{"id":"https://openalex.org/W2043998723","doi":"https://doi.org/10.1016/s0950-5849(02)00129-5","title":"Fault-based testing without the need of oracles","display_name":"Fault-based testing without the need of oracles","publication_year":2002,"publication_date":"2002-12-30","ids":{"openalex":"https://openalex.org/W2043998723","doi":"https://doi.org/10.1016/s0950-5849(02)00129-5","mag":"2043998723"},"language":"en","primary_location":{"id":"doi:10.1016/s0950-5849(02)00129-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0950-5849(02)00129-5","pdf_url":null,"source":{"id":"https://openalex.org/S205010575","display_name":"Information and Software Technology","issn_l":"0950-5849","issn":["0950-5849","1873-6025"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Information and Software Technology","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/10722/55518","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035107113","display_name":"Tsong Yueh Chen","orcid":"https://orcid.org/0000-0003-3578-0994"},"institutions":[{"id":"https://openalex.org/I57093077","display_name":"Swinburne University of Technology","ror":"https://ror.org/031rekg67","country_code":"AU","type":"education","lineage":["https://openalex.org/I57093077"]}],"countries":["AU"],"is_corresponding":true,"raw_author_name":"T.Y. Chen","raw_affiliation_strings":["School of Information Technology, Swinburne University of Technology, P.O. Box 218, Hawthorn, Vic. 3122, Australia"],"affiliations":[{"raw_affiliation_string":"School of Information Technology, Swinburne University of Technology, P.O. Box 218, Hawthorn, Vic. 3122, Australia","institution_ids":["https://openalex.org/I57093077"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049494347","display_name":"T.H. Tse","orcid":"https://orcid.org/0000-0002-0460-8377"},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"T.H. Tse","raw_affiliation_strings":["Department of Computer Science and Information Systems, The University of Hong Kong, Hong Kong"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Systems, The University of Hong Kong, Hong Kong","institution_ids":["https://openalex.org/I889458895"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069910503","display_name":"Zhi Quan Zhou","orcid":"https://orcid.org/0000-0003-1769-9367"},"institutions":[{"id":"https://openalex.org/I889458895","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86","country_code":"HK","type":"education","lineage":["https://openalex.org/I889458895"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Z.Q. Zhou","raw_affiliation_strings":["Department of Computer Science and Information Systems, The University of Hong Kong, Hong Kong"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Systems, The University of Hong Kong, Hong Kong","institution_ids":["https://openalex.org/I889458895"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5035107113"],"corresponding_institution_ids":["https://openalex.org/I57093077"],"apc_list":{"value":3350,"currency":"USD","value_usd":3350},"apc_paid":null,"fwci":2.8656,"has_fulltext":false,"cited_by_count":178,"citation_normalized_percentile":{"value":0.8942577,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"45","issue":"1","first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/oracle","display_name":"Oracle","score":0.8297981023788452},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7240855693817139},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5739064812660217},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5610447525978088},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5383999943733215},{"id":"https://openalex.org/keywords/black-box-testing","display_name":"Black-box testing","score":0.5378135442733765},{"id":"https://openalex.org/keywords/non-regression-testing","display_name":"Non-regression testing","score":0.5237457752227783},{"id":"https://openalex.org/keywords/software-testing","display_name":"Software testing","score":0.5201923847198486},{"id":"https://openalex.org/keywords/white-box-testing","display_name":"White-box testing","score":0.5162867903709412},{"id":"https://openalex.org/keywords/integration-testing","display_name":"Integration testing","score":0.5123521089553833},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4757796823978424},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.47008490562438965},{"id":"https://openalex.org/keywords/keyword-driven-testing","display_name":"Keyword-driven testing","score":0.4436194896697998},{"id":"https://openalex.org/keywords/software-performance-testing","display_name":"Software performance testing","score":0.41972020268440247},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.4181046783924103},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.411994069814682},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.40383821725845337},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.327256441116333},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.17426639795303345},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1691392958164215},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.15468084812164307},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.13920652866363525}],"concepts":[{"id":"https://openalex.org/C55166926","wikidata":"https://www.wikidata.org/wiki/Q2892946","display_name":"Oracle","level":2,"score":0.8297981023788452},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7240855693817139},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5739064812660217},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5610447525978088},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5383999943733215},{"id":"https://openalex.org/C24169984","wikidata":"https://www.wikidata.org/wiki/Q879969","display_name":"Black-box