1389965","display_name":"Maintainability","level":2,"score":0.8321844339370728},{"id":"https://openalex.org/C119043178","wikidata":"https://www.wikidata.org/wiki/Q320723","display_name":"Covariate","level":2,"score":0.7807947397232056},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.7572604417800903},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6639002561569214},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5801330208778381},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.5221748352050781},{"id":"https://openalex.org/C70519679","wikidata":"https://www.wikidata.org/wiki/Q6666755","display_name":"Log-linear model","level":3,"score":0.492527574300766},{"id":"https://openalex.org/C41587187","wikidata":"https://www.wikidata.org/wiki/Q1501882","display_name":"Generalized linear model","level":2,"score":0.4507210850715637},{"id":"https://openalex.org/C100906024","wikidata":"https://www.wikidata.org/wiki/Q205692","display_name":"Poisson distribution","level":2,"score":0.4455410838127136},{"id":"https://openalex.org/C24574437","wikidata":"https://www.wikidata.org/wiki/Q7135228","display_name":"Parametric model","level":3,"score":0.4296756982803345},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4262131452560425},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40525150299072266},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3851899206638336},{"id":"https://openalex.org/C163175372","wikidata":"https://www.wikidata.org/wiki/Q3339222","display_name":"Linear model","level":2,"score":0.36977502703666687},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22965264320373535},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0951-8320(01)00036-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0951-8320(01)00036-9","pdf_url":null,"source":{"id":"https://openalex.org/S202403813","display_name":"Reliability Engineering & System Safety","issn_l":"0951-8320","issn":["0951-8320","1879-0836"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Reliability Engineering & System Safety","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","score":0.5699999928474426,"id":"https://metadata.un.org/sdg/12"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W14428124","https://openalex.org/W566814908","https://openalex.org/W1535183290","https://openalex.org/W1965696701","https://openalex.org/W1973872091","https://openalex.org/W1979689259","https://openalex.org/W1981784575","https://openalex.org/W1983548070","https://openalex.org/W1988910804","https://openalex.org/W1993855344","https://openalex.org/W2027299010","https://openalex.org/W2032725394","https://openalex.org/W2055041842","https://openalex.org/W2063697901","https://openalex.org/W2067244657","https://openalex.org/W2085594550","https://openalex.org/W2101321795","https://openalex.org/W2137611809","https://openalex.org/W2140481308","https://openalex.org/W2143470464","https://openalex.org/W2145159920","https://openalex.org/W2163380970","https://openalex.org/W2557449628","https://openalex.org/W3022253575","https://openalex.org/W3147894994","https://openalex.org/W4205388733","https://openalex.org/W4230730431","https://openalex.org/W4250755306","https://openalex.org/W6600571896","https://openalex.org/W6632022884"],"related_works":["https://openalex.org/W3081465059","https://openalex.org/W1564867470","https://openalex.org/W1499586567","https://openalex.org/W49891529","https://openalex.org/W1510072949","https://openalex.org/W2071317420","https://openalex.org/W4242914513","https://openalex.org/W4242077822","https://openalex.org/W2485681252","https://openalex.org/W2086067392"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}