{"id":"https://openalex.org/W1982739237","doi":"https://doi.org/10.1016/s0305-0548(03)00143-6","title":"Resource allocation during tests for optimally reliable software","display_name":"Resource allocation during tests for optimally reliable software","publication_year":2003,"publication_date":"2003-06-02","ids":{"openalex":"https://openalex.org/W1982739237","doi":"https://doi.org/10.1016/s0305-0548(03)00143-6","mag":"1982739237"},"language":"en","primary_location":{"id":"doi:10.1016/s0305-0548(03)00143-6","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0305-0548(03)00143-6","pdf_url":null,"source":{"id":"https://openalex.org/S173256270","display_name":"Computers & Operations Research","issn_l":"0305-0548","issn":["0305-0548","1873-765X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computers & Operations Research","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111605738","display_name":"Oded Berman","orcid":null},"institutions":[{"id":"https://openalex.org/I185261750","display_name":"University of Toronto","ror":"https://ror.org/03dbr7087","country_code":"CA","type":"education","lineage":["https://openalex.org/I185261750"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Oded Berman","raw_affiliation_strings":["Joseph L. Rotman School of Management, University of Toronto, Toronto, Ont., Canada M5S 3E6"],"affiliations":[{"raw_affiliation_string":"Joseph L. Rotman School of Management, University of Toronto, Toronto, Ont., Canada M5S 3E6","institution_ids":["https://openalex.org/I185261750"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015386539","display_name":"Michal Cutler","orcid":null},"institutions":[{"id":"https://openalex.org/I123946342","display_name":"Binghamton University","ror":"https://ror.org/008rmbt77","country_code":"US","type":"education","lineage":["https://openalex.org/I123946342"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michal Cutler","raw_affiliation_strings":["Department of Computer Science, Watson School of Engineering and Applied Science, Binghamton University, Binghamton, NY#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Watson School of Engineering and Applied Science, Binghamton University, Binghamton, NY#TAB#","institution_ids":["https://openalex.org/I123946342"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5111605738"],"corresponding_institution_ids":["https://openalex.org/I185261750"],"apc_list":{"value":3210,"currency":"USD","value_usd":3210},"apc_paid":null,"fwci":1.1474,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.78417702,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"31","issue":"11","first_page":"1847","last_page":"1865"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7131919264793396},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6539014577865601},{"id":"https://openalex.org/keywords/test-plan","display_name":"Test plan","score":0.5791893601417542},{"id":"https://openalex.org/keywords/test-management-approach","display_name":"Test Management Approach","score":0.5099738836288452},{"id":"https://openalex.org/keywords/system-under-test","display_name":"System under test","score":0.49274829030036926},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.47976407408714294},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.46778711676597595},{"id":"https://openalex.org/keywords/white-box-testing","display_name":"White-box testing","score":0.4673096835613251},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.458100825548172},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.4383399784564972},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.43551862239837646},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.43036291003227234},{"id":"https://openalex.org/keywords/solver","display_name":"Solver","score":0.42556232213974},{"id":"https://openalex.org/keywords/regression-testing","display_name":"Regression testing","score":0.4177875518798828},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.18464413285255432},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.14496365189552307},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12433141469955444},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11289525032043457},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11257001757621765},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.07901203632354736}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7131919264793396},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6539014577865601},{"id":"https://openalex.org/C12148698","wikidata":"https://www.wikidata.org/wiki/Q364651","display_name":"Test plan","level":3,"score":0.5791893601417542},{"id":"https://openalex.org/C7435765","wikidata":"https://www.wikidata.org/wiki/Q7705776","display_name":"Test Management Approach","level":5,"score":0.5099738836288452},{"id":"https://openalex.org/C108913964","wikidata":"https://www.wikidata.org/wiki/Q2376856","display_name":"System under test","level":4,"score":0.49274829030036926},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.47976407408714294},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.46778711676597595},{"id":"https://openalex.org/C162443782","wikidata":"https://www.wikidata.org/wiki/Q1066228","display_name":"White-box testing","level":5,"score":0.4673096835613251},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.458100825548172},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.4383399784564972},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.43551862239837646},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.43036291003227234},{"id":"https://openalex.org/C2778770139","wikidata":"https://www.wikidata.org/wiki/Q1966904","display_name":"Solver","level":2,"score":0.42556232213974},{"id":"https://openalex.org/C161821725","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Regression testing","level":5,"score":0.4177875518798828},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.18464413285255432},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.14496365189552307},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12433141469955444},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11289525032043457},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11257001757621765},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.07901203632354736},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0305-0548(03)00143-6","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0305-0548(03)00143-6","pdf_url":null,"source":{"id":"https://openalex.org/S173256270","display_name":"Computers & Operations Research","issn_l":"0305-0548","issn":["0305-0548","1873-765X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computers & Operations Research","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1509672965","https://openalex.org/W1523596170","https://openalex.org/W1811527611","https://openalex.org/W1967552764","https://openalex.org/W1969899658","https://openalex.org/W1973516349","https://openalex.org/W1985190062","https://openalex.org/W1985233723","https://openalex.org/W1988011858","https://openalex.org/W1993101065","https://openalex.org/W1993299214","https://openalex.org/W2057928588","https://openalex.org/W2068526529","https://openalex.org/W2074465314","https://openalex.org/W2085277474","https://openalex.org/W2106852609","https://openalex.org/W2120197740","https://openalex.org/W2131764713","https://openalex.org/W2134148845","https://openalex.org/W2134582578","https://openalex.org/W2136457764","https://openalex.org/W2139277740","https://openalex.org/W2325693178","https://openalex.org/W2483870591","https://openalex.org/W2491190097","https://openalex.org/W4285719527","https://openalex.org/W6675844634","https://openalex.org/W6722406322"],"related_works":["https://openalex.org/W3153101966","https://openalex.org/W1604038184","https://openalex.org/W1969158622","https://openalex.org/W2184612063","https://openalex.org/W2387255326","https://openalex.org/W2138339522","https://openalex.org/W2560965237","https://openalex.org/W2767512594","https://openalex.org/W632606703","https://openalex.org/W2111640426"],"abstract_inverted_index":null,"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}