{"id":"https://openalex.org/W2106432284","doi":"https://doi.org/10.1016/s0167-8655(02)00174-5","title":"Aggressive region growing for speckle reduction in ultrasound images","display_name":"Aggressive region growing for speckle reduction in ultrasound images","publication_year":2003,"publication_date":"2003-01-09","ids":{"openalex":"https://openalex.org/W2106432284","doi":"https://doi.org/10.1016/s0167-8655(02)00174-5","mag":"2106432284"},"language":"en","primary_location":{"id":"doi:10.1016/s0167-8655(02)00174-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0167-8655(02)00174-5","pdf_url":null,"source":{"id":"https://openalex.org/S151820558","display_name":"Pattern Recognition Letters","issn_l":"0167-8655","issn":["0167-8655","1872-7344"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Recognition Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100378075","display_name":"Yan Chen","orcid":"https://orcid.org/0000-0002-3227-4562"},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Yan Chen","raw_affiliation_strings":["Siemens Medical Imaging, Issaquah, WA 98127, USA","Siemens Medical Imaging, Issaquah, WA#TAB#"],"affiliations":[{"raw_affiliation_string":"Siemens Medical Imaging, Issaquah, WA 98127, USA","institution_ids":[]},{"raw_affiliation_string":"Siemens Medical Imaging, Issaquah, WA#TAB#","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051651573","display_name":"Ruming Yin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210152613","display_name":"Maxim Integrated (United States)","ror":"https://ror.org/056c8b450","country_code":"US","type":"company","lineage":["https://openalex.org/I4210152613"]},{"id":"https://openalex.org/I47646028","display_name":"Maxim Integrated (United Kingdom)","ror":"https://ror.org/004b7jc50","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210152613","https://openalex.org/I47646028"]}],"countries":["GB","US"],"is_corresponding":false,"raw_author_name":"Ruming Yin","raw_affiliation_strings":["Maxim Integrated Products, Portland, OR 97124, USA","Maxim Integrated Products, Portland, OR"],"affiliations":[{"raw_affiliation_string":"Maxim Integrated Products, Portland, OR 97124, USA","institution_ids":["https://openalex.org/I4210152613"]},{"raw_affiliation_string":"Maxim Integrated Products, Portland, OR","institution_ids":["https://openalex.org/I47646028"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039987576","display_name":"Patrick J. Flynn","orcid":"https://orcid.org/0000-0002-5446-114X"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Patrick Flynn","raw_affiliation_strings":["Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN 46556, USA","Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN 46556, USA","institution_ids":["https://openalex.org/I107639228"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037467986","display_name":"Shira L. Broschat","orcid":"https://orcid.org/0000-0001-9894-7371"},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shira Broschat","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Washington State University, P.O. Box 642752, Pullman, WA 99164-2752, USA","School of Electrical Engineering and Computer Science, Washington State University, P.O. Box 642752, Pullman, WA#TAB#"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Washington State University, P.O. Box 642752, Pullman, WA 99164-2752, USA","institution_ids":["https://openalex.org/I72951846"]},{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Washington State University, P.O. Box 642752, Pullman, WA#TAB#","institution_ids":["https://openalex.org/I72951846"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5039987576"],"corresponding_institution_ids":["https://openalex.org/I107639228"],"apc_list":{"value":2500,"currency":"USD","value_usd":2500},"apc_paid":null,"fwci":4.3232,"has_fulltext":false,"cited_by_count":124,"citation_normalized_percentile":{"value":0.94671968,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"24","issue":"4-5","first_page":"677","last_page":"691"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/speckle-pattern","display_name":"Speckle pattern","score":0.8429281711578369},{"id":"https://openalex.org/keywords/speckle-noise","display_name":"Speckle noise","score":0.7988859415054321},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.617719829082489},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5942355394363403},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5904307961463928},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.5862818360328674},{"id":"https://openalex.org/keywords/median-filter","display_name":"Median filter","score":0.5658081769943237},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.5602136254310608},{"id":"https://openalex.org/keywords/homogeneity","display_name":"Homogeneity (statistics)","score":0.5570618510246277},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5116629600524902},{"id":"https://openalex.org/keywords/adaptive-filter","display_name":"Adaptive filter","score":0.4766862392425537},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.46344590187072754},{"id":"https://openalex.org/keywords/homogeneous","display_name":"Homogeneous","score":0.42881307005882263},{"id":"https://openalex.org/keywords/bilateral-filter","display_name":"Bilateral filter","score":0.41364994645118713},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3611200749874115},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.35137301683425903},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3149539828300476},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.24855846166610718},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11154648661613464}],"concepts":[{"id":"https://openalex.org/C102290492","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle pattern","level":2,"score":0.8429281711578369},{"id":"https://openalex.org/C180940675","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle noise","level":3,"score":0.7988859415054321},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.617719829082489},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5942355394363403},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5904307961463928},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.5862818360328674},{"id":"https://openalex.org/C55352655","wikidata":"https://www.wikidata.org/wiki/Q304247","display_name":"Median filter","level":4,"score":0.5658081769943237},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.5602136254310608},{"id":"https://openalex.org/C142259097","wikidata":"https://www.wikidata.org/wiki/Q5891314","display_name":"Homogeneity (statistics)","level":2,"score":0.5570618510246277},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5116629600524902},{"id":"https://openalex.org/C102248274","wikidata":"https://www.wikidata.org/wiki/Q168388","display_name":"Adaptive filter","level":2,"score":0.4766862392425537},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.46344590187072754},{"id":"https://openalex.org/C66882249","wikidata":"https://www.wikidata.org/wiki/Q169336","display_name":"Homogeneous","level":2,"score":0.42881307005882263},{"id":"https://openalex.org/C156140930","wikidata":"https://www.wikidata.org/wiki/Q860417","display_name":"Bilateral filter","level":3,"score":0.41364994645118713},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3611200749874115},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.35137301683425903},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3149539828300476},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.24855846166610718},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11154648661613464},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0167-8655(02)00174-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0167-8655(02)00174-5","pdf_url":null,"source":{"id":"https://openalex.org/S151820558","display_name":"Pattern Recognition Letters","issn_l":"0167-8655","issn":["0167-8655","1872-7344"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Recognition Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1976708251","https://openalex.org/W1989957515","https://openalex.org/W1993250007","https://openalex.org/W2072596323","https://openalex.org/W2072843185","https://openalex.org/W2080552182","https://openalex.org/W2093680414","https://openalex.org/W2115310626","https://openalex.org/W2130622335","https://openalex.org/W2133363710","https://openalex.org/W2139736062","https://openalex.org/W2147255070","https://openalex.org/W2153332563","https://openalex.org/W2160527941","https://openalex.org/W3017045385","https://openalex.org/W4244901367"],"related_works":["https://openalex.org/W2065648684","https://openalex.org/W2009383287","https://openalex.org/W2042914788","https://openalex.org/W2182190754","https://openalex.org/W4321264664","https://openalex.org/W2121688719","https://openalex.org/W2016481886","https://openalex.org/W2055824452","https://openalex.org/W2727313114","https://openalex.org/W1989852278"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":8},{"year":2013,"cited_by_count":8},{"year":2012,"cited_by_count":12}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}