{"id":"https://openalex.org/W1970032330","doi":"https://doi.org/10.1016/s0164-1212(02)00085-7","title":"A dynamic protocol conformance test method","display_name":"A dynamic protocol conformance test method","publication_year":2003,"publication_date":"2003-05-13","ids":{"openalex":"https://openalex.org/W1970032330","doi":"https://doi.org/10.1016/s0164-1212(02)00085-7","mag":"1970032330"},"language":"en","primary_location":{"id":"doi:10.1016/s0164-1212(02)00085-7","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0164-1212(02)00085-7","pdf_url":null,"source":{"id":"https://openalex.org/S37879656","display_name":"Journal of Systems and Software","issn_l":"0164-1212","issn":["0164-1212","1873-1228"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Systems and Software","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101610666","display_name":"Myungchul Kim","orcid":"https://orcid.org/0000-0001-8077-0053"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Myungchul Kim","raw_affiliation_strings":["Information and Communications University, School of Engineering, Yusong-gu, Hwaan-dong, 305-372 Daejon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information and Communications University, School of Engineering, Yusong-gu, Hwaan-dong, 305-372 Daejon, South Korea","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101517622","display_name":"Sang\u2010Jo Yoo","orcid":"https://orcid.org/0000-0003-1533-0814"},"institutions":[{"id":"https://openalex.org/I191879574","display_name":"Inha University","ror":"https://ror.org/01easw929","country_code":"KR","type":"education","lineage":["https://openalex.org/I191879574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sangjo Yoo","raw_affiliation_strings":["Inha University, Nam-gu, 402-751 South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inha University, Nam-gu, 402-751 South Korea","institution_ids":["https://openalex.org/I191879574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100681212","display_name":"Jinhee Park","orcid":"https://orcid.org/0000-0001-6206-0832"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jinhee Park","raw_affiliation_strings":["Information and Communications University, School of Engineering, Yusong-gu, Hwaan-dong, 305-372 Daejon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information and Communications University, School of Engineering, Yusong-gu, Hwaan-dong, 305-372 Daejon, South Korea","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056516831","display_name":"Sungwon Kang","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sungwon Kang","raw_affiliation_strings":["Information and Communications University, School of Engineering, Yusong-gu, Hwaan-dong, 305-372 Daejon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information and Communications University, School of Engineering, Yusong-gu, Hwaan-dong, 305-372 Daejon, South Korea","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109870434","display_name":"Soon J. Hyun","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Soon J. Hyun","raw_affiliation_strings":["Information and Communications University, School of Engineering, Yusong-gu, Hwaan-dong, 305-372 Daejon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information and Communications University, School of Engineering, Yusong-gu, Hwaan-dong, 305-372 Daejon, South Korea","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049595985","display_name":"Hyuckjae Lee","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hyuckjae Lee","raw_affiliation_strings":["Information and Communications University, School of Engineering, Yusong-gu, Hwaan-dong, 305-372 Daejon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information and Communications University, School of Engineering, Yusong-gu, Hwaan-dong, 305-372 Daejon, South Korea","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5101610666"],"corresponding_institution_ids":[],"apc_list":{"value":3560,"currency":"USD","value_usd":3560},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.16942025,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"67","issue":"1","first_page":"31","last_page":"43"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12127","display_name":"Software System Performance and Reliability","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/protocol","display_name":"Protocol (science)","score":0.7586358785629272},{"id":"https://openalex.org/keywords/conformance-testing","display_name":"Conformance testing","score":0.7091029286384583},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.686538577079773},{"id":"https://openalex.org/keywords/implementation","display_name":"Implementation","score":0.676749050617218},{"id":"https://openalex.org/keywords/interoperability","display_name":"Interoperability","score":0.6260181069374084},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5533384084701538},{"id":"https://openalex.org/keywords/ambiguity","display_name":"Ambiguity","score":0.47745373845100403},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.4752863645553589},{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.44491755962371826},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.42635589838027954},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3769642114639282},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3280777335166931},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22266677021980286},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.21675118803977966},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.13585108518600464},{"id":"https://openalex.org/keywords/standardization","display_name":"Standardization","score":0.12493517994880676}],"concepts":[{"id":"https://openalex.org/C2780385302","wikidata":"https://www.wikidata.org/wiki/Q367158","display_name":"Protocol (science)","level":3,"score":0.7586358785629272},{"id":"https://openalex.org/C76844732","wikidata":"https://www.wikidata.org/wiki/Q4072285","display_name":"Conformance testing","level":3,"score":0.7091029286384583},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.686538577079773},{"id":"https://openalex.org/C26713055","wikidata":"https://www.wikidata.org/wiki/Q245962","display_name":"Implementation","level":2,"score":0.676749050617218},{"id":"https://openalex.org/C20136886","wikidata":"https://www.wikidata.org/wiki/Q749647","display_name":"Interoperability","level":2,"score":0.6260181069374084},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5533384084701538},{"id":"https://openalex.org/C2780522230","wikidata":"https://www.wikidata.org/wiki/Q1140419","display_name":"Ambiguity","level":2,"score":0.47745373845100403},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.4752863645553589},{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.44491755962371826},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.42635589838027954},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3769642114639282},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3280777335166931},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22266677021980286},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.21675118803977966},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.13585108518600464},{"id":"https://openalex.org/C188087704","wikidata":"https://www.wikidata.org/wiki/Q369577","display_name":"Standardization","level":2,"score":0.12493517994880676},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0164-1212(02)00085-7","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0164-1212(02)00085-7","pdf_url":null,"source":{"id":"https://openalex.org/S37879656","display_name":"Journal of Systems and Software","issn_l":"0164-1212","issn":["0164-1212","1873-1228"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Systems and Software","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W157373053","https://openalex.org/W943942420","https://openalex.org/W1850584805","https://openalex.org/W1936022305","https://openalex.org/W2012673496","https://openalex.org/W2102833350","https://openalex.org/W2121954581","https://openalex.org/W2135988257","https://openalex.org/W2169044454"],"related_works":["https://openalex.org/W1696745455","https://openalex.org/W2087696154","https://openalex.org/W1867073331","https://openalex.org/W196322901","https://openalex.org/W1580589249","https://openalex.org/W1546012326","https://openalex.org/W1768417109","https://openalex.org/W2166362993","https://openalex.org/W2061183036","https://openalex.org/W2030553922"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-05-21T09:19:25.381259","created_date":"2025-10-10T00:00:00"}