{"id":"https://openalex.org/W1995532839","doi":"https://doi.org/10.1016/s0165-1684(00)00093-1","title":"Fractal analysis with applications to seismological pattern recognition of underground nuclear explosions","display_name":"Fractal analysis with applications to seismological pattern recognition of underground nuclear explosions","publication_year":2000,"publication_date":"2000-09-01","ids":{"openalex":"https://openalex.org/W1995532839","doi":"https://doi.org/10.1016/s0165-1684(00)00093-1","mag":"1995532839"},"language":"en","primary_location":{"id":"doi:10.1016/s0165-1684(00)00093-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0165-1684(00)00093-1","pdf_url":null,"source":{"id":"https://openalex.org/S154637859","display_name":"Signal Processing","issn_l":"0165-1684","issn":["0165-1684","1872-7557"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Signal Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042638070","display_name":"Daizhi Liu","orcid":"https://orcid.org/0000-0002-2658-0790"},"institutions":[{"id":"https://openalex.org/I4210130660","display_name":"Xi'an High Tech University","ror":"https://ror.org/03vt7za95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210130660"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Daizhi Liu","raw_affiliation_strings":["Section 103, Xi'an Research Institute of High Technology, Hongqing Town, Baqiao, Xi'an, Shanxi Province 710025, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Section 103, Xi'an Research Institute of High Technology, Hongqing Town, Baqiao, Xi'an, Shanxi Province 710025, People's Republic of China","institution_ids":["https://openalex.org/I4210130660"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108950956","display_name":"Ke Zhao","orcid":"https://orcid.org/0000-0003-1284-6962"},"institutions":[{"id":"https://openalex.org/I4210130660","display_name":"Xi'an High Tech University","ror":"https://ror.org/03vt7za95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210130660"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ke Zhao","raw_affiliation_strings":["Section 103, Xi'an Research Institute of High Technology, Hongqing Town, Baqiao, Xi'an, Shanxi Province 710025, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Section 103, Xi'an Research Institute of High Technology, Hongqing Town, Baqiao, Xi'an, Shanxi Province 710025, People's Republic of China","institution_ids":["https://openalex.org/I4210130660"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078419612","display_name":"Hongxing Zou","orcid":null},"institutions":[{"id":"https://openalex.org/I4210130660","display_name":"Xi'an High Tech University","ror":"https://ror.org/03vt7za95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210130660"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongxing Zou","raw_affiliation_strings":["Section 103, Xi'an Research Institute of High Technology, Hongqing Town, Baqiao, Xi'an, Shanxi Province 710025, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Section 103, Xi'an Research Institute of High Technology, Hongqing Town, Baqiao, Xi'an, Shanxi Province 710025, People's Republic of China","institution_ids":["https://openalex.org/I4210130660"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100675260","display_name":"Juan Su","orcid":"https://orcid.org/0000-0001-7035-2560"},"institutions":[{"id":"https://openalex.org/I4210130660","display_name":"Xi'an High Tech University","ror":"https://ror.org/03vt7za95","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210130660"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Juan Su","raw_affiliation_strings":["Section 103, Xi'an Research Institute of High Technology, Hongqing Town, Baqiao, Xi'an, Shanxi Province 710025, People's Republic of China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Section 103, Xi'an Research Institute of High Technology, Hongqing Town, Baqiao, Xi'an, Shanxi Province 710025, People's Republic of China","institution_ids":["https://openalex.org/I4210130660"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210130660"],"apc_list":{"value":3200,"currency":"USD","value_usd":3200},"apc_paid":null,"fwci":1.1882,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.8077302,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"80","issue":"9","first_page":"1849","last_page":"1861"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13018","display_name":"Seismology and Earthquake Studies","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12424","display_name":"Earthquake Detection and Analysis","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fractal","display_name":"Fractal","score":0.7193901538848877},{"id":"https://openalex.org/keywords/fractal-analysis","display_name":"Fractal analysis","score":0.6369604468345642},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.4573797881603241},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.45730406045913696},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.42062634229660034},{"id":"https://openalex.org/keywords/fractal-dimension","display_name":"Fractal dimension","score":0.35403889417648315},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34222519397735596},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3395446538925171},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2937193512916565},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22695228457450867},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.08942431211471558}],"concepts":[{"id":"https://openalex.org/C40636538","wikidata":"https://www.wikidata.org/wiki/Q81392","display_name":"Fractal","level":2,"score":0.7193901538848877},{"id":"https://openalex.org/C162494671","wikidata":"https://www.wikidata.org/wiki/Q2845227","display_name":"Fractal analysis","level":4,"score":0.6369604468345642},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.4573797881603241},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.45730406045913696},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.42062634229660034},{"id":"https://openalex.org/C26546657","wikidata":"https://www.wikidata.org/wiki/Q1412452","display_name":"Fractal dimension","level":3,"score":0.35403889417648315},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34222519397735596},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3395446538925171},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2937193512916565},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22695228457450867},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.08942431211471558}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0165-1684(00)00093-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0165-1684(00)00093-1","pdf_url":null,"source":{"id":"https://openalex.org/S154637859","display_name":"Signal Processing","issn_l":"0165-1684","issn":["0165-1684","1872-7557"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Signal Processing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7099999785423279,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W55959736","https://openalex.org/W594107697","https://openalex.org/W1525067042","https://openalex.org/W1606846851","https://openalex.org/W1623080549","https://openalex.org/W1986372184","https://openalex.org/W1991457789","https://openalex.org/W2000902737","https://openalex.org/W2018401483","https://openalex.org/W2022385142","https://openalex.org/W2027561985","https://openalex.org/W2032121576","https://openalex.org/W2032941043","https://openalex.org/W2034457323","https://openalex.org/W2044033317","https://openalex.org/W2062024414","https://openalex.org/W2062962812","https://openalex.org/W2069235103","https://openalex.org/W2075799774","https://openalex.org/W2078206416","https://openalex.org/W2097147533","https://openalex.org/W2106268064","https://openalex.org/W2114912588","https://openalex.org/W2139329073","https://openalex.org/W2315104614","https://openalex.org/W2964631455","https://openalex.org/W3142514135","https://openalex.org/W4285719527","https://openalex.org/W4299521327","https://openalex.org/W6655083939"],"related_works":["https://openalex.org/W2394117909","https://openalex.org/W2896054214","https://openalex.org/W2355197944","https://openalex.org/W2017118246","https://openalex.org/W2354661593","https://openalex.org/W2382240109","https://openalex.org/W2368475191","https://openalex.org/W2391311021","https://openalex.org/W2389188284","https://openalex.org/W2023813792"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}