{"id":"https://openalex.org/W2039039077","doi":"https://doi.org/10.1016/s0141-9331(01)00145-4","title":"A CAD-oriented analytical model for frequency-dependent series resistance and inductance of microstrip on-chip interconnect on silicon substrate","display_name":"A CAD-oriented analytical model for frequency-dependent series resistance and inductance of microstrip on-chip interconnect on silicon substrate","publication_year":2002,"publication_date":"2002-02-01","ids":{"openalex":"https://openalex.org/W2039039077","doi":"https://doi.org/10.1016/s0141-9331(01)00145-4","mag":"2039039077"},"language":"en","primary_location":{"id":"doi:10.1016/s0141-9331(01)00145-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0141-9331(01)00145-4","pdf_url":null,"source":{"id":"https://openalex.org/S195663827","display_name":"Microprocessors and Microsystems","issn_l":"0141-9331","issn":["0141-9331","1872-9436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microprocessors and Microsystems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111687132","display_name":"Hasan Ymeri","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Hasan Ymeri","raw_affiliation_strings":["Department of Electrical Engineering (ESAT), Div. ESAT-TELEMIC, Katholieke Universiteit Leuven, Kasteelpark Arenberg 10, B-3001 Leuven-Heverlee, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering (ESAT), Div. ESAT-TELEMIC, Katholieke Universiteit Leuven, Kasteelpark Arenberg 10, B-3001 Leuven-Heverlee, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032370530","display_name":"Bart Nauwelaers","orcid":"https://orcid.org/0000-0003-3986-2786"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Bart Nauwelaers","raw_affiliation_strings":["Department of Electrical Engineering (ESAT), Div. ESAT-TELEMIC, Katholieke Universiteit Leuven, Kasteelpark Arenberg 10, B-3001 Leuven-Heverlee, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering (ESAT), Div. ESAT-TELEMIC, Katholieke Universiteit Leuven, Kasteelpark Arenberg 10, B-3001 Leuven-Heverlee, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110128571","display_name":"Karen Maex","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Karen Maex","raw_affiliation_strings":["Interuniversity Microelectronics Center (imec) Kapeldreef 75, B-3001, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Interuniversity Microelectronics Center (imec) Kapeldreef 75, B-3001, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005456935","display_name":"S. Vandenberghe","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Servaas Vandenberghe","raw_affiliation_strings":["Department of Electrical Engineering (ESAT), Div. ESAT-TELEMIC, Katholieke Universiteit Leuven, Kasteelpark Arenberg 10, B-3001 Leuven-Heverlee, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering (ESAT), Div. ESAT-TELEMIC, Katholieke Universiteit Leuven, Kasteelpark Arenberg 10, B-3001 Leuven-Heverlee, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054766373","display_name":"David De Roest","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"David De Roest","raw_affiliation_strings":["Interuniversity Microelectronics Center (imec) Kapeldreef 75, B-3001, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Interuniversity Microelectronics Center (imec) Kapeldreef 75, B-3001, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5111687132"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":{"value":2200,"currency":"USD","value_usd":2200},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14065324,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"26","issue":"1","first_page":"45","last_page":"48"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.7683847546577454},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.7326086759567261},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7308124899864197},{"id":"https://openalex.org/keywords/equivalent-series-resistance","display_name":"Equivalent series resistance","score":0.639773428440094},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.5851154923439026},{"id":"https://openalex.org/keywords/cad","display_name":"CAD","score":0.5813722610473633},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.5251319408416748},{"id":"https://openalex.org/keywords/microstrip","display_name":"Microstrip","score":0.5248534679412842},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5177789926528931},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4248761236667633},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4157218933105469},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.33265626430511475},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32596859335899353},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.31114983558654785},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.20959526300430298},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.0941801369190216}],"concepts":[{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.7683847546577454},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.7326086759567261},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7308124899864197},{"id":"https://openalex.org/C14485415","wikidata":"https://www.wikidata.org/wiki/Q5384730","display_name":"Equivalent series resistance","level":3,"score":0.639773428440094},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.5851154923439026},{"id":"https://openalex.org/C194789388","wikidata":"https://www.wikidata.org/wiki/Q17855283","display_name":"CAD","level":2,"score":0.5813722610473633},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.5251319408416748},{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.5248534679412842},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5177789926528931},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4248761236667633},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4157218933105469},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.33265626430511475},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32596859335899353},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.31114983558654785},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.20959526300430298},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.0941801369190216},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0141-9331(01)00145-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0141-9331(01)00145-4","pdf_url":null,"source":{"id":"https://openalex.org/S195663827","display_name":"Microprocessors and Microsystems","issn_l":"0141-9331","issn":["0141-9331","1872-9436"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microprocessors and Microsystems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1570872727","https://openalex.org/W1973494662","https://openalex.org/W1975694818","https://openalex.org/W2010411401","https://openalex.org/W2039014341","https://openalex.org/W2068876583","https://openalex.org/W2079012541","https://openalex.org/W2097757175","https://openalex.org/W2114586954","https://openalex.org/W2144647411","https://openalex.org/W4229697010","https://openalex.org/W4297789110"],"related_works":["https://openalex.org/W637098845","https://openalex.org/W2410116073","https://openalex.org/W2155019192","https://openalex.org/W2014709025","https://openalex.org/W3044972437","https://openalex.org/W2275866607","https://openalex.org/W1908932129","https://openalex.org/W2371304091","https://openalex.org/W2587289131","https://openalex.org/W2365000768"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}