testing","level":5,"score":0.5378135442733765},{"id":"https://openalex.org/C86469151","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Non-regression testing","level":5,"score":0.5237457752227783},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.5201923847198486},{"id":"https://openalex.org/C162443782","wikidata":"https://www.wikidata.org/wiki/Q1066228","display_name":"White-box testing","level":5,"score":0.5162867903709412},{"id":"https://openalex.org/C107683887","wikidata":"https://www.wikidata.org/wiki/Q782466","display_name":"Integration testing","level":3,"score":0.5123521089553833},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4757796823978424},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.47008490562438965},{"id":"https://openalex.org/C169168650","wikidata":"https://www.wikidata.org/wiki/Q1675637","display_name":"Keyword-driven testing","level":5,"score":0.4436194896697998},{"id":"https://openalex.org/C178059732","wikidata":"https://www.wikidata.org/wiki/Q1982529","display_name":"Software performance testing","level":5,"score":0.41972020268440247},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.4181046783924103},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.411994069814682},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.40383821725845337},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.327256441116333},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.17426639795303345},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1691392958164215},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.15468084812164307},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.13920652866363525},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1016/s0950-5849(02)00129-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0950-5849(02)00129-5","pdf_url":null,"source":{"id":"https://openalex.org/S205010575","display_name":"Information and Software Technology","issn_l":"0950-5849","issn":["0950-5849","1873-6025"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Information and Software Technology","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.19.4537","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.19.4537","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.csis.hku.hk/research/techreps/document/TR-2002-07.pdf","raw_type":"text"},{"id":"pmh:oai:hub.hku.hk:10722/55518","is_oa":true,"landing_page_url":"http://hdl.handle.net/10722/55518","pdf_url":null,"source":{"id":"https://openalex.org/S4377196271","display_name":"The HKU Scholars Hub (University of Hong Kong)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I889458895","host_organization_name":"University of Hong Kong","host_organization_lineage":["https://openalex.org/I889458895"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"},{"id":"pmh:oai:researchbank.swinburne.edu.au:4dd5ece7-537a-4a98-bf86-f43ff65522ec/1","is_oa":false,"landing_page_url":"http://hdl.handle.net/1959.3/1019","pdf_url":null,"source":{"id":"https://openalex.org/S4306401157","display_name":"Swinburne Research Bank (Swinburne University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I57093077","host_organization_name":"Swinburne University of Technology","host_organization_lineage":["https://openalex.org/I57093077"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Information and software technology, Vol. 45, no. 1 (Jan 2003), pp. 1-9","raw_type":""}],"best_oa_location":{"id":"pmh:oai:hub.hku.hk:10722/55518","is_oa":true,"landing_page_url":"http://hdl.handle.net/10722/55518","pdf_url":null,"source":{"id":"https://openalex.org/S4377196271","display_name":"The HKU Scholars Hub (University of Hong Kong)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I889458895","host_organization_name":"University of Hong Kong","host_organization_lineage":["https://openalex.org/I889458895"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W16162031","https://openalex.org/W82953342","https://openalex.org/W127224647","https://openalex.org/W346782573","https://openalex.org/W1527688737","https://openalex.org/W1608397552","https://openalex.org/W1895113725","https://openalex.org/W1910771831","https://openalex.org/W1963924029","https://openalex.org/W1979868167","https://openalex.org/W1995109607","https://openalex.org/W1996596150","https://openalex.org/W1996839061","https://openalex.org/W2006159725","https://openalex.org/W2025316954","https://openalex.org/W2040832338","https://openalex.org/W2049695835","https://openalex.org/W2051343139","https://openalex.org/W2068429692","https://openalex.org/W2089961470","https://openalex.org/W2110441383","https://openalex.org/W2119249385","https://openalex.org/W2120552859","https://openalex.org/W2121084350","https://openalex.org/W2134124281","https://openalex.org/W2171207016","https://openalex.org/W3004537778","https://openalex.org/W3010856131","https://openalex.org/W3098321377","https://openalex.org/W3155461036","https://openalex.org/W4250786511","https://openalex.org/W6600659159","https://openalex.org/W6663638160","https://openalex.org/W6794927178"],"related_works":["https://openalex.org/W3214776400","https://openalex.org/W3197709817","https://openalex.org/W2387992358","https://openalex.org/W2560445721","https://openalex.org/W2915670848","https://openalex.org/W3133844515","https://openalex.org/W2030223260","https://openalex.org/W2376559135","https://openalex.org/W2376226556","https://openalex.org/W2183799055"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":11},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":15},{"year":2018,"cited_by_count":14},{"year":2017,"cited_by_count":9},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":13},{"year":2014,"cited_by_count":10},{"year":2013,"cited_by_count":7},{"year":2012,"cited_by_count":6}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}