{"id":"https://openalex.org/W2041987931","doi":"https://doi.org/10.1016/s0167-9260(01)00014-1","title":"Frequency-dependent mutual resistance and inductance formulas for coupled IC interconnects on an Si-SiO2 substrate","display_name":"Frequency-dependent mutual resistance and inductance formulas for coupled IC interconnects on an Si-SiO2 substrate","publication_year":2001,"publication_date":"2001-10-01","ids":{"openalex":"https://openalex.org/W2041987931","doi":"https://doi.org/10.1016/s0167-9260(01)00014-1","mag":"2041987931"},"language":"en","primary_location":{"id":"doi:10.1016/s0167-9260(01)00014-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0167-9260(01)00014-1","pdf_url":null,"source":{"id":"https://openalex.org/S139392130","display_name":"Integration","issn_l":"0167-9260","issn":["0167-9260","1872-7522"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Integration","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111687132","display_name":"Hasan Ymeri","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Hasan Ymeri","raw_affiliation_strings":["Katholieke Universiteit Leuven, Department of Electrical Engineering (ESAT), Division ESAT-TELEMIC, Kasteelpark Arenberg 10, B-3001 Leuven-Heverlee, Belgium","Katholieke Universiteit Leuven, Department of Electrical#N# Engineering (ESAT), Division ESAT-TELEMIC, Kasteelpark Arenberg 10, B-3001#N# Leuven-Heverlee, Belgium"],"affiliations":[{"raw_affiliation_string":"Katholieke Universiteit Leuven, Department of Electrical Engineering (ESAT), Division ESAT-TELEMIC, Kasteelpark Arenberg 10, B-3001 Leuven-Heverlee, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"Katholieke Universiteit Leuven, Department of Electrical#N# Engineering (ESAT), Division ESAT-TELEMIC, Kasteelpark Arenberg 10, B-3001#N# Leuven-Heverlee, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032370530","display_name":"Bart Nauwelaers","orcid":"https://orcid.org/0000-0003-3986-2786"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Bart Nauwelaers","raw_affiliation_strings":["Katholieke Universiteit Leuven, Department of Electrical Engineering (ESAT), Division ESAT-TELEMIC, Kasteelpark Arenberg 10, B-3001 Leuven-Heverlee, Belgium","Katholieke Universiteit Leuven, Department of Electrical#N# Engineering (ESAT), Division ESAT-TELEMIC, Kasteelpark Arenberg 10, B-3001#N# Leuven-Heverlee, Belgium"],"affiliations":[{"raw_affiliation_string":"Katholieke Universiteit Leuven, Department of Electrical Engineering (ESAT), Division ESAT-TELEMIC, Kasteelpark Arenberg 10, B-3001 Leuven-Heverlee, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"Katholieke Universiteit Leuven, Department of Electrical#N# Engineering (ESAT), Division ESAT-TELEMIC, Kasteelpark Arenberg 10, B-3001#N# Leuven-Heverlee, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110128571","display_name":"Karen Maex","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Karen Maex","raw_affiliation_strings":["IMEC, Kapeldreef 75, B-3001 Leuven, Belgium","Imec, Kapeldreef 75, B\u20103001 Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"IMEC, Kapeldreef 75, B-3001 Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Imec, Kapeldreef 75, B\u20103001 Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5111687132"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":{"value":2150,"currency":"USD","value_usd":2150},"apc_paid":null,"fwci":0.4355,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.68622606,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"30","issue":"2","first_page":"133","last_page":"141"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.7777165770530701},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5690239667892456},{"id":"https://openalex.org/keywords/transformation","display_name":"Transformation (genetics)","score":0.4933876097202301},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.48901328444480896},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.48364078998565674},{"id":"https://openalex.org/keywords/skin-effect","display_name":"Skin effect","score":0.47227203845977783},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.4608021080493927},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.4482033848762512},{"id":"https://openalex.org/keywords/lossy-compression","display_name":"Lossy compression","score":0.4381946623325348},{"id":"https://openalex.org/keywords/fourier-transform","display_name":"Fourier transform","score":0.4188823997974396},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37317174673080444},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2775534987449646},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19524860382080078},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17868223786354065},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.10822951793670654}],"concepts":[{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.7777165770530701},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5690239667892456},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.4933876097202301},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.48901328444480896},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.48364078998565674},{"id":"https://openalex.org/C151482245","wikidata":"https://www.wikidata.org/wiki/Q664150","display_name":"Skin effect","level":2,"score":0.47227203845977783},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.4608021080493927},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.4482033848762512},{"id":"https://openalex.org/C165021410","wikidata":"https://www.wikidata.org/wiki/Q55564","display_name":"Lossy compression","level":2,"score":0.4381946623325348},{"id":"https://openalex.org/C102519508","wikidata":"https://www.wikidata.org/wiki/Q6520159","display_name":"Fourier transform","level":2,"score":0.4188823997974396},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37317174673080444},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2775534987449646},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19524860382080078},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17868223786354065},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10822951793670654},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0167-9260(01)00014-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0167-9260(01)00014-1","pdf_url":null,"source":{"id":"https://openalex.org/S139392130","display_name":"Integration","issn_l":"0167-9260","issn":["0167-9260","1872-7522"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Integration","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1532219419","https://openalex.org/W1570872727","https://openalex.org/W1971718973","https://openalex.org/W1982982953","https://openalex.org/W2042263500","https://openalex.org/W2079012541","https://openalex.org/W2097757175","https://openalex.org/W2107365385","https://openalex.org/W2114586954","https://openalex.org/W2117930078","https://openalex.org/W2157005274","https://openalex.org/W3119264854"],"related_works":["https://openalex.org/W1995805316","https://openalex.org/W2387503788","https://openalex.org/W2109314689","https://openalex.org/W1911543349","https://openalex.org/W2057519612","https://openalex.org/W2096441037","https://openalex.org/W2047130476","https://openalex.org/W2313177381","https://openalex.org/W2135245481","https://openalex.org/W1495269561"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}